Sample holder for x-ray diffraction analysis and x-ray diffraction analysis method using the same

Patent metadata

Field	Value
Publication number	US-2024044818-A1
Application number	US-202218078930-A
Country	US
Kind code	A1
Filing date	Dec 10, 2022
Priority date	Aug 3, 2022
Publication date	Feb 8, 2024
Grant date	—

Abstract

Disclosed are a sample holder for X-ray diffraction analysis and an X-ray diffraction analysis method using the same. The sample holder for X-ray diffraction analysis includes a housing part formed of a side wall and a bottom plate with an open upper portion thereof, the housing part including an inner space partitioned from the side wall and the bottom plate, a cover part configured to cover the upper portion of the housing part and to allow X-rays to pass therethrough, and a support part installed to be movable upwards and downwards in the inner space, the support part including a plate-shaped substrate having a predetermined area, the substrate having a sample placed thereon.

First claim

What is claimed is:

1 . A sample holder for performing X-ray diffraction analysis, comprising:
a housing part comprising a side wall, a bottom plate, and an inner space partitioned by the side wall and the bottom plate, wherein an upper portion of the housing part is open; a cover part configured to cover the upper portion of the housing part and allow X-rays to pass therethrough; and a support part configured to be movable upwards and downwards in the inner space, wherein the support part comprises a substrate portion having a shape of a plate with a predetermined area, the substrate portion being configured to receive a sample placed thereon.

2 . The sample holder of claim 1 , wherein the cover part further comprises a polyimide film.

3 . The sample holder of claim 1 , wherein:
the side wall further comprises a placement groove recessed to a predetermined depth and disposed at an upper edge of the side wall, the sample holder further comprises a coupling part coupled to the placement groove and configured to shield the inner space, and the cover part is interposed between the coupling part and the placement groove.

4 . The sample holder of claim 3 , wherein the sample holder further comprises a first sealing member interposed between the placement groove and the coupling part.

5 . The sample holder of claim 1 , wherein the support part further comprises:
a head member configured to support the substrate; and a shaft member having a rod like shape extending in a longitudinal direction from a first end to a second end, wherein the first end is connected to a lower portion of the head member and the second end is inserted into a coupling groove recessed in the bottom plate or formed to penetrate the bottom plate.

6 . The sample holder of claim 5 , wherein the shaft member is configured to be screw-coupled to the coupling groove, thereby enabling the support part to be movable upwards and downwards.

7 . The sample holder of claim 5 , wherein:
the coupling groove is configured to penetrate the bottom plate, the shaft member is exposed to the outside through the coupling groove, the shaft member further comprising a plurality of holes formed therethrough in a direction perpendicular to the longitudinal axis of the shaft member, and the sample holder further comprises a fixing part coupled to at least one hole of the plurality of holes of the shaft member to thereby fix the shaft member.

8 . The sample holder of claim 1 , wherein the sample holder further comprises:
a gas inlet configured to have one end passing through one side of the side wall to communicate with the inner space, wherein the gas inlet is configured to provide gas to the inner space; and a gas outlet configured to have one end passing through the other side of the side wall to communicate with the inner space, wherein the gas outlet is configured to discharge the gas of the inner space to the outside.

9 . The sample holder of claim 8 , wherein the sample holder further comprises:
a second sealing member positioned at a connection portion between the gas inlet and the side wall; and a third sealing member positioned at a connection portion between the gas outlet and the side wall.

10 . An X-ray diffraction analysis method using the sample holder of claim 1 , comprising:
placing a sample on the support part; adjusting a height of the support part so that a surface of the sample is in contact with an inner surface of the cover part; generating a flow of an inert gas in the inner space by allowing the inert gas to flow into the inner space and discharging the inert gas from the inner space; and irradiating the sample with an incident beam.

11 . The X-ray diffraction analysis method of claim 10 , wherein the sample comprises an electrochemical cell, and
the electrochemical cell is placed on the support part so that a plane or a cross-section of the electrochemical cell faces an upper side of the sample holder.

12 . The X-ray diffraction analysis method of claim 10 , wherein a size of the incident beam is 50 μm to 800 μm.

Assignees

• Hyundai Motor Co Ltd
• Kia Corp
• Korea Inst Sci & Tech

Inventors

• Kim Yun Sung
• Lee Yoon Kwang
• Im Ga Hyeon
• Lee Sang Heon
• Lee Kyu Joon
• Ahn Jae Pyoung
• Kim Hae Ryoung
• Gong Hyun Woo
• Lee Byeong Hyeon

Classifications

• G01N23/20025 Primary

  Sample holders or supports therefor · CPC title

• G01N23/205

  using diffraction cameras · CPC title

• G01N23/2055

  Analysing diffraction patterns · CPC title

• G01N2223/056

  diffraction · CPC title

• G01N2223/1016

  X-ray · CPC title