Manufacturing method of display substrate, display substrate and display device
US-12062711-B2 · Aug 13, 2024 · US
US2016291431A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016291431-A1 |
| Application number | US-201414438644-A |
| Country | US |
| Kind code | A1 |
| Filing date | Aug 20, 2014 |
| Priority date | Mar 7, 2014 |
| Publication date | Oct 6, 2016 |
| Grant date | — |
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The present invention provides an array substrate and a manufacturing method thereof, a display panel and a display device. The manufacturing method of an array substrate in the present invention comprises: forming light-shielding layers on the base substrate through a patterning process by using a light-shielding layer-doping multiplexing mask plate; and performing doping of CMOS transistors by using the light-shielding layer-doping multiplexing mask plate. In the invention, two mask plates used in manufacturing the light-shielding layer and the doping process in the prior art are replaced with one light-shielding layer-doping multiplexing mask plate, therefore the number of the mask plates during manufacturing is reduced and the cost is decreased. Meanwhile, providing of the light-shielding layer below the N type transistors in the driving region of the array substrate may prevent light-induced leakage current from being generated in the conductive region.
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1 - 9 . (canceled) 10 . A manufacturing method of an array substrate comprising a step of forming light-shielding layers on a base substrate, and a step of forming first type transistors and second type transistors above the light shielding layers, wherein the step of forming light-shielding layers on a base substrate comprises: forming a pattern of the light-shielding layers on the base substrate through a patterning process by using a light-shielding layer-doping multiplexing mask plate, wherein the light-shielding layer-doping multiplexing mask plate has a shielding portion corresponding to a conductive region of an active layer of each of the first type transistors in a driving region on the base substrate, and a shielding portion corresponding to a conductive region of an active layer of each of the first type transistors in a display region on the base substrate, the light-shielding layers are formed in positions corresponding to the conductive regions of the active layers of the first type transistors in the driving region and positions corresponding to the conductive regions of the active layers of the first type transistors in the display region, the step of forming first type transistors and second type transistors above the light-shielding layers comprises: performing a first type doping on active layers of the first type transistors and the second type transistors; and performing a second type doping on the second type transistors by shielding the conductive regions of the active layers of the first type transistors using the light-shielding layer-doping multiplexing mask plate. 11 . The manufacturing method of an array substrate of claim 10 , wherein performing a first type doping on active layers of the first type transistors and the second type transistors comprises: doping N type atoms into the active layers of the first type transistors and the second type transistors to form N type transistors; and doping P type atoms into the active layers of the second type transistors to form P type transistors. 12 . The manufacturing method of an array substrate of claim 10 , wherein performing a first type doping on active layers of the first type transistors and the second type transistors comprises: doping P type atoms into the active layers of the first type transistors and the second type transistors to form P type transistors; and doping N type atoms into the active layers of the second type transistors to form N type transistors. 13 . The manufacturing method of an array substrate of claim 10 , wherein the step of forming an active layer comprises following steps: depositing an amorphous silicon thin film by a low pressure chemical vapor deposition method, wherein the amorphous silicon film is crystallized into a polycrystalline silicon film as the active layer at a low temperature; or directly depositing a polycrystalline silicon film as the active layer by a low pressure chemical vapor deposition method. 14 . The manufacturing method of an array substrate of claim 11 , wherein the step of forming an active layer comprises following steps: depositing an amorphous silicon thin film by a low pressure chemical vapor deposition method, wherein the amorphous silicon film is crystallized into a polycrystalline silicon film as the active layer at a low temperature; or directly depositing a polycrystalline silicon film as the active layer by a low pressure chemical vapor deposition method. 15 . The manufacturing method of an array substrate of claim 12 , wherein the step of forming an active layer comprises following steps: depositing an amorphous silicon thin film by a low pressure chemical vapor deposition method, wherein the amorphous silicon film is crystallized into a polycrystalline silicon film as the active layer at a low temperature; or directly depositing a polycrystalline silicon film as the active layer by a low pressure chemical vapor deposition method. 16 . An array substrate comprising a base substrate, the base substrate comprises a display region for displaying and a driving region at periphery of the display region, wherein the driving region of the base substrate is provided with first type transistors and second type transistors, and the display region of the base substrate is provided with first type transistors, and wherein light-shielding layers are provided below conductive regions of active layers of the first type transistors. 17 . The array substrate of claim 16 , wherein the first type transistors are N type transistors, and the second type transistors are P type transistors; or the first type transistors are P type transistors, and the second type transistors are N type transistors. 18 . The array substrate of claim 14 , wherein the N type transistors are made by performing N type doping on low temperature polycrystalline silicon, and the P type transistors are made by performing P type doping on low temperature polycrystalline silicon. 19 . The array substrate of claim 15 , wherein the N type transistors are made by performing N type doping on low temperature polycrystalline silicon, and the P type transistors are made by performing P type doping on low temperature polycrystalline silicon. 20 . A display panel comprising the array substrate of claim 14 . 21 . A display device comprising the display panel of claim 20 .
Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth · CPC title
Silicon, silicon germanium or germanium · CPC title
using chemical vapour deposition [CVD] · CPC title
Polycrystalline · CPC title
Amorphous · CPC title
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