Measuring device

Patent metadata

Field	Value
Publication number	US-12584952-B2
Application number	US-202118567394-A
Country	US
Kind code	B2
Filing date	Jun 14, 2021
Priority date	Jun 14, 2021
Publication date	Mar 24, 2026
Grant date	Mar 24, 2026

Abstract

This is an improvement of a measuring device, for example, it is possible to stably measure an electrical characteristic even when a component is small. In the present measuring device, at least one of a relative positional relationship between a main body and a loading stand for holding the component and a relative positional relationship between the main body and at least one of a pair of probes can be adjusted. Therefore, the component held on the loading stand can be more favorably gripped by the pair of probes, and the electrical characteristic can be stably measured even when the component is small.

First claim

The invention claimed is:

1 . A measuring device to be installed on a mounter for mounting a component supplied by a component supply device on a circuit board, the measuring device for measuring an electrical characteristic of the component, the measuring device comprising:
a main body; a loading stand provided on the main body and including a groove section on which the component is loaded; a pair of probes provided in the main body and configured to approach and separate from each other, the pair of probes including a fixed element and a movable element that approaches and separates from the fixed element in an approaching and separating direction to grip the component loaded on the groove section and to measure the electrical characteristic of the component; and an adjustment mechanism configured to adjust a relative positional relationship between the loading stand and the movable element, the adjustment mechanism including a second adjustment mechanism configured to adjust a relative inclination of the movable element with respect to the main body around an axis extending in a direction parallel to the approaching and separating direction or an axis extending in a direction intersecting the approaching and separating direction, wherein the second adjustment mechanism includes
a second pivoting member that is pivotable around the axis integrally with the movable element,
a second holding member configured to hold the second pivoting member so as to be relatively pivotable around the axis, and
a second fixing device configured to fix the second pivoting member to the second holding member.

2 . The measuring device according to claim 1 , wherein
the adjustment mechanism adjusts at least one of a relative positional relationship between at least one of the pair of probes and the main body and a relative positional relationship between the loading stand and the main body.

3 . The measuring device according to claim 1 , wherein
the groove section extends in the approaching and separating direction, and the adjustment mechanism adjusts a relative positional relationship between at least one of the pair of probes and the groove section of the loading stand.

4 . The measuring device according to claim 1 , wherein
the adjustment mechanism adjusts at least one of a relative position in a direction intersecting an approaching and separating direction which is a direction of the approaching and separating, between the movable element and the loading stand, a relative inclination around an axis parallel to the approaching and separating direction, and a relative inclination around an axis intersecting the approaching and separating direction.

5 . The measuring device according to claim 4 , wherein
the movable element is provided on the main body via a movable element holding body so as to be movable in the approaching and separating direction which is the direction of the approaching and separating, and the adjustment mechanism is provided on the movable element holding body and adjusts a relative positional relationship of the movable element with respect to the main body.

6 . The measuring device according to claim 1 , wherein
the adjustment mechanism includes a first adjustment mechanism configured to adjust a relative position of the movable element with respect to the main body in a first direction which is a direction intersecting the approaching and separating direction, and the first adjustment mechanism includes
a first movable member movable in the first direction integrally with the movable element,
a first holding member configured to hold the first movable member so as to be relatively movable in the first direction, and
a first fixing device configured to fix the first movable member to the first holding member.

Assignees

• Fuji Corp

Inventors

• Sawada Toshiyuki

Classifications

• H05K13/082 Primary

  Integration of non-optical monitoring devices, i.e. using non-optical inspection means, e.g. electrical means, mechanical means or X-rays · CPC title

• G01R31/28

  Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits G01R31/002;} testing for short-circuits, discontinuities, leakage or incorrect line connection G01R31/50; checking computers {or computer components} G06F11/00; checking static stores for correct operation G11C29/00 {; testing receivers or transmitters of transmission systems H04B17/00}) · CPC title

• G01R31/26

  Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment {H10P74/00}) · CPC title

• G01R31/2601 Primary

  Apparatus or methods therefor (G01R31/2607, G01R31/2642 take precedence) · CPC title