Scanning ion beam deposition and etch
US-12176178-B2 · Dec 24, 2024 · US
US2024258064A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2024258064-A1 |
| Application number | US-202118578561-A |
| Country | US |
| Kind code | A1 |
| Filing date | Aug 20, 2021 |
| Priority date | Aug 20, 2021 |
| Publication date | Aug 1, 2024 |
| Grant date | — |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
The disclosure refers to a magnetization device, and an associated method of operation, for an electron microscope that includes a coil, with a yoke carrying the coil, with a sample holder for holding a sample, and with two poles of the yoke adjoining the sample holder. A gap is present in the yoke between each pole and the coil. A sample is placed on the sample holder by means of an optical microscope and subsequently the part of the magnetization device comprising the sample holder is connected to the part of the magnetization device comprising one or more coils.
Opening claim text (preview).
1 . A magnetization device comprising: a coil, a yoke carrying the coil, a sample holder for holding a sample, and two poles of the yoke adjoining the sample holder, wherein a gap is present in the yoke between each pole and the coil. 2 . The magnetization device according to claim 1 , wherein the sample holder is rotatably mounted. 3 . The magnetization device according to claim 1 , characterized in that wherein the yoke has three poles, the three poles being adjacent to the sample holder, and three coils being associated with respective ones of the three poles. 4 . The magnetization device according to claim 3 , wherein two of the three poles are adjacent to the sample holder on opposite sides and a third pole of the three poles is adjacent to an end of the sample holder. 5 . The magnetization device according to claim 3 , wherein there are a plurality of gaps in the yoke between the three coils and respective ones of the three poles. 6 . The magnetization device according to claim 5 , wherein a given gap of the plurality of gaps separating a given pole of the three poles from a corresponding coil of the three coils is container-shaped. 7 . The magnetization device according to claim 3 , wherein a particular gap separating an outer pole from a particular coil of the three coils is rectilinear in section. 8 . The magnetization device according to claim 3 , wherein the yoke comprises three bars and each bar carries a coil. 9 . The magnetization device according to claim 3 , wherein the yoke comprises four parts. 10 . The magnetization device according to claim 3 , wherein parts of the yoke can be rotated together with the sample holder. 11 . The magnetization device according to claim 1 , wherein a part of the yoke carrying the coil is separable from the sample holder. 12 . The magnetization device according to claim 1 , wherein there are two outer yokes, each carrying a coil and facing each other. 13 . The magnetization device according to claim 1 , wherein a passage for an electron beam is provided in such a way that a sample held by the sample holder can be microscoped by the electron beam, wherein the passage for the electron beam passes through two outer yokes. 14 . The magnetization device according to claim 13 , wherein the two outer yokes have respective gaps as part of the passage. 15 . The magnetization device according to claim 1 , wherein a thickness of a section of the magnetizing device is less than 20 mm, wherein the section comprises the sample holder. 16 . The magnetization device according to claim 1 , wherein a thickness of one or more gaps is less than 0.5 mm. 17 . The magnetization device according to ene of claim 1 , wherein the magnetizing device comprises a heat sink formed from copper or aluminium. 18 . An electron microscope comprising the magnetizing device according to claim 1 . 19 . The magnetization device according to claim 1 , wherein the yoke consist of permalloy and/or Vacoflux®. 20 . A method of operation of a magnetization device, wherein the magnetization device comprises a coil, a yoke carrying the coil, and a sample holder for holding a sample, wherein two poles of the yoke are adjacent to the sample holder, wherein a gap is present in the yoke between each pole and the coil, wherein at least a part of the yoke carrying one or more coils is separated from a part of the magnetization device comprising the sample holder, wherein a sample is placed on the sample holder using an optical microscope and subsequently the part of the magnetization device comprising the sample holder is connected to the part of the magnetization device comprising one or more coils.
Transmission microscopes · CPC title
Maintaining constant desired temperature · CPC title
for centering, aligning or positioning of ray or beam · CPC title
specially adapted for studying electrical or magnetical properties of objects · CPC title
Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.