Built-in test structure for a receiver

Patent metadata

Field	Value
Publication number	US-2016216317-A1
Application number	US-201514603025-A
Country	US
Kind code	A1
Filing date	Jan 22, 2015
Priority date	Jan 22, 2015
Publication date	Jul 28, 2016
Grant date	—

Abstract

In one embodiment, a method for operating a receiver having a first receiver input and a second receiver input is described herein. The method comprises receiving a data signal via the first and second receiver inputs in a mission mode, AC-coupling the received data signal to an amplifier, and amplifying the AC-coupled data signal using the amplifier. The method also comprises receiving one or more test signals via one or both of the first and second receiver inputs in a test mode, DC-coupling the received one or more test signals to a test receiver, and determining whether there are one or more defects based on the one or more test signals received by the test receiver.

First claim

What is claimed is:

1 . A receiver, comprising:
an amplifier having a first input and a second input; a first AC-coupling capacitor coupled between a first receiver input and the first input of the amplifier; a second AC-coupling capacitor coupled between a second receiver input and the second input of the amplifier; a test receiver having a first input and a second input, wherein the first input of the test receiver is coupled between the first receiver input and the first AC-coupling capacitor, and the second input of the test receiver is coupled between the second receiver input and the second AC-coupling capacitor; and a test engine coupled to the test receiver; wherein, in a test mode, the test receiver is configured to receive one or more test signals via one or both of the first and second receiver inputs, and the test engine is configured to determine whether there are one or more defects based on the one or more test signals received by the test receiver; wherein, in a mission mode, the amplifier is configured to receive a data signal via the first and second receiver inputs and amplify the received data signal.

2 . The receiver of claim 1 , further comprising:
a first resistor coupled between the first receiver input and the first input of the test receiver; and a second resistor coupled between the second receiver input and the second input of the test receiver.

3 . The receiver of claim 2 , further comprising:
a first charged device model (CDM) device coupled between the first resistor and the first input of the test receiver; and a second CDM device coupled between the second resistor and the second input of the test receiver.

4 . The receiver of claim 1 , further comprising:
a first voltage divider; a second voltage divider, wherein the first and second voltage dividers are configured to set a common-mode voltage at the first and second inputs of the test receiver; and a control circuit configured to selectively enable and disable the first and second voltage dividers, wherein the control circuit enables the first and second voltage dividers in the test mode, and disables the first and second voltage dividers in the mission mode.

5 . The receiver of claim 1 , further comprising:
a first termination resistor having a first end coupled to the first receiver input, and a second end; a second termination resistor having a first end coupled to the second receiver input, and a second end; and a control circuit configured to selectively couple and decouple the second ends of the first and second termination resistors to a ground, wherein the control circuit couples the second ends of the first and second termination resistors to the ground in the mission mode, and decouples the first and second termination resistors from the ground in the test mode.

6 . The receiver of claim 5 , wherein each of the first and second termination resistors has a resistance approximately equal to 50 ohms.

7 . A receiver, comprising:
an amplifier having a first input coupled to a first receiver input and a second input coupled to a second receiver input; a first test receiver having a first input coupled to the first receiver input and a second input coupled to the second receiver input; a second test receiver having a first input coupled to the first receiver input and a second input coupled to the second receiver input; and a test engine coupled to the first and second test receivers; wherein, in a first test mode, the first test receiver is configured to receive one or more first test signals via one or both of the first and second receiver inputs, and the test engine is configured to determine whether there are one or more first defects based on the one or more first test signals received by the first test receiver; wherein, in a second test mode, the second test receiver is configured to receive one or more second test signals via one or both of the first and second receiver inputs, and the test engine is configured to determine whether there are one or more second defects based on the one or more second test signals received by the second test receiver; wherein, in a mission mode, the amplifier is configured to receive a data signal via the first and second receiver inputs and amplify the received data signal.

8 . The receiver of claim 7 , further comprising:
a first voltage divider; a second voltage divider, wherein the first and second voltage dividers are configured to set a common-mode voltage at the first and second inputs of the first test receiver; and a control circuit configured to selectively enable and disable the first and second voltage dividers, wherein the control circuit enables the first and second voltage dividers in the first test mode, and disables the first and second voltage dividers in the second test mode and the mission mode.

9 . The receiver of claim 8 , wherein, in the first test mode, the test engine is configured to determine whether there is a defect in a signal path coupled to the first receiver input, wherein the signal path is on a board.

10 . The receiver of claim 9 , wherein the defect in the signal path comprises a missing onboard capacitor, a shorted onboard capacitor, or an open in the signal path.

11 . The receiver of claim 9 , wherein, in the second test mode, the test engine is configured to determine whether there is a defect of an input/output pad or a defect of a termination resistor.

12 . The receiver of claim 7 , further comprising:
a first termination resistor having a first end coupled to the first receiver input, and a second end; a second termination resistor having a first end coupled to the second receiver input, and a second end; and a control circuit configured to selectively couple and decouple the second ends of the first and second termination resistors to a ground, wherein the control circuit couples the second ends of the first and second termination resistors to the ground in the mission mode and the second test mode, and decouples the first and second termination resistors from the ground in the first test mode.

13 . The receiver of claim 12 , wherein, in the first test mode, the test engine is configured to determine whether there is a defect in a signal path coupled to the first receiver input, wherein the signal path is on a board.

14 . The receiver of claim 13 , wherein the defect in the signal path comprises a missing onboard capacitor, a shorted onboard capacitor, or an open in the signal path.

15 . The receiver of claim 13 , wherein, in the second test mode, the test engine is configured to determine whether there is a defect of the first termination resistor or a defect of the second termination resistor.

16 . The receiver of claim 7 , further comprising:
a first AC-coupling capacitor coupled between the first receiver input and the first input of the amplifier; and a second AC-coupling capacitor coupled between the second receiver input and the second input of the amplifier.

17 . A method for operating a receiver having a first receiver input and a second receiver input, the method comprising:
receiving a data signal via the first and second receiver inputs in a mission mode; AC-coupling the received data signal to an amplifier; amplifying the AC-coupled data signal using the amplifier; receiving one or more test signals via one or both of the first and second receiver inputs in a test mode; DC-coupling the received one or more test signals to a test receiver; and determining whether there are one or more defects based on the one o

Assignees

• Qualcomm Inc

Inventors

• Chen Minhan
• Arcudia Kenneth Luis
• Pandita Bupesh

Classifications

• H04B17/297 Primary

  Self-testing arrangements · CPC title

• H04B17/20

  of receivers · CPC title

• G01R31/2884 Primary

  using dedicated test connectors, test elements or test circuits on the IC under test (G01R31/2855 takes precedence) · CPC title