Over-temperature battery protection
US-2021226468-A1 · Jul 22, 2021 · US
US2022311436A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2022311436-A1 |
| Application number | US-202117473889-A |
| Country | US |
| Kind code | A1 |
| Filing date | Sep 13, 2021 |
| Priority date | Mar 23, 2021 |
| Publication date | Sep 29, 2022 |
| Grant date | — |
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A semiconductor relay device includes a conversion circuit configured to receive an input signal from outside and pass a first current to a first node based on the input signal. A zener diode has an anode coupled to a second node and a cathode coupled to the first node. A resistor is coupled between the second node and a third node. A number n of diodes are serially coupled. A thyristor has an anode coupled to the first node, a cathode coupled to the second node, and a control terminal coupled to the third node. A transistor has a gate coupled to the first node. An anode of a diode at a first end of the n diodes is coupled to the first node, and a cathode of a diode at a second end of the n diodes is coupled to a third node.
Opening claim text (preview).
1 . A semiconductor relay device comprising: a conversion circuit configured to receive an input signal from outside, and pass a first current to a first node based on the input signal; a zener diode having an anode coupled to a second node and a cathode coupled to the first node; a resistor coupled between the second node and a third node; a number n of diodes that are serially coupled, wherein an anode of a diode at a first end of the n diodes is coupled to the first node, and a cathode of a diode at a second end of the n diodes is coupled to the third node, where n is a natural number larger than or equal to 2; a thyristor having an anode coupled to the first node, a cathode coupled to the second node, and a control terminal coupled to the third node; and a transistor having a gate coupled to the first node. 2 . The semiconductor relay device according to claim 1 , wherein the n diodes include a first to an n th diode, an anode of an i th diode is coupled to a cathode of an (i−1) th diode for all cases of i where i is a natural number larger than or equal to 2 and smaller than or equal to n−1, an anode of the first diode is coupled to the first node, and an anode of the n th diode is coupled to a cathode of the (n−1) th diode, and a cathode of the n th diode is coupled to the third node. 3 . The semiconductor relay device according to claim 2 , wherein the conversion circuit outputs a first voltage across the first node and a fourth node coupled to the second node via a diode over a period of receiving the input signal, and a breakdown voltage of the zener diode is lower than the first voltage. 4 . The semiconductor relay device according to claim 3 , wherein the breakdown voltage is higher than a threshold voltage of the transistor. 5 . The semiconductor relay device according to claim 4 , wherein each of the n diodes has a forward voltage having a first magnitude when the diode has a first temperature, and has a forward voltage having a second magnitude smaller than the first magnitude when the diode has a second temperature higher than the first temperature. 6 . The semiconductor relay device according to claim 5 , further comprising: a transmission circuit configured to output the input signal. 7 . The semiconductor relay device according to claim 6 , wherein the transmission circuit is a light emitting diode, and the conversion circuit includes a photodiode. 8 . The semiconductor relay device according to claim 4 , wherein the n diodes generate, between the second end and the first end, a first forward voltage when the diodes have a first temperature, and a second forward voltage when the diodes have a second temperature higher than the first temperature, the first forward voltage is higher than the breakdown voltage, and the second forward voltage is lower than the breakdown voltage. 9 . The semiconductor relay device according to claim 3 , wherein each of the n diodes has a forward voltage having a first magnitude when the diode has a first temperature, and has a forward voltage having a second magnitude smaller than the first magnitude when the diode has a second temperature higher than the first temperature. 10 . The semiconductor relay device according to claim 3 , wherein the n diodes generate, between the second end and the first end, a first forward voltage when the diodes have a first temperature, and a second forward voltage when the diodes have a second temperature higher than the first temperature, the first forward voltage is higher than the breakdown voltage, and the second forward voltage is lower than the breakdown voltage. 11 . The semiconductor relay device according to claim 2 , wherein each of the n diodes has a forward voltage having a first magnitude when the diode has a first temperature, and has a forward voltage having a second magnitude smaller than the first magnitude when the diode has a second temperature higher than the first temperature. 12 . The semiconductor relay device according to claim 1 , wherein the conversion circuit outputs a first voltage across the first node and a fourth node coupled to the second node via a diode over a period of receiving the input signal, and a breakdown voltage of the zener diode is lower than the first voltage. 13 . The semiconductor relay device according to claim 12 , wherein the breakdown voltage is higher than a threshold voltage of the transistor. 14 . The semiconductor relay device according to claim 13 , wherein each of the n diodes has a forward voltage having a first magnitude when the diode has a first temperature, and has a forward voltage having a second magnitude smaller than the first magnitude when the diode has a second temperature higher than the first temperature. 15 . The semiconductor relay device according to claim 14 , further comprising: a transmission circuit configured to output the input signal. 16 . The semiconductor relay device according to claim 15 , wherein the transmission circuit is a light emitting diode, and the conversion circuit includes a photodiode. 17 . The semiconductor relay device according to claim 13 , wherein the n diodes generate, between the second end and the first end, a first forward voltage when the diodes have a first temperature, and a second forward voltage when the diodes have a second temperature higher than the first temperature, the first forward voltage is higher than the breakdown voltage, and the second forward voltage is lower than the breakdown voltage. 18 . The semiconductor relay device according to claim 12 , wherein each of the n diodes has a forward voltage having a first magnitude when the diode has a first temperature, and has a forward voltage having a second magnitude smaller than the first magnitude when the diode has a second temperature higher than the first temperature. 19 . The semiconductor relay device according to claim 12 , wherein the n diodes generate, between the second end and the first end, a first forward voltage when the diodes have a first temperature, and a second forward voltage when the diodes have a second temperature higher than the first temperature, the first forward voltage is higher than the breakdown voltage, and the second forward voltage is lower than the breakdown voltage. 20 . The semiconductor relay device according to claim 1 , wherein each of the n diodes has a forward voltage having a first magnitude when the diode has a first temperature, and has a forward voltage having a second magnitude smaller than the first magnitude when the diode has a second temperature higher than the first temperature.
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