Quasi-Planar Multi-Reflecting Time-of-Flight Mass Spectrometer

US2016358764A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2016358764-A1
Application numberUS-201615244931-A
CountryUS
Kind codeA1
Filing dateAug 23, 2016
Priority dateJul 16, 2008
Publication dateDec 8, 2016
Grant date

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A multi-reflecting, time-of-flight (MR-TOF) mass spectrometer including two quasi-planar electrostatic ion mirrors extended along drill direction (Z) and formed of parallel electrodes, separated by a field free region. The MR-TOF includes a pulsed ion source to release ion packets at a small angle to X-direction which is orthogonal to the drill direction Z. Ion packets are reflected between ion mirrors and drill along the drift direction. The mirrors are arranged to provide time-of-flight focusing ion packets on the receiver. The MR-TOF mirrors provide spatial focusing M the Y-direction orthogonal to both drift direction Z and on injection direction X. In a preferred embodiment, at least one mirror has a feature providing periodic spatial focusing of ion packets in the drift Z-direction.

First claim

Opening claim text (preview).

1 . A multi-reflecting time-of-flight mass spectrometer comprising: two quasi-planar electrostatic ion mirrors extended along a drift direction (Z) and formed of parallel electrodes, wherein said mirrors are separated by a field free field-free region; a pulsed ion source to release ion packets at small angle to an X direction which is orthogonal to the drift direction Z, such that the ion packets are reflected between the ion mirrors and drift along the drift direction; a receiver to receive the ion packets; wherein said mirrors are positioned to provide time-of-flight focusing on said receiver and provide spatial focusing in a Y-direction orthogonal to both the drift direction Z and the ion injection direction X; and wherein at least one of said mirrors has a periodic feature providing modulation of electrostatic field along the drift Z-direction for the purpose of periodic spatial focusing of the ion packets in the Z-direction. 2 . The apparatus as defined in claim 1 and further including at least one end deflector for reverting ion path in the drift direction. 3 . The apparatus as defined in claim 1 and further including at least one isochronous curved interface between said pulsed ion source and said receiver. 4 . The apparatus as defined in claim 1 and further including at least two lenses in the field free field-free region. 5 . The apparatus as defined in claim 1 , wherein at least one of said mirrors comprises at least four electrodes with at least one electrode having attracting potential applied thereto to provide said time-of-flight focusing and said spatial focusing in the Y-direction. 6 . The apparatus as defined in claim 1 , wherein said periodic feature comprises at least one mirror electrode with the opening varying in height in the Y-direction. 7 . The apparatus as defined in claim 1 , wherein said periodic feature comprises at least one mirror electrode with the varying width along the X direction. 8 . The apparatus as defined in claim 1 , wherein said periodic feature is a set of periodic lenses incorporated into the internal electrode of at least one of said mirrors. 9 . The apparatus as defined in claim 1 , wherein said periodic feature comprises a set of auxiliary electrodes incorporated into at least one mirror electrode and wherein a potential of the auxiliary electrodes varies periodically in the Z-direction. 10 . The apparatus as defined in claim 1 , wherein said periodic feature has a period equal N*ΔZ/2, where N is an integer number and ΔZ is an advance in the drift direction of said ion jigsaw trajectory per reflection. 11 . The apparatus as defined in claim 1 , wherein said periodic feature has a period equal to integer number of periods of said jigsaw trajectory. 12 . A method of time-of-flight analysis comprising the steps of: forming packets of analyzed ions; passing ion packets between two parallel and quasi-planar ion mirrors extended along a drift Z-direction while retaining relatively small velocity component of the ion packets along the Z-direction such that the ion packets move along a jigsaw ion trajectory; receiving ions at a receiver; focusing the ion packets in time and spatially focused in direction Y; and spatially and periodically modulating an electrostatic field within at least one mirror in order to provide for spatial focusing of the ion packets along the Z-direction. 13 . The method as defined in claim 12 and further comprising a step of reverting the direction of ion drift at the edges of an analyzer. 14 . The method as defined in claim 12 and further comprising injection of ion packets via a curved isochronous interface. 15 . The method as defined in claim 12 and further comprising spatial focusing of ion packets within a drift space between said mirrors by at least two lenses. 16 . The method as defined in claim 12 , wherein said step of periodically modulating electrostatic field within at least one of said mirrors comprises a step of spatial modulation of the shape of at least one mirror electrode. 17 . The method as defined in claim 12 , wherein said step of periodically modulating electrostatic field within at least one of said ion mirrors comprises a step of introducing periodic field of auxiliary electrodes. 18 . The method as defined in claim 12 , wherein the period of said modulation equals to N*ΔZ/2, where N is an integer number and ΔZ is an advance in the drift direction of said ion jigsaw trajectory per reflection. 19 . The method as defined in claim 12 , wherein said step of forming ion packets includes step of ion accumulation of ions coming from a continuous ion source. 20 . The method as defined in claim 12 , wherein the strength of periodic focusing in the Z-direction is adjustable.

Assignees

Inventors

Classifications

  • Electrostatic deflection · CPC title

  • Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title

  • H01J49/406Primary

    with multiple reflections · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US2016358764A1 cover?
A multi-reflecting, time-of-flight (MR-TOF) mass spectrometer including two quasi-planar electrostatic ion mirrors extended along drill direction (Z) and formed of parallel electrodes, separated by a field free region. The MR-TOF includes a pulsed ion source to release ion packets at a small angle to X-direction which is orthogonal to the drill direction Z. Ion packets are reflected between ion…
Who is the assignee on this patent?
Leco Corp
What technology area does this patent fall under?
Primary CPC classification H01J49/406. Mapped technology areas include Electricity.
When was this patent published?
Publication date Thu Dec 08 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).