High temperature biasable heater with advanced far edge electrode, electrostatic chuck, and embedded ground electrode
US-2024412957-A1 · Dec 12, 2024 · US
US2019221455A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2019221455-A1 |
| Application number | US-201916245706-A |
| Country | US |
| Kind code | A1 |
| Filing date | Jan 11, 2019 |
| Priority date | Jan 15, 2018 |
| Publication date | Jul 18, 2019 |
| Grant date | — |
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An apparatus for treating a substrate are provided. The apparatus includes a chamber having a treatment space therein, a substrate support unit to support the substrate in the treatment space, and a heater unit to heat the substrate supported by the substrate support unit. The substrate support unit includes a support plate having a seating surface, a support protrusion provided to protrude from the seating plate and to directly support the substrate, and a sensor provided to the support protrusion to measure a temperature of the substrate.
Opening claim text (preview).
What is claimed is: 1 . An apparatus for treating a substrate, the apparatus comprising: a chamber having a treatment space therein; a substrate support unit to support the substrate in the treatment space; and a heater unit to heat the substrate supported by the substrate support unit, wherein the substrate support unit includes: a support plate having a seating surface; a support protrusion provided to protrude from the seating plate and to directly support the substrate; and a sensor provided to the support protrusion to measure a temperature of the substrate. 2 . The apparatus of claim 1 , further comprising: an elastic member to apply elastic force to the support protrusion in a direction that the support protrusion faces the substrate. 3 . The apparatus of claim 2 , wherein an insertion hole is formed in the seating surface, wherein the insertion hole includes a first hole extending downward from the seating surface and a second hole extending downward from the first hole, wherein the first hole has a width greater than a width of the second hole, wherein a protrusion region of the support protrusion protruding from the seating surface has a width greater than the width of the second hole, and wherein the elastic member is positioned in the first hole. 4 . The apparatus of claim 3 , wherein a plurality of insertion holes and a plurality of support protrusions are provided, and wherein the apparatus further includes: a pressure reducing unit to reduce pressure of space between the substrate and the seating surface. 5 . The apparatus of claim 4 , wherein some of the support protrusions are positioned in a first region of the seating surface, and others of the supporting protrusions are positioned in a second region of the seating surface, wherein the first region includes a central region of the seating surface, and wherein the second region includes an edge of the seating surface, which surrounds the first region. 6 . The apparatus of claim 2 , wherein the support protrusion includes a body to directly support the substrate, and wherein the sensor is positioned in the body, and positioned adjacent to an inner surface opposite to an outer surface of the body in contact with the substrate. 7 . The apparatus of claim 2 , wherein the support protrusion includes the body, and wherein the sensor is positioned through the body to directly support the substrate.
characterised by a plurality of individual support members, e.g. support posts or protrusions · CPC title
Temperature monitoring · CPC title
comprising at least one lithography chamber · CPC title
vertical arrangement · CPC title
mainly by conduction · CPC title
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