Concealed optoelectronic module

Patent metadata

Field	Value
Publication number	US-2017089757-A1
Application number	US-201615274055-A
Country	US
Kind code	A1
Filing date	Sep 23, 2016
Priority date	Sep 24, 2015
Publication date	Mar 30, 2017
Grant date	—

Abstract

An optoelectronic module that includes a reflectance member which exhibits mitigated or eliminated fan-out field-of-view overlap can be concealed or its visual impact minimized compared to a host device in which the optoelectronic module is mounted. In some instances, the reflectance member can be implemented as a plurality of through holes and in other instances the reflectance member may be a contiguous spin-coated polymeric coating. In general, the reflectance member can be diffusively reflective to the same particular wavelengths or ranges of wavelengths as the host device in which it is mounted.

First claim

What is claimed, is:

1 . An optoelectronic module comprising:
an emitter and a detector electrically mounted to a substrate, the emitter being operable to generate emitted light of a particular wavelength or range of wavelengths, and the detector being operable to detect the particular wavelength or range of wavelengths generated by the emitter; a spacer disposed between the emitter and the detector; an optoelectronic module cover including an optoelectronic module cover surface, the optoelectronic module cover being substantially transmissive to the emitted light; and a reflectance member being mounted to the optoelectronic module cover surface, the reflectance member being both transmissive and diffusively reflective to the particular wavelengths or ranges of wavelengths generated by the emitter and detectable by the detector such that the optoelectronic module exhibits substantially no fan-out field-of-view overlap.

2 . The optoelectronic module according to claim 1 , in which the optoelectronic module further includes a baffle mounted to the optoelectronic module cover or spectral reflectance member.

3 . The optoelectronic module according to claim 2 wherein the baffle is substantially non-transmissive to the particular wavelength or range of wavelengths of light generated by the emitter and detectable by the detector.

4 . The optoelectronic module of claim 1 , wherein the spacer is substantially non-transmissive to the particular wavelength or range of wavelengths of light generated by the emitter and detectable by the detector.

5 . The optoelectronic module according to claim 4 , in which the optoelectronic module further includes a baffle mounted to the optoelectronic module cover or spectral reflectance member.

6 . The optoelectronic module according to claim 5 wherein the baffle is substantially non-transmissive to the particular wavelength or range of wavelengths of light generated by the emitter and detectable by the detector.

7 . The optoelectronic module of claim 1 , the spacer further comprising a non-transmissive core wherein the non-transmissive core is substantially non-transmissive to the particular wavelength or range of wavelengths of light generated by the emitter and detectable by the detector.

8 . The optoelectronic module according to claim 7 , in which the optoelectronic module further includes a baffle mounted to the optoelectronic module cover or spectral reflectance member.

9 . The optoelectronic module according to claim 8 wherein the baffle is substantially non-transmissive to the particular wavelength or range of wavelengths of light generated by the emitter and detectable by the detector.

10 . The optoelectronic module according to claim 1 , the optoelectronic module cover including a non-transmissive cover core wherein the non-transmissive cover core is substantially non-transmissive to the particular wavelength or range of wavelengths of light generated by the emitter and detectable by the detector.

11 . The optoelectronic module according to claim 1 , wherein the reflectance member includes a plurality of holes.

12 . The optoelectronic module according to claim 11 , wherein the plurality of holes extends over 30% to 50% of the reflectance member surface.

13 . The optoelectronic module according to claim 11 , wherein the average diameter of an individual hole among the plurality of holes is between 20 microns and 100 microns.

14 . The optoelectronic model according to claim 11 , wherein the plurality of holes extends over 40% of the reflectance member surface, and the average diameter of an individual hole among the plurality of holes is 40 microns.

15 . The optoelectronic model according to claim 11 , wherein the plurality of holes is filled with a filler material, wherein the filler material is transmissive and diffusively reflective to the particular wavelength or ranges of wavelengths different from the reflectance member.

16 . The optoelectronic module according to claim 11 , wherein the holes are through holes.

17 . The optoelectronic module according to claim 1 , wherein the optoelectronic module is mounted into a host device, the host device including a host device case wherein the host device case is diffusively reflective to the same particular wavelength or range of wavelengths as the reflectance member.

18 . The optoelectronic module of claim 17 , wherein the spacer is diffusively reflective to the same particular wavelength or range of wavelengths as the host device.

19 . The optoelectronic module of claim 18 , wherein the spacer includes a non-transmissive spacer core, wherein the non-transmissive spacer core is substantially non-transmissive to the particular wavelength or range of wavelengths of light generated by the emitter and detectable by the detector.

20 . The optoelectronic module of claim 17 , wherein a baffle is mounted to the optoelectronic module cover or spectral reflectance member, wherein the baffle is substantially non-transmissive to the particular wavelength or range of wavelengths of light generated by the emitter and detectable by the detector, and wherein the baffle is diffusively reflective to the same particular wavelength or range of wavelengths as the host device.

21 . The optoelectronic module of claim 17 , wherein the optoelectronic module cover includes a non-transmissive cover core wherein the non-transmissive cover core is substantially non-transmissive to the particular wavelength or range of wavelengths of light generated by the emitter and detectable by the detector, and wherein the non-transmissive cover core is diffusively reflective to the same particular wavelength or range of wavelengths as the host device.

22 . The optoelectronic module of claim 17 , wherein the reflectance member includes a plurality of holes, the portion of the reflectance member surrounding each hole within the plurality being diffusively reflective to the same particular wavelength or range of wavelengths as the host device.

23 . The optoelectronic module according to claim 1 , wherein the optoelectronic module is mounted into a host device, the host device including a host device case wherein the host device case is diffusively reflective to the same particular wavelength or range of wavelengths as the reflectance member, the host device further including a host device transparent cover, the host device transparent cover being both transmissive and diffusively reflective to the particular wavelengths or ranges of wavelengths generated by the emitter and detectable by the detector, and the host device transparent cover being diffusively reflective to the same particular wavelengths as the host device.

24 . The optoelectronic module according to claim 1 , wherein the optoelectronic module is mounted into a host device, the host device including a host device case wherein the host device case is diffusively reflective to the same particular wavelength or range of wavelengths as the reflectance member, the host device further including a host device transparent cover and a host device reflectance member mounted to the host device transparent cover, wherein the host device reflectance member is transmissive to the particular wavelengths or ranges of wavelengths generated by the emitter and detectable by the detector, and the host device reflectance member is diffusively reflective to the same particular wavelengths as the host device.

Assignees

• Heptagon Micro Optics Pte Ltd

Inventors

• Geiger Jens
• Sobel Frank
• Kromhof Rene
• Soppelsa Alberto
• Hauser Kevin
• Lenart Robert

Classifications

• G01J1/0266

  Field-of-view determination; Aiming or pointing of a photometer; Adjusting alignment; Encoding angular position; Size of the measurement area; Position tracking; Photodetection involving different fields of view for a single detector · CPC title

• G01J1/0295 Primary

  Constructional arrangements for removing other types of optical noise or for performing calibration · CPC title

• G01J1/08

  Arrangements of light sources specially adapted for photometry {standard sources, also using luminescent or radioactive material} · CPC title

• G01J1/0437

  using masks, aperture plates, spatial light modulators, spatial filters, e.g. reflective filters · CPC title

• G01J1/0204

  Compact construction · CPC title