Method for inspecting an object

Patent metadata

Field	Value
Publication number	US-2023018554-A1
Application number	US-202117373925-A
Country	US
Kind code	A1
Filing date	Jul 13, 2021
Priority date	Jul 13, 2021
Publication date	Jan 19, 2023
Grant date	—

Abstract

A method for inspecting an object includes determining a first inspection package that includes a first inspection image of the object and a first designation. The method includes determining data indicative of a second inspection package that includes a second inspection image of the object and a second designation. The method includes determining a first property of the object based on the first inspection image of the object, one or more properties maps of the object, and the first designation. The method includes determining a second property of the object based on the second inspection image of the object, the one or more properties maps of the object, and the second designation. The method includes displaying the first property and the second property or displaying data indicative of a comparison of the first property with the second property.

First claim

We claim:

1 . A method for inspecting an object, the method comprising:
determining a first inspection package that includes a first inspection image of the object and a first designation; determining data indicative of a second inspection package that includes a second inspection image of the object and a second designation; receiving, recalling, or both, one or more properties maps of the object; determining a first property of the object based on the first inspection image of the object, the one or more properties maps of the object, and the first designation; determining a second property of the object based on the second inspection image of the object, the one or more properties maps of the object, and the second designation; and displaying the first property and the second property or displaying data indicative of a comparison of the first property with the second property.

2 . The method of claim 1 , wherein receiving, recalling, or both one or more properties maps of the object comprises:
receiving or recalling a first properties map; and receiving or recalling a second properties map; wherein determining the first property of the object comprises determining the first property of the object based on the first inspection image of the object, the first properties map of the object, and the first designation; and wherein determining the second property of the object comprises determining the second property of the object based on the second inspection image of the object, the second properties map of the object, and the second designation.

3 . The method of claim 1 , wherein receiving, recalling, or both one or more properties maps of the object comprises:
receiving or recalling a second properties map; wherein determining the first property of the object comprises determining the first property of the object based on the first inspection image of the object, the second properties map of the object, and the first designation; and wherein determining the second property of the object comprises determining the second property of the object based on the second inspection image of the object, the second properties map of the object, and the second designation.

4 . The method of claim 3 , wherein the first inspection image defines a first capture date, wherein the second inspection image defines a second capture date, wherein determining the first property of the object comprises determining the first property of the object proximate to the second capture date.

5 . The method of claim 1 , wherein the first inspection image defines a first capture date, wherein the second inspection image defines a second capture date, and wherein the second capture date is after the first capture date.

6 . The method of claim 5 , wherein the second capture date is at least six months later than the first capture date and up to 15 years later than the first capture date.

7 . The method of claim 5 , wherein determining the first property of the object comprises determining the first property of the object proximate to the second capture date.

8 . The method of claim 1 , wherein the first property is indicative of a feature on the object, wherein the second property is also indicative of the feature on the object, and wherein displaying data indicative of a comparison of the first property with the second property comprises displaying data indicative of a growth of the feature on the object.

9 . The method of claim 8 , wherein the feature is a crack.

10 . The method of claim 1 , wherein the first designation is a first continuous segment of inspection image pixels in an inspection image pixel array, the second designation is a second continuous segment of inspection image pixels in the inspection image pixel array, wherein an inspection image pixel in the first continuous segment of inspection image pixels is also in the second continuous segment of inspection image pixels.

11 . The method of claim 1 , comprising:
displaying data indicative of a comparison of the first property with the second property, the first property being a first size of a feature on the object, and the second property being a second size of the feature on the object, wherein displaying data indicative of a comparison of the first property with the second property includes determining a growth of the feature on the object based on the first size of the feature on the object and the second size of the feature on the object; and comparing the growth of the feature on the object to a threshold value.

12 . The method of claim 11 , comprising displaying an indication if the growth of the feature on the object exceeds the threshold value.

13 . The method of claim 11 , comprising initiating a maintenance action of the object if the growth of the feature on the object exceeds the threshold value

14 . An inspection system comprising:
a computing system configured to:
determine a first inspection package that includes a first inspection image of the object and a first designation;
determine data indicative of a second inspection package that includes a second inspection image of the object and a second designation;
receive, recall, or both, one or more properties maps of the object;
determine a first property of the object based on the first inspection image of the object, the one or more properties maps of the object, and the first designation;
determine a second property of the object based on the second inspection image of the object, the one or more properties maps of the object, and the second designation; and
display the first property and the second property or compare the first property with the second property.

15 . The inspection system of claim 14 , wherein the computing system is configured to:
receive or recall a first properties map; and receive or recall a second properties map; determine the first property of the object based on the first inspection image of the object, the first properties map of the object, and the first designation; and determine the second property of the object based on the second inspection image of the object, the second properties map of the object, and the second designation.

16 . The inspection system of claim 14 , wherein the computing system is configured to:
receive or recall a second properties map; determine the first property of the object based on the first inspection image of the object, the second properties map of the object, and the first designation; and determine the second property of the object based on the second inspection image of the object, the second properties map of the object, and the second designation.

17 . The inspection system of claim 16 , wherein the first inspection image defines a first capture date, wherein the second inspection image defines a second capture date, wherein the computing system is configured to determine the first property of the object proximate to the second capture date.

18 . The inspection system of claim 14 , wherein the first inspection image defines a first capture date, wherein the second inspection image defines a second capture date, and wherein the second capture date is after the first capture date.

19 . The inspection system of claim 14 , wherein the first property is indicative of a feature on the object, wherein the second property is also indicative of the feature on the object, and wherein the computing system is configured to determine a growth of the feature on the object by comparing the first property with t

Assignees

• Gen Electric
• Oliver Crispin Robotics Ltd

Inventors

• Graham Andrew Crispin
• Foxall Julian Matthew
• Miller James Vradenburg
• Dixon Walter V
• Shirsat Vijay

Classifications

• G06T17/20

  Finite element generation, e.g. wire-frame surface description, {tesselation} · CPC title

• G06T2207/30164

  Workpiece; Machine component · CPC title

• G06T2200/08

  involving all processing steps from image acquisition to 3D model generation · CPC title

• G06T7/564 Primary

  from contours · CPC title

• G06T7/001 Primary

  using an image reference approach · CPC title