Ion mirror for multi-reflecting mass spectrometers

Patent metadata

Field	Value
Publication number	US-2024030018-A1
Application number	US-202318359547-A
Country	US
Kind code	A1
Filing date	Jul 26, 2023
Priority date	Aug 6, 2017
Publication date	Jan 25, 2024
Grant date	—

Abstract

Improved ion mirrors 30 (FIG. 3) are proposed for multi-reflecting TOF MS and electrostatic traps. Minor and controlled variation by means of arranging a localized wedge field structure 35 at the ion retarding region was found to produce major tilt of ion packets time fronts 39. Combining wedge reflecting fields with compensated deflectors is proposed for electrically controlled compensation of local and global misalignments, for improved ion injection and for reversing ion motion in the drift direction. Fine ion optical properties of methods and embodiments are verified in ion optical simulations.

First claim

1 - 36 . (canceled)

37 . A mass spectrometer comprising:
a multi-reflecting time-of-flight mass analyser time having two ion mirrors that are elongated in a drift direction (z-dimension) and configured to reflect ions multiple times in an orthogonal oscillation dimension (x-dimension); a pulsed ion accelerator for pulsing ion packets into one of the ion mirrors; and an ion detector; wherein at least one of the ion mirrors provides equipotential field lines that diverge or converge relative to the drift dimension (Z-direction) and through which the ions pass.

38 . The mass spectrometer of claim 37 , wherein the pulsed ion accelerator and ion detector are arranged at the same end of the mirrors, in the drift direction, and the ions are caused to travel from said same end of the mirrors to the other end of the mirrors and then to said ion detector.

39 . The mass spectrometer of claim 37 , comprising electrodes arranged on opposing sides of the ion mirrors in a third dimension (y-dimension) that is orthogonal to the oscillation dimension (x-dimension) and the drift direction (z-dimension)

40 . The mass spectrometer of claim 39 , comprises one or more voltage supply configured to apply voltages to the electrodes for generating equipotential field lines that diverge or converge.

41 . The mass spectrometer of claim 39 , comprising a plurality of electrodes arranged on a first side of the ion mirrors, in the third dimension, and a plurality of electrodes arranged on an opposite side of the ion mirrors.

42 . The mass spectrometer of claim 37 , comprising a mirror having a length in the drift direction that includes only parallel equipotential field lines for reflecting ions.

43 . The mass spectrometer of claim 37 , comprising an ion deflector configured to back-steer the average ion trajectory of the ions, in the drift direction, thereby tilting the angle of the time front of the ions.

44 . The mass spectrometer of claim 43 , wherein said spectrometer is configured to tilt the time front of the ions passing therethrough so as to at least partially counteract a tilting of the time front by the ion deflector.

45 . A mass spectrometer comprising:
a multi-reflecting time-of-flight mass analyser time having two ion mirrors that are elongated in a drift direction (z-dimension) and configured to reflect ions multiple times in an orthogonal oscillation dimension (x-dimension); and a pulsed ion accelerator for pulsing ion packets into one of the ion mirrors; wherein the spectrometer comprises tuning electrodes arranged on opposing sides of the ion mirrors in a third dimension (y-dimension) that is orthogonal to the drift direction (z- dimension) and the oscillation dimension (x-dimension).

46 . The mass spectrometer of claim 45 , comprising voltage supplies configured to apply voltages to the tuning electrodes for generating equipotential field lines that diverge, converge or curve.

47 . The mass spectrometer of claim 46 , wherein the ions pass through the equipotential field lines that diverge, converge or curve.

48 . The mass spectrometer of claim 46 , wherein the voltage supplies are configured to be adjustable so as to adjust the voltages applied to the tuning electrodes.

49 . The mass spectrometer of claim 45 , comprising a plurality of tuning electrodes arranged on a first side of the ion mirrors, in the third dimension, and a plurality of tuning electrodes arranged on a second opposite side of the ion mirrors.

50 . The mass spectrometer of claim 45 , wherein an ion mirror comprises electrodes that are tilted at an angle to the drift direction.

51 . The mass spectrometer of claim 45 , comprising an ion detector, wherein the pulsed ion accelerator and ion detector are arranged at the same end of the mirrors, in the drift direction, and the ions are caused to travel from said same end of the mirrors to the other end of the mirrors and then to said ion detector.

52 . The mass spectrometer of claim 45 , comprising an ion deflector configured to back- steer the average ion trajectory of the ions, in the drift direction, thereby tilting the angle of the time front of the ions.

53 . The mass spectrometer of claim 52 , wherein said spectrometer is configured to tilt the time front of the ions passing therethrough so as to at least partially counteract a tilting of the time front by the ion deflector.

54 . A method of mass spectrometry comprising:
providing a mass spectrometer as claimed in claim 37 ; and reflecting ions between the ion mirrors in the oscillation dimension (x-dimension).

55 . A method of mass spectrometry comprising:
providing a mass spectrometer as claimed in claim 45 ; and reflecting ions between the ion mirrors in the oscillation dimension (x-dimension).

56 . A method of tuning an ion mirror comprising:
providing an ion mirror as claimed in claim 45 ; and adjusting voltages applied to the tuning electrodes.

Assignees

• Micromass Ltd

Inventors

• Verenchikov Anatoly
• Yavor Mikhail

Classifications

• H01J49/406 Primary

  with multiple reflections · CPC title

• H01J49/405 Primary

  characterised by the reflectron, e.g. curved field, electrode shapes · CPC title