Printed circuit ion mirror with compensation

Patent metadata

Field	Value
Publication number	US-11295944-B2
Application number	US-201816636936-A
Country	US
Kind code	B2
Filing date	Jul 26, 2018
Priority date	Aug 6, 2017
Publication date	Apr 5, 2022
Grant date	Apr 5, 2022

Abstract

Improved ion mirrors (10) are proposed for multi-reflecting TOF MS and electrostatic traps at various analyzer topologies. Ion mirrors (10) are constructed of printed circuit boards (11) with improved precision and flatness. To compensate for the remaining geometrical imperfections of mirror electrodes there are proposed electrode sets (17) and field structures in the ion retarding region for electronically adjusting of the ion packets time fronts, for improving the ion injection into the analyzer and for reversing the ion motion in the drift direction.

First claim

The invention claimed is:

1. An ion mirror comprising:
a plurality of electrodes and voltage supplies connected thereto that are configured to generate an electric field region that reflects ions in a first dimension (X-dimension),
wherein at least a first compensating part of the electric field region through which ions travel in use has equipotential field lines that diverge, converge or curve as a function of position along a second, orthogonal dimension (Z-direction);

at least one PCB having its plane arranged in the plane defined by the second dimension and a third dimension orthogonal to the first and second dimensions (Y-Z plane), said at least one PCB having at least one conductive strip thereon forming one of said plurality of electrodes; and
a first base support arranged in the plane defined by the first and second dimensions (X-Z plane); and a second base support spaced apart from the first base support in the third dimension (Y-dimension), said second base support arranged in the plane defined by the first and second dimensions (X-Z plane); wherein said at least one PCB is arranged between the base supports and attached thereto.

2. The ion mirror of claim 1 , wherein said compensating part of the electric field region is configured to tilt the time front of ions being reflected in the ion mirror.

3. The ion mirror claim 1 , comprising a first PCB arranged in the plane defined by the-first and second dimensions (X-Z plane), said first PCB having at least one elongated conductive strip thereon that longitudinally extends in the second dimension, the conductive strip forming one of said plurality of electrodes.

4. The ion mirror of claim 3 , wherein the first PCB comprises a plurality of said conductive strips spaced apart in the first dimension, wherein the plurality of conductive strips on the first PCB have been formed by providing said first PCB with a conductive surface and forming one or more elongated slits therein that extend in the second dimension so as to divide the conductive surface and define the conductive strips between the slits.

5. The ion mirror of claim 1 , comprising at least one stiffening rib attached to the PCB for preventing the PCB from bending.

6. The ion mirror of claim 1 , comprising electrodes arranged on opposing sides of the ion mirror in a third dimension (Y-dimension) that is orthogonal to the first and second dimensions, wherein the ion mirror comprises one or more voltage supply configured to apply different voltages to different ones of these electrodes for generating said equipotential field lines that diverge, converge or curve.

7. The ion mirror of claim 1 , comprising a voltage supply and electrodes configured to apply a static electric field in an ion acceleration region adjacent, in a direction in which the ions are reflected, said compensating part of the electric field region; said ion acceleration region having parallel equipotential field lines for accelerating the ions out of the ion mirror.

8. The ion mirror of claim 1 , wherein the ion mirror has a first length in the second dimension that comprises said compensating electric field region, and a second length in the second dimension that includes only parallel equipotential field lines for reflecting ions.

9. A mass spectrometer comprising:
a time-of-flight mass analyser or electrostatic ion trap having at least one ion mirror as claimed in claim 1 and a pulsed ion accelerator for pulsing ion packets into the ion mirror.

10. The spectrometer of claim 9 , comprising:
a multi-pass time-of-flight mass analyser or electrostatic ion trap having at least one ion mirror as claimed in claim 1 , and electrodes arranged and configured so as to provide an ion drift region that is elongated in a drift direction (z-dimension) and to reflect or tum ions multiple times in an oscillating dimension (x-dimension) that is orthogonal to the drift direction.

11. The spectrometer of claim 10 , wherein:
(i) the multi-pass time-of-flight mass analyser is a multi-reflecting time of flight mass analyser having two ion mirrors that are elongated in the drift direction (z-dimension) and configured to reflect ions multiple times in the oscillation dimension (x-dimension), wherein at least one of said two ion mirrors is an ion mirror according to claim 1 ; or
(ii) the multi-pass time-of-flight mass analyser is a multi-tum time of flight mass analyser having an ion mirror according to claim 1 and at least one electric sector configured to reflect and tum ions multiple times in the oscillation dimension (x-dimension).

12. The spectrometer of claim 10 , comprising an ion deflector configured to back-steer the average ion trajectory of the ions, in the drift direction, thereby tilting the angle of the time front of the ions; and wherein said compensating electric field region is configured to tilt the time front of the ions passing therethrough so as to at least partially counteract a tilting of the time front by the ion deflector.

13. A method of mass spectrometry comprising:
providing an ion mirror as claimed in claim 1 ;
applying voltages to electrodes of the ion mirror so as to generate said electric field region having equipotential field lines that diverge, converge or curve as a function of position along the second dimension (Z-direction); and
reflecting ions in the ion mirror in the first dimension (X-dimension).

14. The method of claim 13 , wherein the ion mirror comprises electrodes arranged on opposing sides of the ion mirror in a third dimension (Y-dimension) orthogonal to the first and second dimensions, and the method comprises: applying different voltages to different ones of these electrodes so as to generate said equipotential field lines that diverge, converge or curve; and adjusting the voltage supplies as a function of time so as to vary the voltages applied to the electrodes and the divergence, convergence or curvature of said equipotential field lines.

15. An ion mirror comprising:
a plurality of electrodes and voltage supplies connected thereto that are configured to generate an electric field region that reflects ions in a first dimension (X-dimension),
wherein at least a first compensating part of the electric field region through which ions travel in use has equipotential field lines that diverge, converge or curve as a function of position along a second, orthogonal dimension (Z-direction); and

least one PCB having its plane arranged in the plane defined by the second dimension and a third dimension orthogonal to the first and second dimensions (Y-Z plane), said at least one PCB having at least one conductive strip thereon forming one of said plurality of electrodes.

16. The ion mirror of claim 15 , comprising a window in the PCB for allowing ions to travel therethrough, in use, wherein the conductive strip surrounds said window.

17. The ion mirror of claim 15 , comprising electrodes arranged on opposing sides of the ion mirror in the third dimension (Y-dimension), wherein the ion mirror comprises one or more voltage supply configured to apply different voltages to different ones of these electrodes for generating said equipotential field lines that diverge, converge or curve.

18. A mass spectrometer comprising a time-of-flight mass analyzer having at least one ion mirror as claimed in claim 15 and either (i) a pulsed ion accelerator for pulsing ion packets into the at least one ion mirror; or (ii) a detector arranged such that ions are reflected by the ion mirror onto the detector.

19. A mass spectrometer comprising a tim

Assignees

• Micromass Ltd

Inventors

• Verenchikov Anatoly

Classifications

• H05K1/0225

  Single or multiple openings in a shielding, ground or power plane (H05K1/0227 takes precedence) · CPC title

• H05K2201/09063

  Holes or slots in insulating substrate not used for electrical connections · CPC title

• H01J49/406

  with multiple reflections · CPC title

• H01J49/405 Primary

  characterised by the reflectron, e.g. curved field, electrode shapes · CPC title