Thin film multivariate optical element and detector combinations, thin film optical detectors, and downhole optical computing systems

Patent metadata

Field	Value
Publication number	US-2022178819-A1
Application number	US-202217677788-A
Country	US
Kind code	A1
Filing date	Feb 22, 2022
Priority date	Jul 13, 2018
Publication date	Jun 9, 2022
Grant date	—

Abstract

The disclosed embodiments include thin film multivariate optical element and detector combinations, thin film optical detectors, and downhole optical computing systems. In one embodiment, a thin film multivariate optical element and detector combination includes at least one layer of multivariate optical element having patterns that manipulate at least one spectrum of optical signals. The thin film multivariate optical element and detector combination also includes at least one layer of detector film that converts optical signals into electrical signals. The thin film optical detector further includes a substrate. The at least one layer of multivariate optical element and the at least one layer of detector film are deposited on the substrate.

First claim

What is claimed is:

1 . A method to obtain downhole properties of a downhole sample, comprising:
deploying a thin film multivariate optical element and detector combination into a wellbore, the thin film multivariate optical element and detector combination comprising:
at least one layer of multivariate optical element having patterns that manipulate
at least one spectrum of optical signals;
at least one layer of detector film; and
a substrate, wherein the at least one layer of multivariate optical element and the
at least one layer of detector film are deposited on the substrate;
transmitting optical signals downhole to the at least one layer of multivariate optical element; and manipulating at least one spectrum of optical signals by the patterns to improve at least one correlation between the at least one spectrum of optical signals and at least one property of a downhole sample.

2 . The method of claim 1 , wherein the at least one layer of detector film comprises materials that are configured to convert manipulated optical signals into electrical signals, and the method further comprising converting the manipulated optical signals into electrical signals.

3 . The method of claim 1 , wherein the substrate is formed from a flexible material, and the method further comprising:
affixing the substrate to a downhole tool; and deploying the downhole tool to a downhole location, wherein deploying the thin film multivariate optical element and detector combination downhole comprises deploying the thin film multivariate optical element and detector combination together with the downhole tool to the downhole location.

4 . The method of claim 1 , further comprising transmitting the optical signals to the substrate, wherein the optical signals pass through the substrate prior to reaching the at least one layer of multivariate optical element.

5 . The method of claim 4 , further comprising generating a spectral pattern that manipulates the at least one spectrum of the optical signals prior to the optical signals reaching the at least one layer of multivariate optical element.

6 . The method of claim 1 , wherein the thin film multivariate optical element and detector combination further comprises a reflective layer positioned between the at least one layer of detector film and the substrate, and the method further comprising reflecting a portion of the optical signals that passes through the at least one layer of detector film back to the at least one layer of detector film.

7 . The method of claim 1 , wherein the thin film multivariate optical element and detector combination further comprising:
a bottom layer of detector film that is deposited on the substrate; a top layer of detector film that is deposited on the bottom layer of detector film; a bottom layer of multivariate optical element that is deposited on the top layer of detector film; and a top layer of multivariate optical element that is deposited on the bottom layer of multivariate element.

8 . The method of claim 7 , wherein the thin film multivariate optical element and detector combination further comprising:
at least two layers of multivariate optical elements that are deposited between the top layer of multivariate optical element and the bottom layer of multivariate optical element; and at least two layers of detector films that are deposited between the top layer of detector film and the bottom layer of detector film.

9 . The method of claim 1 , wherein the thin film multivariate optical element and detector combination further comprising:
a bottom layer of multivariate optical element that is deposited on the substrate; a bottom layer of detector film that is deposited on the bottom layer of multivariate optical element; a top layer of detector film that is deposited on the bottom layer of detector film; and a top layer of multivariate optical element that is deposited on the top layer of top layer of detector film.

10 . The method of claim 1 , wherein the thin film multivariate optical element and detector combination further comprising:
a first surface area of the at least one layer of detector films; a second surface area of the at least one layer of detector films; a first layer of the at least one multivariate optical element that is stacked over the first surface area; and a second layer of the at least one multivariate optical element that is stacked over the second surface area.

11 . The method of claim 1 , wherein each layer of the at least one layer of multivariate optical element is less than 100 μm thick, and wherein each layer of the at least one layer of detector film is less than 100 μm thick.

12 . A method to obtain downhole properties of a downhole sample, comprising:
deploying a thin film optical detector downhole into a wellbore, the thin film optical detector comprising:
a first detector film; and
a substrate, wherein the first detector film is deposited over the substrate; transmitting optical signals downhole to the first detector film; and
generating, with the first detector film, a spectral pattern that manipulates at least one spectrum of optical signals while the thin film optical detector is deployed in a downhole environment, wherein manipulation of the at least one spectrum of optical signals by the spectral pattern improves at least one correlation between the at least one spectrum of optical signals and at least one property of a downhole sample.

13 . The method of claim 12 , further comprising deploying a conveyance into the wellbore, wherein the thin film optical detector is coupled to the conveyance, and wherein deploying the thin film optical detector comprises deploying the thin film optical detector downhole along the conveyance.

14 . The method of claim 12 , wherein the substrate is formed from a flexible material, and the method further comprising:
affixing the substrate to a downhole tool; and deploying the downhole tool to a downhole location, wherein deploying the thin film optical detector downhole comprises deploying the thin film optical detector together with the downhole tool to the downhole location.

15 . The method of claim 12 , wherein the thin film optical detector further comprises a second detector film deposited between the first detector film and the substrate, the method further comprising:
transmitting manipulated optical signals downhole to the second detector film; and converting the manipulated optical signals into electrical signals.

16 . The method of claim 15 , wherein the second detector film is positioned in between the first detector film and the substrate.

17 . The method of claim 15 , wherein the thin film optical detector further comprises a third detector film having material properties that generate a second spectral pattern that further manipulates the at least one spectrum of the optical signals; and a fourth detector film having material properties that convert the manipulated optical signals into electrical signals.

18 . The method of claim 12 , wherein the thin film optical detector further comprises a reflective layer positioned between the first detector film and the substrate, and the method further comprising reflecting a portion of the optical signals that passes through the first detector film back to the first detector film.

19 . The method of claim 12 , further comprising transmitting the optical signals to the substrate, wherein the optical signals pass through the substrate prior to reaching the first detector

Assignees

• Halliburton Energy Services Inc

Inventors

• Li Jian
• Price James M
• Dai Bin
• Jones Christopher Michael
• Stark Daniel
• Maida Jr John Laureto

Classifications

• G01V8/02

  Prospecting · CPC title

• G01N21/31 Primary

  Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry {(G01N21/72 takes precedence)} · CPC title

• G01J2003/283

  computer-interfaced · CPC title

• G01N2201/129

  Using chemometrical methods · CPC title

• G01J3/28

  Investigating the spectrum (using colour filters G01J3/51) · CPC title