Surface examination of components

US2016334377A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2016334377-A1
Application numberUS-201615152230-A
CountryUS
Kind codeA1
Filing dateMay 11, 2016
Priority dateMay 11, 2015
Publication dateNov 17, 2016
Grant date

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

An apparatus used for the surface examination of components. The apparatus comprises: a radiation source configured to convert at least one non-volatile substance at least partially into a gas by irradiating a sample surface of a component; and a detector unit configured to qualitatively and/or quantitatively detect the at least one substance converted into gas. A method provided for a surface examination of components. The method comprises irradiating a sample surface of a component with a radiation source configured to convert at least one non-volatile substance at least partially into a gas; and a qualitative and/or quantitative detection of the at least one substance converted into gas via a detector unit.

First claim

Opening claim text (preview).

1 . An apparatus for the surface examination of components comprising: a radiation source configured to convert at least one non-volatile substance at least partially into a gas by irradiating a sample surface of a component; and a detector unit configured to at least one of qualitatively or quantitatively detect the at least one substance converted into gas. 2 . The apparatus according to claim 1 , wherein the radiation source comprises at least one of an infrared emitter, a laser, a terahertz radiation source, a plasma emitter or an LED unit. 3 . The apparatus according to claim 1 , wherein the detector unit comprises at least one gas chromatography ion mobility spectrometer. 4 . The apparatus according to claim 1 , wherein the radiation source is configured to initiate a removal of material of the component from the sample surface. 5 . The apparatus according to claim 1 , further comprising a measurement bell configured to form a measurement volume around the component or adjacent to the component, which adjoins the sample surface. 6 . The apparatus according to claim 5 , further comprising a controllable gas supply line configured to flush the measurement volume with an experimental gas. 7 . The apparatus according to claim 5 , wherein the radiation source is configured to irradiate the sample surface through an energy-transparent coupling-in window in the measurement bell. 8 . The apparatus according to claim 5 , wherein the measurement bell comprises a seal made of a flexible material which seals the measurement volume at a transition between the measurement bell and the sample surface. 9 . The apparatus according to claim 1 , further comprising a process monitoring unit configured to detect a temperature prevailing on the sample surface. 10 . The apparatus according to claim 1 comprising part of a mobile, portable manual device. 11 . A method for the surface examination of components, comprising: irradiating a sample surface of a component with a radiation source configured to convert at least one non-volatile substance at least partially into a gas; and at least one of qualitatively or quantitatively detecting at least one substance converted into gas via a detector unit. 12 . The method according to claim 11 , wherein the irradiation is accomplished using at least one of an infrared emitter, a laser, a terahertz radiation source, a plasma emitter or at an LED unit comprising the radiation source. 13 . The method according to claim 11 , wherein the detection is accomplished using at least one gas chromatography ion mobility spectrometer comprising the detector unit. 14 . The method according to claim 11 , which further comprises flushing a measurement volume adjoining the sample surface with an experimental gas. 15 . The method according to claim 11 , wherein the irradiation is accomplished as part of a pre-treatment method for at least one of purification or activation of the sample surface, and wherein the detection of the at least one substance converted into gas comprises detection of exhaust gas which occurs during the pre-treatment method.

Assignees

Inventors

Classifications

  • Separation specially adapted for use outside laboratory, e.g. field sampling, portable equipments · CPC title

  • Laser ablation; Microwave vaporisation · CPC title

  • Extraction · CPC title

  • interfaced to gas chromatograph (interfaces in general for introducing or extracting samples to be analysed with specially adapted mass spectrometer, see H01J49/04) · CPC title

  • purpose-built sampling enclosure for emissions · CPC title

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What does patent US2016334377A1 cover?
An apparatus used for the surface examination of components. The apparatus comprises: a radiation source configured to convert at least one non-volatile substance at least partially into a gas by irradiating a sample surface of a component; and a detector unit configured to qualitatively and/or quantitatively detect the at least one substance converted into gas. A method provided for a surface …
Who is the assignee on this patent?
Airbus Defence & Space Gmbh
What technology area does this patent fall under?
Primary CPC classification G01N30/7206. Mapped technology areas include Physics.
When was this patent published?
Publication date Thu Nov 17 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).