System and method for determining part damage

US11410298B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11410298-B2
Application numberUS-201816210800-A
CountryUS
Kind codeB2
Filing dateDec 5, 2018
Priority dateDec 5, 2017
Publication dateAug 9, 2022
Grant dateAug 9, 2022

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A process for automated component inspection includes the steps of calibrating an imaging device mounted on a table; calibrating a coordinate measuring machine mounted on the table, the coordinate measuring machine comprising a fixture coupled to an arm of the coordinate measuring machine; coupling a component to the fixture; acquiring an image of said component with said imaging device; registering a baseline dimensioned image to the component image; applying the baseline dimensioned image to a damage detection algorithm; and determining component damage by the damage detection algorithm.

First claim

Opening claim text (preview).

What is claimed is: 1. A process for automated component inspection comprising: calibrating an imaging device mounted on a table; calibrating a coordinate measuring machine mounted on said table, said coordinate measuring machine comprising a fixture coupled to six degree of freedom arm of said coordinate measuring machine configured as a localization and pose measurement system; coupling a component to said fixture; whereby the six degree of freedom arm reports the component location and pose in all six degrees of freedom; wherein the component is a turbine blade; acquiring an image of said component with said imaging device; registering a baseline dimensioned image to said component image, wherein said baseline dimensioned image is selected from the group consisting of a design drawing, a CAD model projection, and a prior 3D scan projection; applying said baseline dimensioned image to a damage detection algorithm using the reported location and pose; and determining component damage by said damage detection algorithm. 2. The process according to claim 1 , wherein said imaging device is a microscope. 3. The process according to claim 2 , wherein said microscope is calibrated by estimating intrinsic parameters with a calibration pattern. 4. The process according to claim 3 , wherein a three dimension calibration jig is utilized to estimate the microscope extrinsic parameters. 5. The process according to claim 1 , wherein said step of registering a baseline dimensioned image to said component image further comprises a damage-invariant method. 6. The process according to claim 1 , wherein said step of determining structural damage further comprises comparing the differences between the component image and the baseline dimensioned image. 7. The process according to claim 1 , wherein said component damage is structural damage. 8. The process according to claim 1 , wherein said component damage determination is by physical mode decomposition. 9. The process according to claim 1 , wherein said component damage is at least one of a crack, a nick, a gouge, and corrosion. 10. The process according to claim 1 , wherein said component damage determination includes at least one of an algorithm selection, a parameter selection, and a Bayesian estimation. 11. A system for automated component inspection comprising: a table; an imaging device mounted on a table, wherein said imaging device is configured to create a component image, and the system is configured to register a baseline dimensioned image to said component image for determining structural damage on said component by applying said baseline dimensioned image to a damage detection algorithm using a reported location and pose; and determining component damage by a damage detection algorithm, wherein said baseline dimensioned image is selected from the group consisting of a design drawing, a CAD model projection, a prior 3D scan projection; a coordinate measuring machine mounted on said table, said coordinate measuring machine comprising a fixture coupled to six degree of freedom arm of said coordinate measuring machine configured as a localization and pose measurement system; and a component gas turbine engine blade coupled to said fixture; whereby the six degree of freedom arm reports the component location and pose in all six degrees of freedom. 12. The system according to claim 11 , wherein said imaging device is a microscope. 13. The system according to claim 11 , wherein said fixture comprises a transparent material configured to allow surfaces of the component to be viewed.

Assignees

Inventors

Classifications

  • G01B21/042Primary

    Calibration or calibration artifacts (G01B3/30, G01B9/02072 take precedence) · CPC title

  • Control or image processing arrangements for digital or video microscopes (G02B21/361, G02B21/362 take precedence) · CPC title

  • G06T7/001Primary

    using an image reference approach · CPC title

  • of aircraft wings or blades · CPC title

  • by using a contact-less detection method, i.e. with a camera · CPC title

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What does patent US11410298B2 cover?
A process for automated component inspection includes the steps of calibrating an imaging device mounted on a table; calibrating a coordinate measuring machine mounted on the table, the coordinate measuring machine comprising a fixture coupled to an arm of the coordinate measuring machine; coupling a component to the fixture; acquiring an image of said component with said imaging device; regist…
Who is the assignee on this patent?
United Technologies Corp, Raytheon Tech Corp
What technology area does this patent fall under?
Primary CPC classification G01B21/042. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Aug 09 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 6 related publications on this page (citations in our corpus or others sharing the same primary CPC).