Alpha alumina thin film for processing difficult-to-cut material and cast iron

US2016298232A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2016298232-A1
Application numberUS-201415038474-A
CountryUS
Kind codeA1
Filing dateNov 26, 2014
Priority dateDec 23, 2013
Publication dateOct 13, 2016
Grant date

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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Abstract

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Disclosed is an alpha alumina (α-Al2O3) thin film comprising the lower layer formed on the base material made from cemented carbide; and the α-Al2O3 thin film layer formed on the lower layer, wherein when the α-Al2O3 thin film layer is divided, from the total thickness (T) thereof, into a D1 layer which is from an interface layer to 0.15T, a D2 layer which is from 0.15T to 0.4T, and a D3 layer which is from 0.4T to 1T, an S1 (D3 layer grain size/D1 layer grain size) is 2-5.5 and an S2 (D2 layer grain size/D1 layer grain size) is 1.5-4.

First claim

Opening claim text (preview).

1 . An alpha alumina (α-Al 2 O 3 ) thin film which has a thickness of T and is formed on a lower layer which is formed on a base material, the α-Al 2 O 3 thin film being divided into: a D1 layer which is positioned between an interfacial layer and 0.15T above the interfacial layer; a D2 layer which is positioned between 0.15T and 0.4T above the interfacial layer; and a D3 layer which is positioned between 0.4T and 1T above the interfacial layer, wherein S1 (the grain size of the D3 layer/the grain size of the D1 layer) is 2 to 5.5, and S2 (the grain size of the D2 layer/the grain size of the D1 layer) is 1.5 to 4. 2 . The α-Al 2 O 3 thin film of claim 1 , wherein the base material is a cemented carbide containing 5 to 10 wt % of Co, and at most 1 wt % of (Ta,Nb)C. 3 . The α-Al 2 O 3 thin film of claim 1 , wherein the lower layer comprises: a TiN layer formed on the base material; a MT-TiCN layer formed on the TiN layer; and an interfacial layer containing Ti and formed on the TiCN layer. 4 . The α-Al 2 O 3 thin film of claim 3 , wherein: the thickness of the TiN layer is 0.1 to 2 μm; the thickness of the MT-TiCN layer is 3 to 10 μm; the thickness of the interfacial layer is 0.1 to 1 μm; and the thickness of the α-Al 2 O 3 layer is 2 to 8 μm. 5 . The α-Al 2 O 3 thin film of claim 1 , wherein: the grain size of the D1 layer is 0.1 to 0.5 μm; the grain size of the D2 layer is 0.15 to 0.8 μm; and the grain size of the D3 layer is 0.4 to 1.5 μm. 6 . The α-Al 2 O 3 thin film of claim 3 , wherein the interfacial layer comprises: a Ti x Al 1-x CNO layer formed on the MT-TiCN layer; a Al y Ti 1-y CNO layer formed on the TixAl1-xCNO layer; and a Ti oxide layer formed on the Al y Ti 1-y CNO layer. 7 . The α-Al 2 O 3 thin film of claim 1 , wherein the surface roughness (Ra) of the α-Al 2 O 3 thin film is at most 250 nm.

Assignees

Inventors

Classifications

  • with layers graded in composition or physical properties · CPC title

  • C23C28/028Primary

    Including graded layers in composition or in physical properties, e.g. density, porosity, grain size · CPC title

  • C23C16/06Primary

    characterised by the deposition of metallic material · CPC title

  • characterised by the method of coating (C23C16/04 takes precedence) · CPC title

  • C23C28/044Primary

    coatings specially adapted for cutting tools or wear applications · CPC title

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What does patent US2016298232A1 cover?
Disclosed is an alpha alumina (α-Al2O3) thin film comprising the lower layer formed on the base material made from cemented carbide; and the α-Al2O3 thin film layer formed on the lower layer, wherein when the α-Al2O3 thin film layer is divided, from the total thickness (T) thereof, into a D1 layer which is from an interface layer to 0.15T, a D2 layer which is from 0.15T to 0.4T, and a D3 layer …
Who is the assignee on this patent?
Korloy Inc
What technology area does this patent fall under?
Primary CPC classification C23C28/028. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Thu Oct 13 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).