Concentrated solar irradiation of targets in plasmas

US12573587B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12573587-B2
Application numberUS-202318139999-A
CountryUS
Kind codeB2
Filing dateApr 27, 2023
Priority dateApr 27, 2023
Publication dateMar 10, 2026
Grant dateMar 10, 2026

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

An apparatus for thermal ablation testing is provided. The apparatus comprises a chamber; an optically transparent window in the chamber; a sample holder inside the chamber; a test sample in the sample holder; a number of bare-wire thermocouples connected to the test sample, wherein the thermocouples generate temperature data in the form of voltage; a mass balance inside the chamber, wherein the mass balance is configured to hold the sample holder and dynamically detect changes in mass of the test sample; an external radiant heat source configured to heat the test sample through the window; a plasma source configured to generate a number of atomic species in the chamber; and a pyrometer directed at the test sample.

First claim

Opening claim text (preview).

What is claimed is: 1 . An apparatus for thermal ablation testing, the apparatus comprising: a chamber; an optically transparent window in the chamber; a sample holder inside the chamber; a test sample in the sample holder; a number of bare-wire thermocouples connected to the test sample, wherein the thermocouples generate temperature data in the form of voltage; a mass balance inside the chamber, wherein the mass balance is configured to hold the sample holder and dynamically detect changes in mass of the test sample; an external radiant heat source configured to heat the test sample through the window; a plasma source configured to generate a number of atomic species in the chamber; and a pyrometer directed at the test sample. 2 . The apparatus of claim 1 , further comprising an external parabolic dish positioned to direct energy from the radiant heat source through the window into the chamber. 3 . The apparatus of claim 1 , further comprising a water-cooled heat shield within the chamber between the test sample and radiant heat source, wherein the heat shield comprises an aperture through which the test sample is exposed to the radiant heat source. 4 . The apparatus of claim 1 , wherein the radiant heat source generates a heat flux of 50 to 6000 kW/m 2 . 5 . The apparatus of claim 1 , wherein the test sample comprises a number of through-holes having a diameter of 0.003 inch or greater through which the bare-wire thermocouples pass. 6 . The apparatus of claim 1 , wherein the chamber is a vacuum chamber with an internal pressure of two Torr or lower. 7 . The apparatus of claim 1 , wherein the chamber is a pressurized chamber. 8 . The apparatus of claim 7 , wherein the chamber is pressurized with an inert gas or air. 9 . The apparatus of claim 1 , wherein the chamber is purged with an inert gas. 10 . The apparatus of claim 1 , wherein the sample holder comprises a clamshell holder or sting-mounted holder. 11 . The apparatus of claim 1 , wherein the optically transparent window comprises quartz or sapphire. 12 . The apparatus of claim 1 , wherein the plasma source is a radio frequency plasma generator.

Assignees

Inventors

Classifications

  • Investigating or analyzing materials by the use of thermal means (G01N3/00 - G01N23/00 take precedence) · CPC title

  • Shields · CPC title

  • Cooling arrangements · CPC title

  • Other variables, e.g. energy, mass, velocity, time, temperature · CPC title

  • Heating devices using lamps · CPC title

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What does patent US12573587B2 cover?
An apparatus for thermal ablation testing is provided. The apparatus comprises a chamber; an optically transparent window in the chamber; a sample holder inside the chamber; a test sample in the sample holder; a number of bare-wire thermocouples connected to the test sample, wherein the thermocouples generate temperature data in the form of voltage; a mass balance inside the chamber, wherein th…
Who is the assignee on this patent?
Nat Tech & Eng Solutions Sandia Llc
What technology area does this patent fall under?
Primary CPC classification H01J37/32082. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Mar 10 2026 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).