Mid-infrared avalanche photodiodes with low dark currents
US-2024170601-A1 · May 23, 2024 · US
US2016149060A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016149060-A1 |
| Application number | US-201414900094-A |
| Country | US |
| Kind code | A1 |
| Filing date | Jun 19, 2014 |
| Priority date | Jun 19, 2013 |
| Publication date | May 26, 2016 |
| Grant date | — |
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A photovoltaic device having an active region comprising a III-V material including Bismuth and one or more other group V elements, the band gap energy of the material is in the range of from 0.4 to 1.4 eV and the spin-orbit splitting energy of the material is in the range of from 0.3 to 0.8 eV.
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1 . A photovoltaic device comprising: having an active region comprising a III-V material including Bismuth and one or more other group V elements, a band gap energy of the material being in a range of from 0.4 to 1.4 eV and a spin-orbit splitting energy of the material being in a range of from 0.3 to 0.8 eV. 2 . The photovoltaic device according to claim 1 , wherein the III-V material includes Ga and As. 3 . The photovoltaic device according to claim 1 , wherein a percentage of atoms of Bismuth to atoms of the other group V elements in the material is less than 11.5%. 4 . The photovoltaic device according to claim 1 , wherein the III-V material comprises a Ga—As—Bi based material, having a formula: GaAs 1−x Bi x , wherein 0≦x≦0.15. 5 . The photovoltaic device according to claim 4 , wherein the band gap energy of the active material is in a range of from approximately 1 to 1.1 eV and the spin-orbit splitting energy of the material is in a range of from 0.6 to 0.7 eV, and 0.05≦x≦0.07. 6 . The photovoltaic device according to claim 1 , wherein the III-V material comprises a GaAsBiN based material. 7 . The photovoltaic device according to claim 6 , wherein the band gap energy of the active material is in a range of from approximately 0.8 to 1.4 eV and the spin-orbit splitting energy of the material is in a range of from 0.3 to 0.8 eV. 8 . The photovoltaic device according to claim 6 , wherein the GaAsBiN based material includes less than 10% Bi and less than 6% Ni based on the amount of As. 9 . The photovoltaic device according to claim 4 , wherein the III-V material is grown on a GaAs substrate or a Ge substrate. 10 . The photovoltaic device according to claim 1 , wherein the III-V material comprises a GaInAsBi based material. 11 . The photovoltaic device according to claim 10 , wherein the GaInAsBi based material includes less than 5% Bi and In ranging from 30 to 60% based on the amount of As. 12 . The photovoltaic device according to claim 10 , wherein the GaInAsBi based material is grown on a InP substrate. 13 . A photovoltaic device comprising: an active region comprising a III-V material including Antimony and one or more other group V elements, a band gap energy of the material being in a range of from 0.4 to 1.4 eV and a spin-orbit splitting energy of the material being in a range of from 0.3 to 0.8 eV. 14 . The photovoltaic device according to claim 13 , wherein a percentage of atoms of Antimony to atoms of the other group V elements in the material is less than 25%, and wherein the III-V material includes Ga and As. 15 . The photovoltaic device according to claim 13 , wherein the III-V material forms the active region of a single junction cell or one junction of a multijunction cell. 16 . A light receiving semiconductor device comprising: an active region comprising a III-V material including Bismuth and one or more other group V elements, such that the a spin-orbit splitting energy of the material being within 10% of a band gap energy of the material. 17 . The light receiving semiconductor device according to claim 16 , wherein a percentage of atoms of Bismuth to atoms of the other group V elements in the material is less than 11.5%. 18 . The light receiving semiconductor device according to claim 16 , wherein the III-V material includes Ga and As. 19 . The light receiving semiconductor device according to claim 16 , wherein the spin-orbit splitting energy of the material is within 10% of the band gap energy of the material. 20 . The light receiving semiconductor device according to claim 16 , wherein the spin-orbit splitting energy of the material is substantially equal to the band gap energy of the material. 21 . The light receiving semiconductor device according to claim 16 , wherein the spin-orbit splitting energy is in a range of from 0.3 to 1.0 eV. 22 . The light receiving semiconductor device according to claim 16 , wherein the III-V material comprises a Ga—As—Bi based material, having a formula of GaAs 1−x Bi x , wherein the spin-orbit splitting energy of the material is in a range of from 0.7 to 0.9 eV, and 0.09≦x≦0.11. 23 . The light receiving semiconductor device according to claim 16 , wherein the III-V material comprises a GaAsBiN based material. 24 . The light receiving semiconductor device according to claim 23 , wherein the band gap energy of the active material is in a range of from approximately 0.3 to 0.9 eV, and the GaAsBiN based material includes 3 to 10% Bi and less than 6% Ni based on an amount of As. 25 . The light receiving semiconductor device according to claim 16 , wherein the III-V material is grown on a GaAs substrate or a Ge substrate. 26 . The light receiving semiconductor device according to claim 16 , wherein the III-V material comprises a GaInAsBi based material. 27 . The light receiving semiconductor device according to claim 26 , wherein the GaInAsBi based material includes 2 to 4% Bi and In ranging from 51 to 55% based on the amount of As, and having a spin-orbit splitting energy in a range of from 0.5 to 0.6 eV. 28 . The light receiving semiconductor device according to claim 26 , wherein the GaInAsBi based material is grown on a InP substrate. 29 . A light receiving semiconductor device comprising: an active region comprising a III-V material including Antimony and one or more other group V elements, such that the a spin-orbit splitting energy of the material being within 10% of a band gap energy of the material, optionally within 5% of the band gap energy of the material. 30 . The light receiving semiconductor device according to claim 29 , wherein a percentage of atoms of Antimony to atoms of the other group V elements in the material is less than 25%, and wherein the III-V material includes Ga and As. 31 . A light receiving semiconductor device having an active region comprising a III-V material including Bismuth and one or more other group V elements, an amount of Bismuth being controlled to produce a band gap energy of the material appropriate for absorbing light at a first wavelength and to produce a spin-orbit splitting energy of the material capable of absorbing light at a second wavelength. 32 . A method of manufacturing a light receiving semiconductor device arranged to absorb light at a first wavelength and a second wavelength, the method comprising: providing an active layer comprising a III-V material including Bismuth and one or more other group V elements; and controlling an amount of Bismuth in the III-V material to produce a band gap energy of the material appropriate for absorbing light at a first wavelength and to produce a spin-orbit splitting energy of the material capable of absorbing light at a second wavelength. 33 . A light receiving semiconductor device having an active region comprising a III-V material including Antimony and one or more other group V elements, an amount of Antimony being controlled to produce a band gap energy of the material appropriate for absorbing light at a first wavelength and to produce a spin-orbit splitting energy of the material capable of absorbing light at a second wavelength. 34 . A method of manufacturing a light receiving semiconductor device arranged to absorb light at a first wavelength
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