Semiconductor device manufacturing method and semiconductor device manufactured using the same
US-2024395745-A1 · Nov 28, 2024 · US
US2023296978A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2023296978-A1 |
| Application number | US-202217822766-A |
| Country | US |
| Kind code | A1 |
| Filing date | Aug 26, 2022 |
| Priority date | Mar 17, 2022 |
| Publication date | Sep 21, 2023 |
| Grant date | — |
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According to one embodiment, a photomask includes a plurality of unit regions arranged in a first direction and a second direction crossing the first direction. Each of the unit regions includes a first region having a first light-shielding rate, and a second region having a second light-shielding rate different from the first light-shielding rate. The second region is provided around the first region. The unit regions include a first unit region and a second unit region having same size each other. A distance between the first unit region and a center of a range in which the unit regions are arranged is different from a distance between the second unit region and the center. A light-shielding rate of the first unit region is different from a light-shielding rate of the second unit region.
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What is claimed is: 1 . A photomask, comprising: a plurality of unit regions arranged in a first direction and a second direction crossing the first direction, each of the unit regions including a first region having a first light-shielding rate, and a second region having a second light-shielding rate different from the first light-shielding rate, and provided around the first region, the unit regions including a first unit region and a second unit region having same size each other, a distance between the first unit region and a center of a range in which the unit regions are arranged being different from a distance between the second unit region and the center, and a light-shielding rate of the first unit region being different from a light-shielding rate of the second unit region. 2 . The photomask according to claim 1 , wherein a size of the first region included in the first unit region is different from a size of the first region included in the second unit region. 3 . The photomask according to claim 1 , wherein the unit regions further include a third unit region having same size as the first unit region or the second unit region, a distance between the first unit region and the center is longer than a distance between the second unit region and the center, and shorter than a distance between the third unit region and the center, and the light-shielding rate of the first unit region is higher than a light-shielding rate of one of the second unit region and the third unit region, and lower than a light-shielding rate of another of the second unit region and the third unit region. 4 . The photomask according to claim 1 , wherein each of a plurality of the first regions has a size corresponding to a distance from the center. 5 . The photomask according to claim 1 , wherein the first light-shielding rate of the first region included in the first unit region is smaller than the first-light shielding rate of the first region included in the second unit region. 6 . The photomask according to claim 1 , wherein a light-shielding rate of each of the unit regions is inversely proportional to a square of a distance from the center. 7 . The photomask according to claim 1 , wherein a light-shielding rate of each of the unit regions is in a relationship obtained by multiplying a ratio inversely proportional to a square of a distance from the center by a conic constant in a range of −0.2 to −5.0 or a square of the conic constant. 8 . The photomask according to claim 3 , wherein the light-shielding rate of the first unit region is larger than a light-shielding rate of the third unit region, and smaller than a light-shielding rate of the second unit region, and a light-shielding rate of each of the unit regions is not less than 10% and not more than 90%. 9 . The photomask according to claim 1 , wherein an area of each of a plurality of the first regions increases in proportion to a distance from the center. 10 . The photomask according to claim 1 , wherein the first light-shielding rate is lower than the second light-shielding rate. 11 . The photomask according to claim 1 , wherein the unit regions are arranged in the first direction and the second direction at an interval of a first distance. 12 . The photomask according to claim 11 , wherein the first distance is not less than 500 nm and not more than 2500 nm. 13 . The photomask according to claim 1 , wherein a diameter of at least one of inscribed circles in a plurality of the first regions is larger than 400 nm, the first regions include adjacent first regions in the first direction or the second direction, and a distance between the adjacent first regions is shorter than 200 nm. 14 . A method for manufacturing a lens, comprising: exposing a resist on a photodetection element by using the photomask according to claim 1 ; and developing the resist. 15 . A method for manufacturing a photodetector, comprising: forming a photodetection element; exposing a resist on a photodetection element by using the photomask according to claim 1 ; and forming a lens by developing the resist. 16 . A method for manufacturing a photodetector, comprising: forming a photodetection element and a circuit on a same substrate, the circuit being configured to select or control the photodetection element; forming an insulating layer on the substrate; exposing a resist by using the photomask according to claim 1 ; and forming a plurality of lenses on the insulating layers by developing the resist. 17 . The method for manufacturing the photodetector according to claim 16 , wherein the lenses are etched, the lenses include adjacent lenses in the first direction or the second direction, and a gap between the adjacent lenses is shortened by the etching. 18 . The method for manufacturing the photodetector according to claim 16 , wherein a center of the photodetection element in a first surface parallel to the first direction and the second direction and a center of one of the lenses in the first surface are on a same axis crossing the first surface, and the lenses include the lenses being in contact with each other in the first direction or the second direction. 19 . A photomask comprising: a plurality of non-light-shielding portions arranged two-dimensionally repeatedly; and a light-shielding portion arranged around each of the non-light-shielding portions, the non-light-shielding portions and the light-shielding portion being arranged so that a light-shielding rate of a central area of the photomask being higher than a light-shielding rate of a peripheral area of the photomask. 20 . A photomask comprising: a plurality of light-shielding portions arranged two-dimensionally repeatedly; and a non-light-shielding portion arranged around each of the light-shielding portions, the non-light-shielding portion and the light-shielding portions being arranged so that a light-shielding rate of a central area of the photomask being higher than a light-shielding rate of a peripheral area of the photomask.
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