Method and Apparatus for Manipulating Near Field Using Light Scattering

Patent metadata

Field	Value
Publication number	US-2016146731-A1
Application number	US-201615009608-A
Country	US
Kind code	A1
Filing date	Jan 28, 2016
Priority date	Jun 26, 2013
Publication date	May 26, 2016
Grant date	—

Abstract

An apparatus for manipulating surface near-field light resulting from light emitted from a light source that passes through a scattering layer is disclosed. Also, a method of finding a phase of incident light to cause constructive interference at a target spot using light scattering to manipulate the surface near-field.

First claim

What is claimed is:

1 . A near-field imaging apparatus comprising:
a light source to output a plane wave; a scattering layer on which a sample to be imaged is disposed; a measuring unit to acquire speckle information on a speckle generated by the plane wave passing through the sample and the scattering layer; and an analysis unit to analyze the speckle information.

2 . The near-field imaging apparatus of claim 1 , wherein the measuring unit comprises a holographic measuring unit to acquire a phase of the speckle.

3 . The near-field imaging apparatus of claim 1 , wherein the analysis unit calculates correlation between the speckle information and speckle information per input basis about the scattering layer measured in advance and acquires an image of the sample using the correlation.

4 . The near-field imaging apparatus of claim 1 , further comprising a structure to pass light from a coherent light source to form light of an input basis.

5 . The near-field imaging apparatus of claim 4 , wherein the structure comprises at least one of a near-field scanning optical microscope (NSOM) tip, a metallic probe and a plasmonic metastructure.

6 . The near-field imaging apparatus of claim 4 , wherein the scattering layer passes the light of the input basis, formed by passing through the structure, to be scattered in the absence of the sample, and the measuring unit acquires input basis speckle information on a speckle generated by the scattered light.

7 . A method of realizing near-field imaging, the method comprising:
acquiring first speckle information on a speckle generated by light from a coherent light source passing through a scattering layer; acquiring second speckle information on a speckle generated by a plane wave passing through a sample and the scattering layer; and acquiring an image of the sample using the first speckle information and the second speckle information.

8 . The method of claim 7 , wherein the acquiring of the first speckle information comprises forming light of an input basis by passing the light from the coherent light source through a structure, passing the light of the input basis through the scattering layer to be scattered, and acquiring input basis speckle information on a speckle generated by the scattered light.

9 . The method of claim 8 , wherein the acquiring of the first speckle information comprises acquiring a plurality of input basis speckle informations by conducting the forming of the light, the passing of the light and the acquiring of the input basis speckle information while changing a location on the scattering layer that the light of the input basis passes through, and acquiring the first speckle information using the plurality of input basis speckle informations.

10 . The method of claim 8 , wherein the structure comprises at least one of a near-field scanning optical microscope (NSOM) tip, a metallic probe and a plasmonic metastructure.

11 . The method of claim 7 , wherein the acquiring of the image of the sample using the first speckle information and the second speckle information comprises calculating correlation between the first speckle information and the second speckle information and acquiring the image of the sample using the correlation.

Assignees

• Korea Advanced Inst Sci & Tech

Inventors

• Park Yongkeun
• Park Jung-Hoon
• Cho Yong-Hoon
• Park Chunghyun

Classifications

• G01Q60/22

  Probes, their manufacture, or their related instrumentation, e.g. holders · CPC title

• G01Q60/18

  SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes · CPC title

• G01N21/49

  within a body or fluid · CPC title

• G01N21/4788 Primary

  Diffraction (for sizing particles G01N15/0205) · CPC title

• G01N21/45

  using interferometric methods; using Schlieren methods · CPC title