Detection device

Patent metadata

Field	Value
Publication number	US-2024183723-A1
Application number	US-202318517423-A
Country	US
Kind code	A1
Filing date	Nov 22, 2023
Priority date	Dec 5, 2022
Publication date	Jun 6, 2024
Grant date	—

Abstract

Disclosed herein is a detection device including a sensor substrate including strain sensors arranged on a rectangular flexible substrate at fixed intervals in a longitudinal direction. A curvature radius between a pair of adjacent strain sensors is calculated on a value from a preceding strain sensor of the pair of adjacent sensors. When a start point node is defined as a position of a first strain sensor at one end of the strain sensors, a relative position of each of the strain sensors is determined by sequentially adding the relative positions. When the first and second strain sensors overlap, positions of the first and second strain sensors are considered identical on relative space. A position of each strain sensor is corrected based on a difference between a calculated position of the second strain sensor determined by sequentially adding the relative positions and actual position of the second strain sensor.

First claim

What is claimed is:

1 . A detection device comprising:
a sensor substrate including a plurality of strain sensors arranged on a rectangular flexible substrate at fixed intervals in a longitudinal direction of the flexible substrate, wherein a curvature radius between a pair of adjacent strain sensors among the plurality of strain sensors is calculated on a basis of a value from a preceding strain sensor of the pair of adjacent sensors, when a start point node is defined as a position of a first strain sensor at one end of the plurality of strain sensors, a relative position of each of the plurality of strain sensors is determined by sequentially adding the relative positions, starting with the first strain sensor of the start point node on a basis of the curvature radius between adjacent strain sensors, when the first strain sensor of the start point node overlaps with a second strain sensor at an nth node, a position of the first strain sensor and a position of the second strain sensor are considered to be identical on a relative space, and a position of each strain sensor is corrected on a basis of a difference between a calculated position of the second strain sensor determined by sequentially adding the relative positions and an actual position of the second strain sensor.

2 . The detection device according to claim 1 , wherein
correction is performed by dividing a value of a difference between a calculated position of the second strain sensor and an actual position of the second strain sensor by the number of arcs between the first strain sensor and the second strain sensor, and subtracting, from each node, a value resulting from the division.

3 . The detection device according to claim 1 , wherein
the flexible substrate has a scale for alignment between the first strain sensor and the second strain sensor.

4 . A detection device comprising:
a sensor substrate including a plurality of strain sensors arranged on a rectangular flexible substrate at fixed intervals in a longitudinal direction of the flexible substrate, wherein a curvature radius between each pair of adjacent strain sensors among the plurality of strain sensors is calculated on a basis of a value from a preceding strain sensor of the pair of adjacent strain sensors, when a start point node is defined as a position of a first strain sensor at one end of the plurality of strain sensors, a relative position of each of the plurality of strain sensors is determined by sequentially adding the relative positions, starting with the first strain sensor of the start point node on a basis of the curvature radius between adjacent strain sensors, when a predetermined position, on the flexible substrate, of the first strain sensor of the start point node overlaps with a first position on the flexible substrate between a second strain sensor at an nth node and a third strain sensor at an n+1th node, a position of the first strain sensor and the first position are considered to be identical on a relative space, and a position of each strain sensor is corrected on a basis of a difference between a calculated position of the first position determined by sequentially adding the relative positions and an actual position of the first position.

5 . The detection device according to claim 4 , wherein
correction is performed by dividing a value of a difference between a calculated position of the first position and an actual position of the first position by the number of arcs between the first strain sensor and the second strain sensor, subtracting, from each node, a value resulting from the division, and calculating the position of the second strain sensor.

6 . The detection device according to claim 4 , wherein
the first position is set by a scale provided on the flexible substrate.

7 . The detection device according to claim 4 , wherein
the first position is determined by detecting a capacitance between the first strain sensor and each strain sensor.

8 . The detection device according to claim 7 , wherein
when the capacitance between the first strain sensor and each strain sensor is detected, such detection is performed with use of a mutual capacitance method in which the first strain sensor is driven to detect an electric signal from each strain sensor.

9 . The detection device according to claim 4 , wherein
the first position is determined by detecting a capacitance between a plurality of capacitance detection electrodes each disposed between the first strain sensor and a corresponding strain sensor.

10 . The detection device according to claim 9 , wherein
a capacitance between the first strain sensor and each capacitance detection electrode is detected using a mutual capacitance method in which the first strain sensor is driven to detect an electric signal from each capacitance detection electrode.

11 . The detection device according to claim 4 , wherein
the plurality of strain gauges are disposed on both surfaces of the flexible substrate.

12 . The detection device according to claim 11 , wherein capacitance values of the strain gauges disposed on both surfaces of the flexible substrate are detected by self capacitance detection, and
the first strain sensor on a surface with a small capacitance value and the second strain sensor on a surface with a large capacitance value are detected.

Assignees

• Japan Display Inc

Inventors

• Uehara Toshinori
• Nakano Fumihoru

Classifications

• G01B7/22

  using change in capacitance · CPC title

• G01L25/00

  Testing or calibrating of apparatus for measuring force, torque, work, mechanical power, or mechanical efficiency · CPC title

• G01B7/293

  for measuring radius of curvature · CPC title

• G01L1/14 Primary

  by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators · CPC title