Display device and method of repairing same

Patent metadata

Field	Value
Publication number	US-2024334801-A1
Application number	US-202418741440-A
Country	US
Kind code	A1
Filing date	Jun 12, 2024
Priority date	Dec 24, 2020
Publication date	Oct 3, 2024
Grant date	—

Abstract

A display device includes: a substrate on which circuit elements constituting a pixel are arranged; a repair pattern arranged overlying the substrate; a buffer layer covering the repair pattern; an active layer arranged overlying the buffer layer; a conductive layer which is arranged overlying the active layer and on which electrodes of the circuit elements are arranged; an overcoat layer covering the conductive layer, and a light emitting element arranged overlying the overcoat layer. The repair pattern is arranged in such a manner that one region thereof overlaps the active layer.

First claim

1 . A method of repairing a display device, the display device including a substrate on which circuit elements constituting a pixel are arranged, a repair pattern arranged overlying the substrate, a buffer layer covering the repair pattern, an active layer arranged on top of the buffer layer, a region of the active layer overlapping the repair pattern, a conductive layer overlying the active layer and including electrodes of the circuit elements, an overcoat layer covering the conductive layer, and a light emitting element overlying the overcoat layer, the method comprising:
inspecting a malfunctioning pixel in the display device; and emitting a laser beam to the repair pattern in the malfunctioning pixel.

2 . The method of claim 1 , wherein when the repair pattern is cut by the laser beam, the active layer is cut due to a crack occurring in the buffer layer and the active layer.

3 . The method of claim 2 , wherein the active layer is cut at the vicinity of opposite ends of the repair pattern.

4 . The method of claim 3 , wherein when the active layer is cut, a step is formed on opposite sides of the cut-off regions.

5 . The method of claim 1 , wherein the laser beam is in an infrared band.

6 . The method of claim 1 , wherein a region of the repair pattern overlaps the active layer.

7 . The method of claim 1 , wherein the repair pattern is an electrode in an isolated form, the electrode being formed of a metal material.

8 . The method of claim 1 , wherein the active layer comprises:
a first region overlapping the repair pattern; and second regions arranged adjacent to opposite end portions, respectively, of the first region.

9 . The method of claim 8 , wherein the first region and the second regions are separated from each other.

10 . The method of claim 9 , wherein a step is formed between the first region and each of the second regions.

11 . The method of claim 1 , wherein the circuit elements each comprise:
a storage capacitor; a switching transistor storing a voltage corresponding to a data signal in the storage capacitor, in response to a first gate signal; a drive transistor configured to control an amount of drive electric current to be applied to the light emitting element in a manner that corresponds to the voltage stored in the storage capacitor; and a sensing transistor configured to sense features of the circuit elements in response to a second gate signal, wherein the active layer overlapping the repair pattern is an active layer constituting the sensing transistor.

12 . The method of claim 11 , further comprising:
a light blocking layer arranged on a layer that is the same as the repair pattern and arranged in a manner that overlaps the drive transistor.

13 . The method of claim 1 , further comprising:
a lower polarizer arranged underneath the substrate.

14 . The method of claim 1 , wherein the active layer is formed of indium-gallium-zinc-oxide, and the repair pattern is formed of copper.

15 . The method of claim 1 , wherein the active layer is formed in such a manner to have a thickness of about 300 Å.

Assignees

• Lg Display Co Ltd

Inventors

• Kim Juhyuk
• JO Yongsun
• JUNG DeukSoo
• Lee Junggil

Classifications

• H10P74/232

  comprising connection or disconnection of parts of a device in response to a measurement · CPC title

• H10P74/20

  characterised by the properties tested or measured, e.g. structural or electrical properties · CPC title

• H10K59/131 Primary

  Interconnections, e.g. wiring lines or terminals · CPC title

• H10K59/8791

  Arrangements for improving contrast, e.g. preventing reflection of ambient light · CPC title

• H10K71/00 Primary

  Manufacture or treatment specially adapted for the organic devices covered by this subclass · CPC title