Circuit probing system and its circuit probing device

Patent metadata

Field	Value
Publication number	US-2017045554-A1
Application number	US-201514934109-A
Country	US
Kind code	A1
Filing date	Nov 5, 2015
Priority date	Aug 10, 2015
Publication date	Feb 16, 2017
Grant date	—

Abstract

A circuit probing system and a circuit probing device thereof are provided. The circuit probing device includes a probe card and a protective lid. The probe card is provided with a pin area, a bore hole and a first magnetic attraction member disposed in the bore hole. The protective lid is provided with a second magnetic attraction member. When the protective lid covers the probe pin area, and the second magnetic attraction member inserts into the bore hole, the protective lid is fixed on the probe card as the first magnetic attraction member and the second magnetic attraction member magnetically attract with each other.

First claim

What is claimed is:

1 . A circuit probing device comprising:
a probe card having a probe pin area, at least one bore hole, and at least one first magnetic attraction member is disposed in the bore hole; a protective lid having at least one second magnetic attraction member, wherein, when the protective lid covers the probe pin area of the probe card, and the second magnetic attraction member inserts into the bore hole of the probe card, the protective lid is fixed on the probe card as the first magnetic attraction member and the second magnetic attraction member magnetically attract with each other.

2 . The circuit probing device of claim 1 , wherein the second magnetic attraction member comprises a cylindrical body and a magnetic block disposed on one distal end of the cylindrical body.

3 . The circuit probing device of claim 1 , wherein the second magnetic attraction member is in a cylindrical shape, and directly connected to one surface of the protective lid.

4 . The circuit probing device of claim 1 , wherein the first magnetic attraction member and the second magnetic attraction member are a metal and a magnet; or the first magnetic attraction member and the second magnetic attraction member are magnets.

5 . The circuit probing device of claim 1 , wherein the bore hole is provided with a cylindrical passage having a longitudinal direction, wherein the second magnetic attraction member enters the cylindrical passage in the longitudinal direction.

6 . The circuit probing device of claim 1 , wherein the bore hole is provided with a cylindrical passage and an opening peripheral edge, the opening peripheral edge connects to the cylindrical passage and surrounds the cylindrical passage, wherein the opening peripheral edge includes a guiding slope surface for guiding the second magnetic attraction member to enter the cylindrical passage.

7 . The circuit probing device of claim 1 , wherein the probe card further comprises at least one fluorescent layer, the fluorescent layer is connected to the bore hole, wherein the fluorescent layer is provided with a fluorescent color.

8 . The circuit probing device of claim 1 , wherein the protective lid further comprises at least one fluorescent layer, the fluorescent layer is disposed on the second magnetic attraction member, wherein the fluorescent layer is provided with a fluorescent color.

9 . The circuit probing device of claim 1 , wherein the protective lid comprises an arc surface and a confronting surface, a peripheral edge of the arc surface is connected to a peripheral edge of the confronting surface, and the second magnetic attraction member is disposed on the confronting surface of the protective lid, wherein, when the protective lid covers the probe pin area of the probe card, the confronting surface is in contact with the probe card.

10 . The circuit probing device of claim 1 , wherein the protective lid further comprises a grip portion, the grip portion is arranged on one surface of the protective lid opposite to the second magnetic attraction member, and used for removing the protective lid away from the probe card.

11 . A circuit probing system comprising:
a circuit probing device comprising:
a probe card having a probe pin area, at least one bore hole and at least one first magnetic attraction member disposed in the bore hole; and
a protective lid having at least one second magnetic attraction member and a grip portion, the second magnetic attraction member enters the bore hole in a first direction, and the second magnetic attraction member and the first magnetic attraction member magnetically attract with each other such that the protective lid is fixed on the probe card;
an object-removing device for removing the protective lid away from the probe card in a second direction by moving the grip portion, wherein the second direction is opposite to the first direction; and a transmission device electrically connected to the object-removing device for driving the object-removing device to move.

12 . The circuit probing system of claim 11 , wherein the grip portion comprises a neck and a grip head connected to the neck, and a transverse cross-sectional area of the neck is smaller than a transverse cross-sectional area of the grip head.

13 . The circuit probing system of claim 12 , wherein the object-removing device comprises an object-removing module having a main body and a U-shaped fork, the U-shaped fork is connected to the main body for reaching the neck and abutting the grip head.

14 . The circuit probing system of claim 13 , wherein the object-removing device further comprises a vertical guiding module and a horizontal guiding module, the object-removing module is elevatably connected to the vertical guiding module, and the horizontal guiding module is horizontally connected to the vertical guiding module.

15 . The circuit probing system of claim 13 , wherein the object-removing device further comprises a suction head, the suction head is elevatably connected to the main body so that a changeable gap is formed between the suction head and the U-shaped fork, wherein, when the object-removing device moves the grip head, the grip head is clamped by the suction head and the U-shaped fork in the changeable gap, and the suction head sucks one surface of the grip head opposite to the neck.

16 . The circuit probing system of claim 15 , wherein the object-removing device further comprises a vertical guiding module and a horizontal guiding module, the object-removing module is elevatably connected to the vertical guiding module, and the horizontal guiding module is horizontally connected to the vertical guiding module.

17 . The circuit probing system of claim 11 , wherein the first magnetic attraction member and the second magnetic attraction member are a metal and a magnet; or the first magnetic attraction member and the second magnetic attraction member are magnets.

18 . The circuit probing system of claim 11 , wherein the bore hole is provided with a cylindrical passage having a longitudinal direction, wherein the longitudinal direction is the same as the first direction.

19 . The circuit probing system of claim 11 , wherein the protective lid comprises an arc surface and a confronting surface, a peripheral edge of the arc surface is connected to a peripheral edge of the confronting surface, and the confronting surface is in contact with the probe card, wherein the second magnetic attraction member is disposed on the confronting surface of the protective lid.

Assignees

• Global Unichip Corp
• Taiwan Semiconductor Mfg Co Ltd

Inventors

• Liao Chih-Chieh
• Sun yu-min
• Cheng Chih-Feng

Classifications

• G01R1/0408

  Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets (G01R1/067 takes precedence; mass production testing systems G01R31/59; testing of connections G01R31/66; for testing printed circuit boards G01R31/2808) · CPC title

• G01R1/16 Primary

  Magnets · CPC title

• G01R1/07307

  with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card · CPC title

• G01R31/2808

  Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards (probe, multiprobe, probe manipulator or probe fixture G01R1/067) · CPC title

• G01R31/2867

  Handlers or transport devices, e.g. loaders, carriers, trays · CPC title