Electronic device for managing degree of degradation

Patent metadata

Field	Value
Publication number	US-2022018890-A1
Application number	US-202117491812-A
Country	US
Kind code	A1
Filing date	Oct 1, 2021
Priority date	Oct 29, 2018
Publication date	Jan 20, 2022
Grant date	—

Abstract

An electronic device including a processor and a sensor may be provided. The processor obtains a first degree of degradation of a first core based on a first parameter value associated with a lifetime of the first core and a first operating level associated with an operation of the first core. The processor obtains a second degree of degradation of a second core based on a second parameter value associated with a lifetime of the second core and a second operating level associated with an operation of the second core. The processor schedules a task of the first core and the second core based on the first degree of degradation and the second degree of degradation. The sensor provides the first parameter value and the first operating level to the first core and the second parameter value and the second operating level to the second core.

First claim

What is claimed is:

1 . A processor comprising:
a first core and a second core; a sensor configured to detect parameters of at least one of the first core or the second core; and a voltage generator configured to provide a first operating voltage decreasing in a step wise form for at least one of the first core or the second core that is in an idle state, wherein the sensor is configured to measure a minimum operating voltage level of at least one of the first core or the second core at which the at least one of the first core or the second core operates normally in association with a reference performance, and wherein the processor is configured to calculate a predicted degree of degradation of each of first core and the second core based on the parameters and calibrate the predicted degree of degradation based on the measured minimum operating voltage level.

2 . The processor of claim 1 , wherein the reference performance is related to an operating frequency of the at least one of the first core or the second core.

3 . The processor of claim 1 , wherein the parameters include a temperature, an operating voltage and an operating frequency of the at least one of the first core or the second core.

4 . The processor of claim 1 , wherein the processor is configured to manage the calibrated degree of degradation substantially equally by assigning a task to each of the first core and the second core based on the calibrated degree of degradation.

5 . The processor of claim 1 , wherein
the calibrated degree of degradation includes a first calibrated degree of degradation of the first core and a second calibrated degree of degradation of the second core, and in response to the first calibrated degree of degradation is less than the second calibrated degree of degradation, the processor is configured to assign a task to the first core.

6 . The processor of claim 1 , wherein
the calibrated degree of degradation includes a first calibrated degree of degradation of the first core and a second calibrated degree of degradation of the second core, and the processor is configured to manage the first calibrated degree of degradation and the second calibrated degree of degradation to be substantially equal.

7 . The processor of claim 1 , wherein the sensor includes a temperature sensor.

8 . The processor of claim 1 , wherein the voltage generator is configured to provide a second operating voltage for the at least one of the first core or the second core that is not in the idle state.

9 . The processor of claim 1 , wherein
the at least one of the first core or the second core is configured to operate in one of a plurality of operating frequencies, and the processor is configured to measure the minimum operating voltage level of the at least one of the first core or the second core for each operating frequency of the plurality of operating frequencies.

10 . A method of operating a processor including a first core, a second core, a sensor and a voltage generator, the method comprising:
detecting, by the sensor, parameters of at least one of the first core or the second core; providing, by the voltage generator, a first operating voltage decreasing in a step wise form to at least one of the first core or the second core that is in an idle state; measuring, by the processor, a minimum operating voltage level of at least one of the first core or the second core at which the at least one of the first core or the second core operates normally in association with a reference performance; calculating a predicted degree of degradation of each of first core and the second core based on the parameters; and calibrating the predicted degree of degradation based on the measured minimum operating voltage level.

11 . The method of claim 10 , wherein the reference performance is related to an operating frequency of the at least one of the first core or the second core.

12 . The method of claim 10 , wherein the parameters include a temperature, an operating voltage and an operating frequency of the at least one of the first core or the second core.

13 . The method of claim 10 , further comprising:
managing, by the processor, the calibrated degree of degradation substantially equally by assigning a task to each of the first core and the second core based on the calibrated degree of degradation.

14 . The method of claim 10 , wherein
the calibrated degree of degradation includes a first calibrated degree of degradation of the first core and a second calibrated degree of degradation of the second core, and the method further comprises, in response to the first calibrated degree of degradation is less than the second calibrated degree of degradation, assigning, by the processor, a task to the first core.

15 . The method of claim 10 , wherein
the calibrated degree of degradation includes a first calibrated degree of degradation of the first core and a second calibrated degree of degradation of the second core, and the method further comprises managing, by the processor, the first calibrated degree of degradation and the second calibrated degree of degradation to be substantially equal.

16 . The method of claim 10 , wherein the sensor includes a temperature sensor.

17 . The method of claim 10 , further comprising:
providing, by the voltage generator, a second operating voltage for the at least one of the first core or the second core that is not in the idle state.

18 . The method of claim 10 , wherein
the at least one of the first core or the second core operates in one of a plurality of operating frequencies, and the measuring, by the processor, a minimum operating voltage level of at least one of the first core or the second core at which the at least one of the first core or the second core operate normally associated with a reference performance comprises measuring, by the processor, the minimum operating voltage level of the at least one of the first core or the second core for each operating frequency of the plurality of operating frequencies.

Assignees

• Samsung Electronics Co Ltd

Inventors

• Ryu Dong-Uk
• Kim Seongbeom
• An Janghyuk

Classifications

• G01R31/2894 Primary

  Aspects of quality control [QC] (G01R31/31718 takes precedence; program control for QC G05B19/41875) · CPC title

• G01R31/2855

  Environmental, reliability or burn-in testing · CPC title

• G01R19/16576

  comparing DC or AC voltage with one threshold (G01R19/16514, G01R19/16519, G01R19/16528, G01R19/16533 and G01R19/1659 take precedence) · CPC title

• B60R16/023

  for transmission of signals between vehicle parts or subsystems · CPC title

• G01R31/2642 Primary

  Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests · CPC title