Method and apparatus for bit-line sensing gates on an sram cell
US-2015364183-A1 · Dec 17, 2015 · US
US2016141019A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016141019-A1 |
| Application number | US-201615007894-A |
| Country | US |
| Kind code | A1 |
| Filing date | Jan 27, 2016 |
| Priority date | Feb 28, 2014 |
| Publication date | May 19, 2016 |
| Grant date | — |
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A circuit includes a first data line, a second data line, a reference node, and a memory cell. The memory cell includes a data node, a first transistor, a second transistor, and a third transistor. The first transistor and the second transistor are connected in series between the first data line and the reference node. The first transistor is configured to be turned off when the gate of the first transistor has a voltage level corresponding to the first logical value. The third transistor is between the data node and the second data line. The third transistor is configured to be turned off when a gate of the third transistor has a voltage level corresponding to a second logical value different from the first logical value.
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What is claimed is: 1 . A circuit, comprising: a first data line; a second data line; a reference node configured to have a reference voltage level corresponding to a first logical value; and a memory cell, comprising: a data node; a first transistor and a second transistor connected in series between the first data line and the reference node, a gate of the first transistor being coupled to the data node, and the first transistor being configured to be turned off when…
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