Fabrication of electrochromic devices

Patent metadata

Field	Value
Publication number	US-12572047-B2
Application number	US-202318303815-A
Country	US
Kind code	B2
Filing date	Apr 20, 2023
Priority date	Feb 8, 2013
Publication date	Mar 10, 2026
Grant date	Mar 10, 2026

Abstract

Electrochromic devices and methods may employ the addition of a defect-mitigating insulating layer which prevents electronically conducting layers and/or electrochromically active layers from contacting layers of the opposite polarity and creating a short circuit in regions where defects form. In some embodiments, an encapsulating layer is provided to encapsulate particles and prevent them from ejecting from the device stack and risking a short circuit when subsequent layers are deposited. The insulating layer may have an electronic resistivity of between about 1 and 108 Ohm-cm. In some embodiments, the insulating layer contains one or more of the following metal oxides: aluminum oxide, zinc oxide, tin oxide, silicon aluminum oxide, cerium oxide, tungsten oxide, nickel tungsten oxide, and oxidized indium tin oxide. Carbides, nitrides, oxynitrides, and oxycarbides may also be used.

First claim

What is claimed is:

1 . A method of fabricating an electrochromic device, the method comprising:
forming an electrochromic stack over a first electrode layer disposed on a substrate and forming a second electrode layer over the electrochromic stack, wherein the electrochromic stack comprises an electrochromic layer of electrochromic material and a counter electrode layer of counter electrode material, and wherein the first electrode layer comprises a first transparent electronically conductive material and the second electrode layer comprises a second transparent electronically conductive material; and depositing a defect-mitigating insulating layer to seal a pop-off defect in the electrochromic device; wherein the defect-mitigating insulating layer comprises a metal oxide, a metal nitride; a metal carbide; a metal oxynitride; a metal oxycarbide, or any combination thereof, and wherein the metal oxide is selected from the group consisting of aluminum oxide, titanium oxide, tantalum oxide, cerium oxide, zinc oxide, tin oxide, tungsten oxide, oxidized indium tin oxide, and nickel tungsten oxide, wherein the defect-mitigating insulating layer is deposited in a first process operation after execution of a second process operation that has a propensity to cause ejection of particles from the electrochromic stack, and wherein the second process operation comprises introducing lithium into the electrochromic stack.

2 . The method of claim 1 , wherein the metal nitride is selected from the group consisting of titanium nitride, aluminum nitride, silicon nitride, tungsten nitride.

3 . The method of claim 1 , wherein the metal carbide is selected from the group consisting of titanium carbide, aluminum carbide, silicon carbide, tantalum carbide, and tungsten carbide.

4 . The method of claim 1 , wherein the metal oxynitride comprises silicon oxynitride.

5 . The method of claim 1 , wherein the defect-mitigating insulating layer is between about 5 nm and 500 nm thick.

6 . The method of claim 1 , wherein the defect-mitigating insulating layer is between about 10 nm and 100 nm thick.

7 . The method of claim 1 , wherein the defect-mitigating insulating layer is deposited within, beneath, or on the electrochromic stack.

8 . The method of claim 1 , wherein the defect-mitigating insulating layer is ionically conductive, and further comprising a second defect-mitigating insulating layer, wherein the second defect-mitigating insulating layer is deposited beneath or in the electrochromic stack.

9 . The method of claim 1 , wherein depositing the defect-mitigating insulating layer prevents electronically conducting layers and/or electrochromically active layers of the electrochromic device from contacting layers of an opposite polarity and creating a short circuit in a region of the pop-off defect.

10 . The method of claim 1 , wherein the lithium comprises lithium metal.

Assignees

• View Inc
• View Operating Corp

Inventors

• Rozbicki Robert Tad
• Kailasam Sridhar Karthik
• Friedman Robin Sean
• Gillaspie Dane Thomas
• Pradhan Anshu Ajit
• Mehtani Disha

Classifications

• H01J37/3476

  Testing and control · CPC title

• H01J37/3429

  Plural materials · CPC title

• G02F1/1309

  Repairing; Testing · CPC title

• C23C14/086

  of zinc, germanium, cadmium, indium, tin, thallium or bismuth · CPC title

• C23C14/083

  of refractory metals or yttrium · CPC title