Glass substrate with reduced internal reflectance and method for manufacturing the same

US2019119154A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2019119154-A1
Application numberUS-201716092533-A
CountryUS
Kind codeA1
Filing dateMar 13, 2017
Priority dateApr 12, 2016
Publication dateApr 25, 2019
Grant date

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Abstract

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The invention concerns a method for manufacturing glass substrates with reduced internal reflectance by ion implantation, comprising ionizing a source gas of N2, O2, Ar, and/or He so as to form a mixture of single charge and multicharge ions of N, O, Ar, and/or He forming a beam of single charge and multicharge ions of N, O, Ar, and/or He, by accelerating with an acceleration voltage comprised between 15 kV and 60 kV and an ion dosage comprised between 1017 ions/cm2 and 1018 ions/cm2. The invention further concerns glass substrates having reduced internal reflectance, comprising an area treated by ion implantation with a mixture of simple charge and multicharge ions according to this method.

First claim

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1 : A method for producing a glass substrate with reduced internal reflectance, the method comprising: a) ionizing at least one source gas selected from the group consisting of N 2 , O 2 , Ar, and He, so as to form a mixture of single charge ions and multicharge ions of N, O, Ar, and/or He, b) accelerating the mixture of single charge ions and multicharge ions with an acceleration voltage so as to form a beam of single charge ions and multicharge ions, wherein the acceleration voltage is 15 kV to 60 kV and the ion dosage is 10 17 ions/cm 2 to 10 18 ions/cm 2 , and c) positioning a glass substrate in the trajectory of the beam of single charge and multicharge ions. 2 : The method according to claim 1 , wherein the acceleration voltage is 20 kV to 40 kV and the ion dosage is 2.5×10 17 ions/cm 2 to 7.5×10 17 ions/cm 2 . 3 : The method according to claim 2 , wherein the acceleration voltage is 30 kV to 40 kV and the ion dosage is 2.5×10 17 ions/cm 2 to 5×10 17 ions/cm 2 . 4 : The method according to claim 1 , wherein the glass substrate in c) comprises the following components, expressed as weight percentage of a total weight of the glass: SiO 2 35-85%, Al 2 O 3  0-30%, P 2 O 5  0-20% B 2 O 3  0-20%, Na 2 O  0-25%, CaO  0-20%, MgO  0-20%, K 2 O  0-20%, and BaO  0-20%. 5 : The method according to claim 4 wherein the glass substrate is selected from the group consisting of a soda-lime glass sheet, a borosilicate glass sheet and an aluminosilicate glass sheet. 6 : The method according to claim 1 , which produces a double porous surface layer in the glass substrate, the mixture of single charge and multicharge ions being implanted in the glass substrate with a dosage and acceleration voltage effective to form the double porous surface layer in the glass substrate. 7 : The method according to claim 6 , wherein the mixture of single charge and multicharge ions is being implanted in the glass substrate with a dosage and acceleration voltage effective to form a double porous surface layer comprising an upper porous surface layer with a first porosity and contiguously a lower porous surface layer with a second porosity, a) wherein the upper porous surface layer starts at the substrate surface and descends down to a depth D 2 , and b) wherein the lower porous surface layer starts at a depth D 2 and descends down to a depth D 1 . 8 : The method according to claim 6 , wherein the mixture of single charge and multicharge ions is implanted in the glass substrate with a dosage and acceleration voltage effective to form a double porous surface layer, a) wherein the upper porous layer comprises pores having a cross-sectional equivalent circular diameter of 21 nm to 200 nm, and b) wherein the lower porous layer comprises only pores having a cross-section equivalent circular diameter of 3 nm to 10 nm. 9 : A glass substrate with reduced internal reflectance produced by the method according to claim 1 . 10 : An electro-optical device comprising the glass substrate according to claim 9 . 11 : The electro-optical device according to claim 10 , wherein the electro-optical device is an OLED device or a photovoltaic device. 12 : The method according to claim 8 , wherein the mixture of single charge and multicharge ions is implanted in the glass substrate with a dosage and acceleration voltage effective to form a double porous surface layer and wherein 10 to 40% of the cross-sectional area of the upper porous layer is occupied by pores having a cross-sectional equivalent circular diameter of 21 nm to 200 nm.

Assignees

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Classifications

  • containing phosphorus, niobium or tantalum · CPC title

  • by ion implantation · CPC title

  • containing aluminium · CPC title

  • containing calcium oxide, e.g. common sheet or container glass · CPC title

  • Organic light-emitting devices (integrated devices or assemblies of multiple devices H10K59/00, H10K65/00; organic semiconductor lasers H01S5/36) · CPC title

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What does patent US2019119154A1 cover?
The invention concerns a method for manufacturing glass substrates with reduced internal reflectance by ion implantation, comprising ionizing a source gas of N2, O2, Ar, and/or He so as to form a mixture of single charge and multicharge ions of N, O, Ar, and/or He forming a beam of single charge and multicharge ions of N, O, Ar, and/or He, by accelerating with an acceleration voltage comprised …
Who is the assignee on this patent?
Agc Glass Europe, Agc Glass Company North America, Asahi Glass Co Ltd, and 1 more
What technology area does this patent fall under?
Primary CPC classification C03C23/0055. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Thu Apr 25 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).