Active real-time characterization system
US-2016119557-A1 · Apr 28, 2016 · US
US2016187262A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016187262-A1 |
| Application number | US-201514746427-A |
| Country | US |
| Kind code | A1 |
| Filing date | Jun 22, 2015 |
| Priority date | Dec 29, 2014 |
| Publication date | Jun 30, 2016 |
| Grant date | — |
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An inspection device of a display device includes a first illumination unit providing a first incident light to the display device at a first incident angle, a second illumination unit providing a second incident light to the display device at a second incident angle, a third illumination unit providing a third incident light to the display device at a third incident angle, and a defect detector receiving at least one of a first reflection light obtained from the first incident light reflected by the display device at a first reflection angle, a second reflection light obtained from the second incident light reflected by the display device at a second reflection angle, and a third reflection light obtained from the third incident light reflected by the display device at a third reflection angle to detect defects of the display device.
Opening claim text (preview).
What is claimed is: 1 . An inspection device of a display device, which comprises a display panel and a protective film disposed on the display panel, comprising: a first illumination unit providing a first incident light to the display device at a first incident angle; a second illumination unit providing a second incident light to the display device at a second incident angle greater than the first incident angle; a third illumination unit providing a third incident light to the display device at a third incident angle greater than the second incident angle; and a defect detector receiving at least one of a first reflection light obtained from the first incident light reflected by the display device at a first reflection angle, a second reflection light obtained from the second incident light reflected by the display device at a second reflection angle, and a third reflection light obtained from the third incident light reflected by the display device at a third reflection angle to detect defects of the display device. 2 . The inspection device of claim 1 , wherein the first illumination unit comprises: a first light source providing the first incident light to the display device; and a first polarization plate disposed between the first light source and the display device, and the first polarization plate is a linear polarization plate, a circular polarization plate, or an elliptical polarization plate. 3 . The inspection device of claim 2 , wherein the first illumination unit further comprises a band pass filter disposed between the first light source and the display device. 4 . The inspection device of claim 1 , wherein the second illumination unit comprises: a second light source providing the second incident light to the display device; and a second polarization plate disposed between the second light source and the display device, and the second polarization plate is a linear polarization plate, a circular polarization plate, or an elliptical polarization plate. 5 . The inspection device of claim 1 , wherein the third illumination unit comprises: a third light source providing the third incident light to the display device; and a third polarization plate disposed between the third light source and the display device, and the third polarization plate is a linear polarization plate, a circular polarization plate, or an elliptical polarization plate. 6 . The inspection device of claim 1 , wherein the first illumination unit comprises a first polarization plate, the second illumination unit comprises a second polarization plate, the third illumination unit comprises a third polarization plate, the first polarization plate polarizes the same light components as the second polarization plate, and the first polarization plate polarizes light components different from the third polarization plate. 7 . The inspection device of claim 1 , wherein the defect detector comprises: a photographing unit receiving at least one of the first reflection light, the second reflection light, and the third reflection light to take a picture of the display device; and a controller receiving a display device image from the photographing unit to detect the defects of the display device. 8 . The inspection device of claim 7 , wherein the photographing unit comprises: a camera taking the picture of the display device; and a fourth polarization plate disposed between the camera and the display device. 9 . The inspection device of claim 8 , wherein the camera comprises at least one of a charge coupled device camera and a complementary metal oxide semiconductor camera. 10 . The inspection device of claim 8 , wherein the fourth polarization plate is a linear polarization plate, a circular polarization plate, or an elliptical polarization plate. 11 . The inspection device of claim 7 , wherein the first illumination unit comprises a first polarization plate, the second illumination unit comprises a second polarization plate, the third illumination unit comprises a third polarization plate, the photographing unit comprises a fourth polarization plate, the first polarization plate polarizes the same light components as the second polarization plate, the third polarization plate polarizes the same light components as the fourth polarization plate, and the first polarization plate polarizes light components different from the third polarization plate. 12 . The inspection device of claim 1 , wherein the first incident angle is in a range from about 0° to about 5°, the second incident angle is in a range from about 10° to about 20°, and the third incident angle is in a range from about 30° to about 50°. 13 . An inspection method of a display device, which comprises a display panel and a protective film disposed on the display panel, comprising: providing a first incident light to the display device at a first incident angle; providing a second incident light to the display device at a second incident angle greater than the first incident angle; providing a third incident light to the display device at a third incident angle greater than the second incident angle; and receiving at least one of a first reflection light obtained from the first incident light reflected by the display device at a first reflection angle, a second reflection light obtained from the second incident light reflected by the display device at a second reflection angle, and a third reflection light obtained from the third incident light reflected by the display device at a third reflection angle to detect defects of the display device. 14 . The inspection method of claim 13 , wherein the providing of the first incident light comprises: disposing a first light source to provide the first incident light; and disposing a first polarization plate between the first light source and the display device. 15 . The inspection method of claim 14 , wherein the providing of the first incident light further comprises disposing a band pass filter between the first light source and the display device. 16 . The inspection method of 13 , wherein the providing of the second incident light comprises: disposing a second light source to provide the second incident light; and disposing a second polarization plate between the second light source and the display device. 17 . The inspection method of claim 13 , wherein the providing of the third incident light comprises: disposing a third light source to provide the third incident light; and disposing a third polarization plate between the third light source and the display device. 18 . The inspection method of claim 13 , wherein the detecting of the defects of the display device comprises: receiving at least one of the first reflection light, the second reflection light, and the third reflection light to take a picture of the display device and to provide a display device image; and receiving the display device image to detect the defects of the display device. 19 . The inspection method of claim 18 , wherein the providing of the display device image comprises: receiving the first reflection light to take the picture of the display device and to provide a first display device image; receiving the second reflection light to take the picture of the display device and to provide a second display device image; and receiving the third reflection light to take the picture of the display device and to provide a third display device image. 20 . The inspection method of claim 18 , w
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