Method for analysis of sample and apparatus therefor

Patent metadata

Field	Value
Publication number	US-2016189944-A1
Application number	US-201414890512-A
Country	US
Kind code	A1
Filing date	Jun 27, 2014
Priority date	Aug 14, 2013
Publication date	Jun 30, 2016
Grant date	—

Abstract

A thermal analysis step, a molecule ionization step and a molecular structure analysis step are executed in parallel to a temperature increasing step. In the molecule ionization step, component molecules contained in gas evolved from a sample S due to temperature increase are ionized, and in the molecular structure analysis step, any selected ion out of molecular ions obtained in the molecule ionization step is dissociated to generate fragment ions corresponding to the structural factors of the molecule, and the structure of the molecule is analyzed on the basis of the fragment ions.

First claim

1 . A method for analysis of a sample comprising:
a temperature increasing step of increasing the temperature of a sample according to a predetermined temperature increasing program; a thermal analysis step of performing thermal analysis on the sample; a molecule ionization step of ionizing component molecules contained in gas evolved from the sample due to the temperature increase; and a molecular structure analysis step of dissociating any selected for out of molecular ions obtained in the molecule ionization step to generate fragment ions conesponding to structural factors of the molecule, and analyzing the structure of the molecule on the basis of the fragment ions, wherein the thermal analysis step, the molecule ionization step and the molecular structure analysis step are executed in parallel to the temperature increasing step.

2 . The method for analysis of a sample according to claim 1 , wherein the thermal analysis step is executed on the sample disposed in a sample chamber, the gas evolved from the sample due to the temperature increase is fed into an analysis chamber by a skimmer-type gas introducing interface, and the molecule ionization step and the molecular structure analysis step are executed in the analysis chamber.

3 . The method for analysis of a sample according to claim 1 , wherein the molecule ionization step and the molecular structure analysis step are executed by using an ion trap mass spectrometry instrument, and in the molecular structure analysis step, any selected ion out of molecular ions obtained in the molecule ionization step is captured, the captured ion is dissociated to generate fragment ions corresponding to the structural factors of the molecule, and the structure of the molecule is analyzed on the basis of the fragment ions.

4 . The method for analysis of a sample according to claim 3 , wherein in the molecule ionization step, component molecules contained in the gas evolved from the sample are irradiated with light to ionize the molecules.

5 . The method for analysis of a sample according to claim 1 , wherein the thermal analysis data obtained in the theimal analysis step and the data obtained in the molecular structure analysis step are displayed on the same graph with the temperature set as a common variable.

6 . The method for analysis of a sample according to claim 5 , wherein in the thermal analysis step, a mass variation caused by the temperature increase of the sample is analyzed and displayed on a graph, and with respect to the data obtained in the molecular structure analysis step, thermograms of the respective generated fragment ions are displayed on the same graph as the mass variation.

7 . A sample analysis apparatus for performing the sample analysis method according to claim 2 , comprising:
a sample chamber in which a sample is disposed; a thermal analyzer that increases the temperature of the sample disposed in the sample chamber according to a predetermined temperature increasing program, and performs thermal analysis on the sample; a skimmer-type gas introducing interface that feeds, to an analysis chamber, gas evolved from the sample disposed in the sample chamber due to the temperature increase; a gas analyzer that ionizes component molecules contained in the gas fed to the analysis chamber, dissociates any selected ion out of molecular ions obtained by the ionization to generate fragment ions, and analyzes the structure of the molecule on the basis of the fragment ions; and a control/processing device that controls the thermal analyzer and the gas analyzer to execute the thermal analysis step, the molecule ionization step and the molecular structure analysis step in parallel to the temperature increasing step, and processes thermal analysis data obtained by the thennal analyzer and gas analysis data obtained by the gas analyzer.

8 . The sample analysis apparatus according to claim 7 , wherein an ion trap mass spectrometry instrument is applied as the gas analyzer, and the gas analyzer is configured so as to ionize the component molecules contained in the gas fed to the analysis chamber, capture any selected ion out of the molecular ions obtained by the ionization, dissociate the captured ion to generate fragment ions, and analyze the structure of the molecule on the basis of the fragment ions.

9 . The sample analysis apparatus according to claim 8 , wherein the gas analyzer irradiates the component molecules contained in the gas evolved from the sample with light to ionize the molecules.

10 . The sample analysis apparatus according to claim 7 , wherein the control/processing device displays thermal analysis data obtained by the thermal analyzer and gas analysis data obtained by the gas analyzer on the same graph with the temperature set as a common variable, and outputs the thermal analysis data and the gas analysis data.

11 . The sample analysis apparatus according to claim 10 , wherein the thermal analyzer is configured to analyze a mass variation caused by temperature increase of the sample, and the control/processing device displays, on the graph, the mass variation caused by the temperature increase of the sample as the thermal analysis data, and displays, on the same graph as the mass variation, thermograms of the respective generated fragment ions with respect to the gas analysis data obtained by the gas analyzer.

Assignees

• Rigaku Denki Co Ltd

Inventors

• Arii Tadashi
• Matsushima Koichi
• Otake Satoshi

Classifications

• H01J49/161

  using photoionisation, e.g. by laser · CPC title

• H01J49/0059 Primary

  by a photon beam, photo-dissociation · CPC title

• G01N25/20

  by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity (calorimeters per se G01K) · CPC title

• H01J49/0081 Primary

  Tandem in time, i.e. using a single spectrometer · CPC title

• H01J49/004

  Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn · CPC title