Circuits and Methods for Limiting Current In Random Access Memory Cells

Patent metadata

Field	Value
Publication number	US-2016358651-A1
Application number	US-201615238167-A
Country	US
Kind code	A1
Filing date	Aug 16, 2016
Priority date	Feb 13, 2015
Publication date	Dec 8, 2016
Grant date	—

Abstract

Circuits and methods for limiting cell current or throttling write operation, or both, in resistive random access memory (RRAM or ReRAM) cells are provided. An RRAM cell can include a select transistor and a programmable resistor that can change between a relatively high resistance and a relatively low resistance. The present circuits and methods can reduce or inhibit excess current from being applied to the programmable resistor, which potentially can regulate the resistance of the programmable resistor so as to reduce or inhibit decreases in the resistance of that resistor below the relatively low resistance. Such regulation potentially can improve reliability of the RRAM cell. Additionally, or alternatively, the present circuits and methods can throttle a write operation in an RRAM cell, e.g., can disable current flow through the RRAM cell based on the programmable resistor reaching a pre-defined target resistance, such as the relatively low resistance.

First claim

What is claimed is:

1 . A memory cell, comprising:
a first low dropout regulator (LDO) configured to output a bit line voltage V BL ; a resistive random access memory (RRAM) cell coupled to the first LDO, the RRAM cell comprising a first select transistor and a programmable resistor, a gate of the first select transistor being coupled to a word line and receiving a word line voltage V WL , the RRAM cell receiving as input the bit line voltage V BL , from the first LDO, the programmable resistor being configured to change between a relatively high resistance and a relatively low resistance responsive to changes in a cell current I CELL through the RRAM cell based upon values of V BL , and V WL ; and a current limiter comprising a PMOS transistor, a gate of the PMOS transistor receiving a limit voltage V plim , a drain of the PMOS transistor being coupled to the first LDO.

2 . The memory cell of claim 1 , wherein the current limiter is configured to limit a current provided to the first LDO to a value I LIMIT .

3 . The memory cell of claim 2 , wherein based upon I CELL being less than I LIMIT and the programmable resistor having the relatively high resistance, a voltage across the programmable resistor is substantially constant.

4 . The memory cell of claim 3 , wherein based upon I CELL approaching or equaling I LIMIT responsive to the programmable resistor changing from the relatively high resistance to the relatively low resistance, a voltage across the PMOS transistor increases, and
based upon the voltage across the PMOS transistor increasing, I CELL decreases to a level that reduces or inhibits a further decrease in the resistance of the programmable resistor.

5 . The memory cell of claim 1 , wherein the programmable resistor is coupled between the output of the first LDO and the first select transistor.

6 . The memory cell of claim 1 , wherein the first select transistor is coupled between the programmable resistor and the output of the first LDO.

7 . The memory cell of claim 1 , wherein the first select transistor comprises an NMOS transistor.

8 . The memory cell of claim 1 , further comprising:
a write throttle circuit, configured to disable current flow through the first LDO responsive to an LDO Disable signal output by the write throttle circuit.

9 . The memory cell of claim 1 , further comprising a reference cell coupled to the gate of the PMOS transistor, the reference cell comprising:
a second LDO configured to output a reference bit line voltage V BL,REF ; a dummy cell coupled to the second LDO, the dummy cell comprising a second select transistor and a resistor having a fixed resistance, a gate of the second select transistor being coupled to the word line and receiving the word line voltage V WL , the dummy cell receiving as input the reference bit line voltage V BL,REF from the second LDO, a current I REF through the dummy cell being based upon the fixed resistance and on the values of V BL,REF and V WL; and a mirror current limiter.

10 . The memory cell of claim 9 , further comprising a bit line resistor having resistance R BL , coupled between the RRAM cell and the first LDO and a select line resistor having resistance R SL coupled between the first select transistor and the ground, the reference cell further comprising a reference bit line resistor having a reference resistance R BL,REF coupled between the dummy cell and the second LDO, and a reference select line resistor having resistance R SL,REF coupled between the second select transistor and the ground.

11 . The memory cell of claim 9 , further comprising a write throttle circuit, the write throttle circuit configured to disable current flow through the first LDO responsive to an LDO Disable signal output by the write throttle circuit.

12 . A memory cell, comprising:
a first low dropout regulator (LDO) configured to output a bit line voltage V BL ; a resistive random access memory (RRAM) cell coupled to the first LDO, the RRAM cell comprising a first select transistor and a programmable resistor, a gate of the first select transistor being coupled to a word line and receiving a word line voltage V WL , the RRAM cell receiving as input the bit line voltage V BL , from the first LDO, the programmable resistor being configured to change between a relatively high resistance and a relatively low resistance responsive to changes in a cell current I CELL through the RRAM cell based upon values of V BL , and V WL ; and a current limiter coupled to the first LDO.

13 . The memory cell of claim 12 , wherein the current limiter is configured to limit a current provided to the first LDO to a value I LIMIT .

14 . The memory cell of claim 13 , wherein based upon I CELL being less than I LIMIT and the programmable resistor having the relatively high resistance, a voltage across the programmable resistor is substantially constant.

15 . The memory cell of claim 14 , wherein based upon I CELL approaching or equaling I LIMIT responsive to the programmable resistor changing from the relatively high resistance to the relatively low resistance, a voltage across a PMOS transistor within the current limiter increases, and
based upon the voltage across the PMOS transistor increasing, I CELL decreases to a level that reduces or inhibits a further decrease in the resistance of the programmable resistor.

16 . The memory cell of claim 12 , wherein the programmable resistor is coupled between the output of the first LDO and the first select transistor.

17 . The memory cell of claim 12 , wherein the first select transistor is coupled between the programmable resistor and the output of the first LDO.

18 . The memory cell of claim 12 , wherein the first select transistor comprises an NMOS transistor.

19 . A method, comprising:
outputting a bit line voltage V BL with a low dropout regulator (LDO); at a resistive random access memory (RRAM) cell coupled to the LDO, receiving as input the bit line voltage V BL from the LDO; receiving as input a word line voltage V WL ; at a programmable resistor of the RRAM cell, changing between a relatively high resistance and a relatively low resistance responsive to changes in a cell current I CELL through the RRAM cell based upon values of V BL and V WL ; and limiting current through the RRAM cell with a current limiter.

20 . The method of claim 19 , wherein based upon I CELL being less than I LIMIT and the programmable resistor having the relatively high resistance, a voltage across the programmable resistor is substantially constant.

Assignees

• Taiwan Semiconductor Mfg Co Ltd

Inventors

• Shih Yi-Chun
• Chou Chung-Cheng
• Lee Po-Hao

Classifications

• G11C13/0069 Primary

  Writing or programming circuits or methods · CPC title

• G11C13/0038

  Power supply circuits · CPC title

• G11C2013/0054

  Read is performed on a reference element, e.g. cell, and the reference sensed value is used to compare the sensed value of the selected cell · CPC title

• G11C13/0026

  Bit-line or column circuits · CPC title

• G11C13/0064

  Verifying circuits or methods · CPC title