Semiconductor device, method for manufacturing the same, method for generating mask data, mask and computer readable recording medium
US-9455223-B2 · Sep 27, 2016 · US
US2016358901A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016358901-A1 |
| Application number | US-201615242885-A |
| Country | US |
| Kind code | A1 |
| Filing date | Aug 22, 2016 |
| Priority date | Mar 17, 2000 |
| Publication date | Dec 8, 2016 |
| Grant date | — |
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Official abstract text for this publication.
A semiconductor device has first wiring layers and a plurality of dummy wiring layers that are provided on the same level as the first wiring layers. The semiconductor device defines a row direction, and first virtual linear lines extending in a direction traversing the row direction. The row direction and the first virtual linear lines define an angle of 2-40 degrees, and the dummy wiring layers are disposed in a manner to be located on the first virtual linear lines. The semiconductor device also defines a column direction perpendicular to the row direction, and second virtual linear lines extending in a direction traversing the column direction. The column direction and the second virtual linear lines define an angle of 2-40 degrees, and the dummy wiring layers are disposed in a manner to be located on the second virtual linear lines.
Opening claim text (preview).
What is claimed is: 1 . A semiconductor device comprising: a plurality of first wiring layers; a plurality of restriction regions each including at least one of said first wiring layers; and a plurality of dummy wiring layers provided in regions other than said restriction regions; wherein each of said dummy wiring layers does not connect with said restriction regions. 2 . The semiconductor device of claim 1 , wherein all of said dummy wiring layers are similarly shaped. 3 . The semiconductor device of claim 1 , wherein all of said dummy wiring layers have a square shape. 4 . The semiconductor device of claim 1 , wherein each of said dummy wiring layers have a width of approximately 2 μm. 5 . The semiconductor device of claim 1 , wherein each of said dummy wiring layers are spaced approximately 1 μm apart. 6 . The semiconductor device of claim 1 , wherein said dummy wiring layers are staggered relative to each other.
by smoothing the dielectric parts · CPC title
using processes for implementing desired shapes or dispositions of the openings, e.g. double patterning · CPC title
by filling conductive material into holes, grooves or trenches · CPC title
Layouts of interconnections · CPC title
Vias, e.g. via plugs · CPC title
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