Film formation method and film formation apparatus
US-2015064931-A1 · Mar 5, 2015 · US
US2017100742A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2017100742-A1 |
| Application number | US-201514879962-A |
| Country | US |
| Kind code | A1 |
| Filing date | Oct 9, 2015 |
| Priority date | Oct 9, 2015 |
| Publication date | Apr 13, 2017 |
| Grant date | — |
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Methods and apparatus for vapor deposition of an organic film are configured to vaporize an organic reactant at a first temperature, transport the vapor to a reaction chamber housing a substrate, and maintain the substrate at a lower temperature than the vaporization temperature. Alternating contact of the substrate with the organic reactant and a second reactant in a sequential deposition sequence can result in bottom-up filling of voids and trenches with organic film in a manner otherwise difficult to achieve.
Opening claim text (preview).
1 . An apparatus for organic film deposition, comprising: a vessel configured for vaporizing an organic reactant to form a reactant vapor; a reaction space configured to accommodate a substrate and in selective fluid communication with the vessel; and a control system configured to: maintain the reactant in the vessel at or above a temperature A; maintain the substrate at a temperature B, the temperature B being lower than the temperature A; transport the reactant vapor from the vessel to the substrate; and deposit an organic film on the substrate. 2 . The apparatus of claim 1 , wherein the organic film comprises a polymer. 3 . The apparatus of claim 1 , wherein the vessel contains a solid at room temperature and atmospheric pressure. 4 . The apparatus of claim 1 , wherein the vessel contains a dianhydride. 5 . The apparatus of claim 1 , wherein the vessel contains a pyromellitic dianhydride (PMDA). 6 . The apparatus of claim 1 , wherein the control system is further configured to maintain the ratio of temperature A to temperature B in Kelvin between about 1 and about 1.25. 7 . The apparatus of claim 1 , wherein the control system is further configured to maintain the temperature B between about 5° C. and about 50° C. lower than the temperature A. 8 . The apparatus of claim 1 , further comprising a gas line fluidly connecting the vessel to the reaction space, wherein the control system is further configured to maintain the gas line at a temperature C, the temperature C being higher than the temperature A. 9 . (canceled) 10 . (canceled) 11 . A method for vapor depositing an organic film, comprising: vaporizing a first organic reactant in a vaporizer at a temperature A to form a first reactant vapor; exposing a substrate in a reaction space to the first reactant vapor at a temperature B, the temperature B being lower than the temperature A; and depositing the organic film on the substrate. 12 . The method of claim 11 , wherein the organic film comprises a polymer. 13 . (canceled) 14 . (canceled) 15 . The method of claim 12 , wherein the polymer comprises a polyimide. 16 . The method of claim 12 , wherein the polymer comprises a polyurea. 17 . The method of claim 11 , wherein the organic film comprises a polyamic acid. 18 . The method of claim 17 , further comprising converting the polyamic acid to a polyimide. 19 . The method of claim 11 , wherein the first reactant is a solid at room temperature and atmospheric pressure. 20 . The method of claim 11 , wherein the first reactant is a dianhydride. 21 . The method of claim 11 , wherein the first reactant comprises pyromellitic dianhydride (PMDA). 22 . The method of claim 11 , wherein the ratio of temperature A to temperature B in Kelvin is between about 1 and about 1.15. 23 . The method of claim 11 , wherein the temperature B is between about 5° C. and about 50° C. lower than the temperature A. 24 . (canceled) 25 . (canceled) 26 . (canceled) 27 . (canceled) 28 . (canceled) 29 . (canceled) 30 . The method of claim 11 , wherein exposing the substrate to the first reactant vapor comprises transporting the first reactant vapor through a gas line from the vaporizer to the reaction space, wherein the gas line is at a temperature C, the temperature C being higher than the temperature A. 31 .- 44 . (canceled)
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