Plasma etch tool for high aspect ratio etching

Patent metadata

Field	Value
Publication number	US-2022165546-A1
Application number	US-202017593117-A
Country	US
Kind code	A1
Filing date	Mar 6, 2020
Priority date	Mar 14, 2019
Publication date	May 26, 2022
Grant date	—

Abstract

High aspect ratio features are etched using a plasma etching apparatus that can alternate between accelerating negative ions of reactive species at a low energy and accelerating positive ions of inert gas species at a high energy. The plasma etching apparatus can be divided into at least two regions that separate a plasma-generating space from an ionization space. Negative ions of the reactive species can be generated by electron attachment ionization in the ionization space when a plasma is ignited in the plasma-generating space. Positive ions of the inert gas species can be generated by Penning ionization in the ionization space when the plasma is quenched in the plasma-generating space.

First claim

1 . A plasma etching apparatus comprising:
a plasma generating source; an ionization space coupled to the plasma generating source and configured to generate ions; a first grid between the ionization space and the plasma generating source; an acceleration space coupled to the ionization space and configured to deliver the ions to a substrate in the acceleration space; a substrate support for supporting the substrate in the acceleration space, wherein the substrate support is configured to be biased; and a controller configured with instructions for performing the following operations:
accelerate negative ions of a reactive species to the substrate in the acceleration space by introducing the reactive species into the ionization space and applying a positive bias to the substrate support; and
accelerate positive ions of a non-reactive species to the substrate in the acceleration space by introducing the non-reactive species into the ionization space and applying a negative bias to the substrate support.

2 . The plasma etching apparatus of claim 1 , wherein the negative bias is substantially greater in absolute value than the positive bias.

3 . The plasma etching apparatus of claim 2 , wherein the positive bias is between about 0.5 V and about 10 V, and wherein the negative bias is between about −50 kV and about −1 kV.

4 . The plasma etching apparatus of claim 1 , wherein the controller is further configured with instructions for performing the following operations:
in connection with accelerating the negative ions of the reactive species, form a reactive layer on a material layer of the substrate, and in connection with accelerating the positive ions of the non-reactive species, etch the material layer of the substrate, wherein the material layer includes a dielectric material or electrically conductive material.

5 . The plasma etching apparatus of claim 1 , wherein the controller is further configured with instructions to perform the following operations:
ignite plasma in the plasma generating source when accelerating the negative ions of the reactive species; and quench plasma in the plasma generating source when accelerating the positive ions of the non-reactive species.

6 . The plasma etching apparatus of claim 5 , wherein the controller is further configured with instructions for performing the following operations:
in connection with accelerating the negative ions of the reactive species, extract electrons from the plasma to the ionization space to ionize the reactive species and form the negative ions of the reactive species in the ionization space.

7 . The plasma etching apparatus of claim 5 , wherein the controller is further configured with instructions for performing the following operations:
in connection with accelerating the positive ions of the non-reactive species, cause diffusion of metastable species from the plasma to the ionization space to ionize the non-reactive species and form the positive ions of the non-reactive species in the ionization space.

8 . The plasma etching apparatus of claim 1 , wherein the first grid is configured to be biased or grounded, and wherein the controller is further configured with instructions for performing the following operations:
in connection with accelerating the negative ions, form a weak electric field between the first grid and the substrate support, and in connection with accelerating the positive ions, form a strong electric field between the first grid and the substrate support.

9 . The plasma etching apparatus of claim 1 , wherein the substrate includes a plurality of high aspect ratio features having a depth to width aspect ratio of at least 10:1.

10 . The plasma etching apparatus of claim 1 , further comprising:
a second grid between the ionization space and the acceleration space.

11 . The plasma etching apparatus of claim 10 , wherein a pressure in the ionization space is greater than a pressure in the acceleration space.

12 . The plasma etching apparatus of claim 10 , wherein the second grid is configured to be biased.

13 . The plasma etching apparatus of claim 1 , wherein the plasma generating source is a inductively coupled plasma (ICP) reactor or a capacitively coupled plasma (CCP) reactor.

14 . The plasma etching apparatus of claim 1 , wherein the controller is further configured with instructions for performing the following operations:
repeat and alternate operations of accelerating the negative ions of the reactive species and accelerating the positive ions of the non-reactive species.

15 . The plasma etching apparatus of claim 1 , wherein the controller is further configured with instructions for performing the following operations:
in connection with accelerating the negative ions of the reactive species, accelerate the negative ions of the reactive species for a first duration between about 1 ms and about 10 ms, and in connection with accelerating the positive ions of the non-reactive species, accelerate the positive ions of the non-reactive species for a second duration between about 1 ms and about 10 ms.

16 . A plasma etching apparatus comprising:
a plasma generating source; an ionization space coupled to the plasma generating source and configured to generate ions; a first grid between the ionization space and the plasma generating source; an acceleration space coupled to the ionization space and configured to deliver the ions to a substrate in the acceleration space; a substrate support for supporting the substrate in the acceleration space, wherein the substrate support is configured to be biased; and a controller configured with instructions for performing the following operations:
introduce reactive species and non-reactive species to the ionization space;
ignite plasma in the plasma generating source;
apply a positive bias to the substrate support to ionize the reactive species and form negative ions of the reactive species, and to accelerate the negative ions of the reactive species to the substrate when the plasma is ignited;
quench the plasma in the plasma generating source; and
apply a negative bias to the substrate support to ionize the non-reactive species and form positive ions of the non-reactive species, and to accelerate the positive ions of the non-reactive species to the substrate when the plasma is quenched.

17 . The plasma etching apparatus of claim 16 , wherein the positive bias is between about 0.5 V and about 10 V, and wherein the negative bias is between about −50 kV and about −1 kV.

18 . The plasma etching apparatus of claim 16 , further comprising:
a second grid between the ionization space and the acceleration space, wherein the first grid is configured to be biased and the second grid is configured to be biased, wherein a pressure in the ionization space is greater than a pressure in the acceleration space.

19 . The plasma etching apparatus of claim 16 , wherein the plasma generating source is an inductively coupled plasma (ICP) reactor or a capacitively coupled plasma (CCP) reactor.

20 . The plasma etching apparatus of claim 16 , wherein the controller is further configured with instructions for performing the following operation:
repeat and alternate operations of applying the positive bias to the substrate support when the plasma is ignited and applying the negative bias to the substrate support when the plasma is quenched.

Assignees

• Lam Res Corp

Inventors

• Lill Thorsten
• Berry Iii Ivan L
• Panagopoulos Theodoros

Classifications

• H10P50/283

  by chemical means · CPC title

• H10P50/242

  of Group IV materials · CPC title

• H01J37/32706

  Polarising the substrate · CPC title

• H01J2237/3341

  Reactive etching · CPC title

• H01J2237/0473

  accelerating · CPC title