Testing machine and operation method thereof

Patent metadata

Field	Value
Publication number	US-9958477-B2
Application number	US-201615064607-A
Country	US
Kind code	B2
Filing date	Mar 9, 2016
Priority date	Mar 11, 2015
Publication date	May 1, 2018
Grant date	May 1, 2018

Abstract

A test machine includes a base, a testing platform, a probe platform, a control lever, a temporary positioning mechanism and a damper. The testing platform connects with the base and carries a device under test. The probe platform connects with the base and moves along a longitudinal direction. The probe platform connects with a probe. The control lever connects with the base and the probe platform which is driven by the control lever to move along the longitudinal direction. The temporary positioning mechanism connects with the control lever and temporarily holds the probe platform and the control lever at a specific position. The damper connects with the base. When a distance between the probe and the DUT is shorter than a buffering distance, the damper abuts against the control lever or the probe platform to reduce a velocity of the probe moving towards the DUT.

First claim

What is claimed is:

1. A testing machine comprising:
a base;
a testing platform connected with the base, the testing platform being configured to carry a device under test;
a probe platform connected with the base, the probe platform being able to move along a longitudinal direction relative to the testing platform, and the probe platform being configured to connect with at least one probe corresponding to the device under test;
a control lever connected with the base and the probe platform, through operating the control lever, the probe platform being driven by the control lever to move along the longitudinal direction relative to the testing platform;
a temporary positioning mechanism connected with the control lever, the temporary positioning mechanism being configured to temporarily hold the probe platform and the control lever at a specific position; and
a damper connected with the base, wherein when a distance between the probe and the device under test along the longitudinal direction is shorter than a buffering distance, the damper at least partially abuts against the control lever or the probe platform, so as to reduce a velocity of the probe moving towards the device under test;
wherein the buffering distance is a distance between a first point that the probe starts to decelerate since the damper at least partially abuts against the control lever and a second point that the probe touches the device under test.

2. The testing machine of claim 1 , wherein the damper includes:
a fixing portion connected with the base; and
a moving portion slidably connected with the fixing portion, wherein when the probe platform and the control lever leave the specific position and the distance between the probe and the device under test along the longitudinal direction is shorter than the buffering distance, the moving portion at least partially abuts against the control lever.

3. The testing machine of claim 2 , wherein the damper comprises:
an elastic element connected with the fixing portion and the moving portion, wherein when the moving portion abuts against the control lever, the elastic element is compressed to shorten.

4. The testing machine of claim 3 , wherein a sum of a first moment of a self-weight of the probe platform exerting on the control lever and a second moment of a self-weight of the control lever, is larger than a third moment of the elastic element exerting on the control lever when compressed, such that the probe platform keeps moving towards the testing platform along the longitudinal direction after an operation of the control lever stops.

5. The testing machine of claim 1 , wherein the damper is a one-way damper.

6. The testing machine of claim 1 , further comprising:
a planar moving mechanism configured to drive the testing platform to move along a plane relative to the base, the plane and the longitudinal direction are substantially orthogonal.

7. The testing machine of claim 1 , wherein the temporary positioning mechanism comprises:
a shaft connected with the control lever;
a rotating disc connected with the shaft, the rotating disc has at least one recessed portion; and
a pinball structure connected with the base, and a position of the pinball structure corresponds with the recessed portion, so as to temporarily hold a relative position between the rotating disc and the pinball structure.

8. The testing machine of claim 7 , wherein the pinball structure comprises:
a pinball;
a casing connected with the base; and
an elastic element connected with the pinball and the casing, the pinball at least partially protrudes from the casing, and a position of the pinball corresponds with the recessed portion.

9. The testing machine of claim 1 , wherein when the distance is shorter than the buffering distance, the closer the probe moves to the device under test, the slower the moving velocity of the probe.

10. An operating method of a testing machine, the operating method comprising:
holding temporarily a probe platform and a control lever at a specific position by a temporary positioning mechanism;
operating the control lever with a force to move the probe platform towards a testing platform along a longitudinal direction;
stopping operating the control lever with the force when the probe platform and the control lever leave the specific position, such that the probe platform moves towards the testing platform according to a self-weight of the probe platform and a self-weight of the control lever; and
abutting the control lever with a damper after the probe platform and the control lever leave the specific position and when a distance between a probe disposed on the probe platform and a device under test along the longitudinal direction is shorter than a buffering distance, such that the probe platform and the control lever compress the damper, so as to reduce the velocity of the probe moving towards the device under test, wherein the buffer distance is a distance between a first point that the probe starts to decelerate since the damper at least partially abuts against the control lever and a second point that the probe touches the device under test.

11. The operation method of claim 10 , further comprises:
operating the control lever to move the control lever away from the damper; and
restoring the compressed damper.

12. An operating method of a testing machine, the operating method comprising:
holding temporarily a probe platform at a specific position by a temporary positioning mechanism;
operating a control lever to move the probe platform towards a testing platform along a longitudinal direction; and
compressing a damper when a distance between a probe disposed on the probe platform and a device under test along the longitudinal direction is shorter than a buffering distance so as to reduce the velocity of the probe moving towards the device under test, wherein the buffering distance is a distance between a first point that the probe starts to decelerate since the damper at least partially abuts against the control lever and a second point that the probe touches the device under test.

13. The operation method of claim 12 , wherein when the distance is shorter than the buffering distance, the closer the probe moves to the device under test, the slower the moving velocity of the probe.

14. The operation method of claim 13 , wherein when the probe contacts the device under test, the moving velocity of the probe is substantially equal to zero.

Assignees

• Mpi Corp

Inventors

• Hsu Yu-Hsun
• Lim Ban-Ban

Classifications

• G01R31/2635

  Testing light-emitting diodes, laser diodes or photodiodes · CPC title

• G01R31/2601

  Apparatus or methods therefor (G01R31/2607, G01R31/2642 take precedence) · CPC title

• G01R1/06705 Primary

  Apparatus for holding or moving single probes (for moving multiple probe heads or ICs under test G01R31/2886) · CPC title