Method and computer program product for oct measurement beam adjustment

US2022016730A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2022016730-A1
Application numberUS-201917292500-A
CountryUS
Kind codeA1
Filing dateNov 6, 2019
Priority dateNov 9, 2018
Publication dateJan 20, 2022
Grant date

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

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A method determines translational and/or rotational deviations between the measurement coordinate system of a measurement mirror scanner and the processing coordinate system of a processing mirror scanner. A measurement beam reflected at a workpiece returns on a path of an incident measurement beam and is captured by a spatially resolving measurement sensor to ascertain spatially resolving information of the workpiece. The reflected measurement beam, in a sensor image of the measurement sensor, is imaged onto a previously known image position. This is accomplished by ascertaining a focal position deviation of the processing beam by scanning with the processing beam, evaluating a laser power detected at grid points, fixing the processing mirror scanner, capturing spatially resolving height information of the pinhole diaphragm by the measurement sensor, and determining a translational deviation between the processing and measurement coordinate systems based on the deviation.

First claim

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1 - 10 . (canceled) 11 . A method for determining at least one of translational or rotational deviations between a measurement coordinate system of a measurement mirror scanner being tiltable about two axes and deflecting a measurement beam two-dimensionally, and a processing coordinate system of a processing mirror scanner being tiltable about two axes and deflecting both the measurement beam deflected by the measurement mirror scanner and a processing beam two-dimensionally onto a workpiece, the measurement beam reflected at the workpiece returning on a path of the incident measurement beam and being captured by a spatially resolving measurement sensor to ascertain spatially resolving information of the workpiece, and in a zero position of the measurement mirror scanner, the reflected measurement beam being imaged in a sensor image of the measurement sensor, onto a previously known image position, the method comprising at least one of: step a) ascertaining an x-y focal position deviation of the processing beam relative to a pinhole diaphragm center of a pinhole diaphragm detector disposed on a workpiece support plane by scanning the pinhole diaphragm with the processing beam deflected by the processing mirror scanner in an x-y grid and by evaluating a laser power detected at each of grid points, and by fixing the processing mirror scanner in a scan position having been corrected based on the ascertained x-y focal position deviation, the focal position of the processing beam in the scan position being situated in a predetermined position; capturing spatially resolving height information of the pinhole diaphragm, with the processing mirror scanner fixed in a corrected scan position, by using the measurement sensor to scan the pinhole diaphragm with the measurement beam deflected by the measurement mirror scanner; and determining a translational deviation between the processing and measurement coordinate systems based on a deviation, present in the sensor image of the measurement sensor, between the previously known image position corresponding to the focal position of the processing beam and the pinhole diaphragm center captured from the height information; or step b) deflecting the measurement beam by respective positive and negative fixed magnitudes in the workpiece support plane by tilting the processing mirror scanner about one, first tilt axis thereof and, with the processing mirror scanner fixed in the respective tilted scan positions, capturing a linear height edge disposed at the workpiece support plane by using the measurement sensor for a respective line scan of the measurement beam by deflecting the measurement mirror scanner about one, second tilt axis thereof, and ascertaining an axis of the processing coordinate system based on captured points of intersection of the two line scans with the height edge; deflecting the measurement beam by respective positive and negative fixed magnitudes in the workpiece support plane by tilting the measurement mirror scanner about the other, first tilt axis thereof and, with the measurement mirror scanner fixed in the respective tilted scan positions, capturing the height edge by using the measurement sensor for respective line scans of the measurement beam by deflecting the processing mirror scanner about the second tilt axis thereof, and ascertaining an axis of the measurement coordinate system based on the captured points of intersection of the two line scans with the height edge; and determining a rotational deviation between the processing and measurement coordinate systems based on the ascertained axes of the processing and measurement coordinate systems. 12 . The method according to claim 11 , which further comprises providing the predetermined position as the pinhole diaphragm center of the pinhole diaphragm detector. 13 . The method according to claim 11 , which further comprises providing each of the processing mirror scanner and the measurement mirror scanner with one respective mirror tiltable about two tilt axes or two mirrors each tiltable about one tilt axis. 14 . The method according to claim 11 , which further comprises in step placing the pinhole diaphragm detector on the workpiece support plane where the processing beam impinges on the workpiece support plane at right angles. 15 . The method according to claim 11 , which further comprises in step locating the previously known image position in an image center of the sensor image. 16 . The method according to claim 11 , which further comprises in step setting the positive and negative fixed magnitudes to be equal. 17 . The method according to claim 11 , which further comprises before step placing a component having the height edge on the workpiece support plane. 18 . The method according to claim 11 , which further comprises before step producing the height edge at a workpiece disposed on the workpiece support plane by material removal provided by the processing beam. 19 . The method according to claim 11 , which further comprises in step deflecting the measurement beam, reflected at the workpiece, between the measurement mirror scanner and a laser beam generator emitting the measurement beam in a direction of the measurement sensor. 20 . The method according to claim 19 , which further comprises providing a coherence tomography apparatus as the laser beam generator. 21 . The method according to claim 11 , which further comprises compensating for at least one of the determined translational or rotational deviation by position regulation of at least one of the processing mirror scanner or the measurement mirror scanner. 22 . A non-transitory computer-readable medium with instructions stored thereon, that perform the steps of claim 11 when executed on a processor of a laser processing machine.

Assignees

Inventors

Classifications

  • Automatically focusing the laser beam · CPC title

  • B23K26/082Primary

    Scanning systems, i.e. devices involving movement of the laser beam relative to the laser head · CPC title

  • by welding · CPC title

  • for measuring contours or curvatures · CPC title

  • Fillet welding, i.e. involving a weld of substantially triangular cross section joining two parts · CPC title

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What does patent US2022016730A1 cover?
A method determines translational and/or rotational deviations between the measurement coordinate system of a measurement mirror scanner and the processing coordinate system of a processing mirror scanner. A measurement beam reflected at a workpiece returns on a path of an incident measurement beam and is captured by a spatially resolving measurement sensor to ascertain spatially resolving info…
Who is the assignee on this patent?
Trumpf Laser & Systemtechnik Gmbh, Trumpf Laser Gmbh
What technology area does this patent fall under?
Primary CPC classification B23K26/082. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Thu Jan 20 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).