Testing Device and Testing Method for Optical Film

Patent metadata

Field	Value
Publication number	US-2016334654-A1
Application number	US-201615154433-A
Country	US
Kind code	A1
Filing date	May 13, 2016
Priority date	May 15, 2015
Publication date	Nov 17, 2016
Grant date	—

Abstract

A testing device and a testing method for an optical film are disclosed. The testing device includes a carrier having a cavity, wherein the cavity is an enclosed space; a test condition providing module disposed in the enclosed space; wherein the optical film is disposed in the enclosed space and the test condition providing module is configured for providing a test condition simulating a real environment in a liquid crystal display module for the optical film. The testing device for an optical film is configured for testing the optical film to be tested.

First claim

What is claimed is:

1 . A testing device for an optical film, comprising:
a carrier having a cavity, wherein the cavity is an enclosed space; a test condition providing module disposed in the enclosed space; wherein the optical film is disposed in the enclosed space and the test condition providing module is configured for providing a test condition simulating a real environment in a liquid crystal display module for the optical film.

2 . The testing device of claim 1 , further comprising a test partition disposed in the enclosed space, wherein the test partition is configured for supporting the optical film.

3 . The testing device of claim 2 , wherein the test partition is plural and the test condition providing module is plural, a plurality of enclosed spaces are formed between the plurality of test partitions and the carrier, and the test condition providing module is disposed in each of the enclosed spaces.

4 . The testing device of claim 3 , wherein a side of the carrier consists of a plurality of baffles and the plurality of baffles are hinged to the plurality of test partitions with a one to one correspondence.

5 . The testing device of claim 3 , wherein the test partitions is fixedly connected to a first side wall and a second side wall of the cavity which are opposite to each other.

6 . The testing device of claim 3 , wherein a side of the carrier consists of a plurality of baffles and the plurality of baffles are fixedly connected to the plurality of test partitions with a one to one correspondence.

7 . The testing device of claim 6 , wherein each of the test partitions is connected to a first side wall and second side wall of the cavity which are opposite to each other by a slide rail respectively.

8 . The testing device of claim 4 , wherein each of the baffles is provided with a handle.

9 . The testing device of claim 1 , wherein the test condition providing module comprises a heating module, and the heating module is configured for providing a temperature environment simulating a real temperature environment in a liquid crystal display module for the optical film.

10 . The testing device of claim 9 , wherein the heating module is fixed onto a third side wall of the cavity and the third side wall is orthogonal to the test partitions.

11 . The testing device of claim 9 , wherein the heating module comprises at least two heat source components and at least two first switches respectively configured for controlling the at least two heat source components with a one to one correspondence.

12 . The testing device of claim 11 , wherein each of the heat source components comprise a plurality of light emitting diodes connected in series and the first switches are configured for controlling the plurality of light emitting diodes.

13 . The testing device of claim 9 , wherein the test condition providing module further comprises a humidifying module and the humidifying module is configured for providing a humidity environment simulating a real humidity environment in a liquid crystal display module for the optical film.

14 . The testing device of claim 13 , wherein the humidifying module comprises at least two humidity source components and at least two second switches respectively configured for controlling the at least two humidity source components with a one to one correspondence.

15 . The testing device of claim 14 , wherein the humidity source components are humidifiers and the second switches are configured for controlling the humidifiers.

16 . The testing device of claim 1 , wherein a shape of the cavity is cuboid.

17 . A method for testing an optical film, comprising placing the optical film in the testing device of claim 1 .

18 . The testing method of claim 17 , wherein the testing device comprises a test partition and the method comprises placing the optical film on the test partition.

19 . The testing method of claim 17 , wherein the test partition is plural and the test condition providing module is plural, a plurality of enclosed spaces is formed between the plurality of test partitions and the carrier, the test condition providing module is disposed in each of the enclosed spaces; the optical film is plural and each of the optical films is placed in an enclosed space.

Assignees

• Boe Technology Group Co Ltd
• Hefei Xinsheng Optoelectronics Technology Co Ltd

Inventors

• Jiang Yiqiang
• Meng Qinglong
• Qian Zhiyu
• Li Yanping
• Wang Linlin
• Wan Jing

Classifications

• G02F1/1309 Primary

  Repairing; Testing · CPC title

• G01M11/0278

  Detecting defects of the object to be tested, e.g. scratches or dust (investigating the presence of flaws or contamination on materials by optical means G01N21/88) · CPC title

• G01B21/30 Primary

  for measuring roughness or irregularity of surfaces · CPC title

• G01M11/0214

  Details of devices holding the object to be tested · CPC title

• G01M11/00 Primary

  Testing of optical apparatus; Testing structures by optical methods not otherwise provided for · CPC title