Photomask, method for manufacturing lens, and method for manufacturing photodetector

US2023296978A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2023296978-A1
Application numberUS-202217822766-A
CountryUS
Kind codeA1
Filing dateAug 26, 2022
Priority dateMar 17, 2022
Publication dateSep 21, 2023
Grant date

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  1. Title

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  2. Abstract

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

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According to one embodiment, a photomask includes a plurality of unit regions arranged in a first direction and a second direction crossing the first direction. Each of the unit regions includes a first region having a first light-shielding rate, and a second region having a second light-shielding rate different from the first light-shielding rate. The second region is provided around the first region. The unit regions include a first unit region and a second unit region having same size each other. A distance between the first unit region and a center of a range in which the unit regions are arranged is different from a distance between the second unit region and the center. A light-shielding rate of the first unit region is different from a light-shielding rate of the second unit region.

First claim

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What is claimed is: 1 . A photomask, comprising: a plurality of unit regions arranged in a first direction and a second direction crossing the first direction, each of the unit regions including a first region having a first light-shielding rate, and a second region having a second light-shielding rate different from the first light-shielding rate, and provided around the first region, the unit regions including a first unit region and a second unit region having same size each other, a distance between the first unit region and a center of a range in which the unit regions are arranged being different from a distance between the second unit region and the center, and a light-shielding rate of the first unit region being different from a light-shielding rate of the second unit region. 2 . The photomask according to claim 1 , wherein a size of the first region included in the first unit region is different from a size of the first region included in the second unit region. 3 . The photomask according to claim 1 , wherein the unit regions further include a third unit region having same size as the first unit region or the second unit region, a distance between the first unit region and the center is longer than a distance between the second unit region and the center, and shorter than a distance between the third unit region and the center, and the light-shielding rate of the first unit region is higher than a light-shielding rate of one of the second unit region and the third unit region, and lower than a light-shielding rate of another of the second unit region and the third unit region. 4 . The photomask according to claim 1 , wherein each of a plurality of the first regions has a size corresponding to a distance from the center. 5 . The photomask according to claim 1 , wherein the first light-shielding rate of the first region included in the first unit region is smaller than the first-light shielding rate of the first region included in the second unit region. 6 . The photomask according to claim 1 , wherein a light-shielding rate of each of the unit regions is inversely proportional to a square of a distance from the center. 7 . The photomask according to claim 1 , wherein a light-shielding rate of each of the unit regions is in a relationship obtained by multiplying a ratio inversely proportional to a square of a distance from the center by a conic constant in a range of −0.2 to −5.0 or a square of the conic constant. 8 . The photomask according to claim 3 , wherein the light-shielding rate of the first unit region is larger than a light-shielding rate of the third unit region, and smaller than a light-shielding rate of the second unit region, and a light-shielding rate of each of the unit regions is not less than 10% and not more than 90%. 9 . The photomask according to claim 1 , wherein an area of each of a plurality of the first regions increases in proportion to a distance from the center. 10 . The photomask according to claim 1 , wherein the first light-shielding rate is lower than the second light-shielding rate. 11 . The photomask according to claim 1 , wherein the unit regions are arranged in the first direction and the second direction at an interval of a first distance. 12 . The photomask according to claim 11 , wherein the first distance is not less than 500 nm and not more than 2500 nm. 13 . The photomask according to claim 1 , wherein a diameter of at least one of inscribed circles in a plurality of the first regions is larger than 400 nm, the first regions include adjacent first regions in the first direction or the second direction, and a distance between the adjacent first regions is shorter than 200 nm. 14 . A method for manufacturing a lens, comprising: exposing a resist on a photodetection element by using the photomask according to claim 1 ; and developing the resist. 15 . A method for manufacturing a photodetector, comprising: forming a photodetection element; exposing a resist on a photodetection element by using the photomask according to claim 1 ; and forming a lens by developing the resist. 16 . A method for manufacturing a photodetector, comprising: forming a photodetection element and a circuit on a same substrate, the circuit being configured to select or control the photodetection element; forming an insulating layer on the substrate; exposing a resist by using the photomask according to claim 1 ; and forming a plurality of lenses on the insulating layers by developing the resist. 17 . The method for manufacturing the photodetector according to claim 16 , wherein the lenses are etched, the lenses include adjacent lenses in the first direction or the second direction, and a gap between the adjacent lenses is shortened by the etching. 18 . The method for manufacturing the photodetector according to claim 16 , wherein a center of the photodetection element in a first surface parallel to the first direction and the second direction and a center of one of the lenses in the first surface are on a same axis crossing the first surface, and the lenses include the lenses being in contact with each other in the first direction or the second direction. 19 . A photomask comprising: a plurality of non-light-shielding portions arranged two-dimensionally repeatedly; and a light-shielding portion arranged around each of the non-light-shielding portions, the non-light-shielding portions and the light-shielding portion being arranged so that a light-shielding rate of a central area of the photomask being higher than a light-shielding rate of a peripheral area of the photomask. 20 . A photomask comprising: a plurality of light-shielding portions arranged two-dimensionally repeatedly; and a non-light-shielding portion arranged around each of the light-shielding portions, the non-light-shielding portion and the light-shielding portions being arranged so that a light-shielding rate of a central area of the photomask being higher than a light-shielding rate of a peripheral area of the photomask.

Assignees

Inventors

Classifications

  • of coatings or optical elements · CPC title

  • Microlenses · CPC title

  • G03F1/38Primary

    Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof · CPC title

  • Producing lens arrays · CPC title

  • characterised by the manufacturing method · CPC title

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What does patent US2023296978A1 cover?
According to one embodiment, a photomask includes a plurality of unit regions arranged in a first direction and a second direction crossing the first direction. Each of the unit regions includes a first region having a first light-shielding rate, and a second region having a second light-shielding rate different from the first light-shielding rate. The second region is provided around the first…
Who is the assignee on this patent?
Toshiba Kk
What technology area does this patent fall under?
Primary CPC classification H10F39/8063. Mapped technology areas include Electricity.
When was this patent published?
Publication date Thu Sep 21 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).