Microelectromechanical system (MEMS) structure and method of formation
US-11953674-B2 · Apr 9, 2024 · US
US12497288B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12497288-B2 |
| Application number | US-202217843816-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 17, 2022 |
| Priority date | Sep 3, 2021 |
| Publication date | Dec 16, 2025 |
| Grant date | Dec 16, 2025 |
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Official abstract text for this publication.
In an example, a method of manufacturing a MEMS device includes forming a via. The method also includes depositing metal in the via and depositing a first layer of a non-photoactive organic polymer on the metal. The method includes baking the first layer of the non-photoactive organic polymer. The method also includes depositing a second layer of the non-photoactive organic polymer on the first layer of the non-photoactive organic polymer after baking the first layer of the non-photoactive organic polymer. The method includes baking the second layer of the non-photoactive organic polymer. The method also includes etching the first layer and the second layer of the non-photoactive organic polymer.
Opening claim text (preview).
What is claimed is: 1 . A method of manufacturing a microelectromechanical (MEMS) device, the method comprising: forming a via; depositing metal in the via; depositing a first layer of an organic polymer on the metal; baking the first layer of the organic polymer; depositing a second layer of the organic polymer on the first layer of the organic polymer after baking the first layer of the organic polymer; baking the second layer of the organic polymer; and etching the first layer and the second layer of the organic polymer. 2 . The method of claim 1 , wherein the organic polymer is a spin-on carbon. 3 . The method of claim 1 , wherein the organic polymer is a methacrylate polymer. 4 . The method of claim 1 , wherein etching the organic polymer includes performing a plasma etch. 5 . The method of claim 1 , further comprising: depositing a spacer material on the second layer of the organic polymer; creating one or more mirror vias in the spacer material; and depositing a mirror material on the spacer material. 6 . The method of claim 5 , further comprising: removing the spacer material, the first layer of the organic polymer, and the second layer of the organic polymer to release the MEMS device. 7 . The method of claim 1 , wherein the second layer of the organic polymer has a thickness between 1,000 and 10,000 Angstroms. 8 . The method of claim 1 , wherein the second layer of the organic polymer is baked between 175 and 185 degrees Celsius. 9 . The method of claim 1 , wherein etching the organic polymer includes exposing a portion of the metal in the via. 10 . The method of claim 1 , wherein the metal in the via forms a hinge for the MEMS device. 11 . The method of claim 1 , wherein the metal has a thickness between 100 and 1,000 Angstroms. 12 . A method, comprising: depositing a spacer material over a substrate; patterning the spacer material to form patterned spacer material; depositing a metal layer over the patterned spacer material; depositing an oxide film over the metal layer; etching a portion of the oxide film, wherein the oxide film remains at a sidewall and a bottom of the patterned spacer material; patterning the metal layer with a pattern; etching the pattern into the metal layer; depositing a first layer of an organic polymer over the metal layer; baking the first layer of the organic polymer; depositing a second layer of the organic polymer over the first layer of the organic polymer; baking the second layer of the organic polymer; and etching the organic polymer. 13 . The method of claim 12 , wherein the organic polymer is a spin-on carbon. 14 . The method of claim 12 , wherein the second layer of the organic polymer has a thickness between 1,000 and 10,000 Angstroms. 15 . The method of claim 12 , wherein patterning the spacer material includes creating a via in the spacer material. 16 . The method of claim 15 , wherein the via is between 0.3 and 6.0 micrometers deep. 17 . The method of claim 12 , wherein the metal layer is a hinge metal for a spatial light modulator. 18 . The method of claim 12 , wherein the metal layer is between 100 and 1000 Angstroms thick. 19 . The method of claim 12 , wherein the oxide film is between 1000 and 10,000 Angstroms thick. 20 . A method for manufacturing a phase light modulator, the method comprising: forming a via for a hinge of the phase light modulator (PLM); depositing metal in the via to form the hinge; depositing a first layer of an organic polymer over the hinge; baking the first layer of the organic polymer; depositing a second layer of the organic polymer on the first layer of the organic polymer after baking the first layer of the organic polymer; baking the second layer of the organic polymer; and etching the first layer and the second layer of the organic polymer to reveal a portion of the hinge of the PLM.
Plasma polymerization, i.e. monomer or polymer deposition · CPC title
for controlling the phase of light (G02B26/08 takes precedence {, measuring optical phase difference G01J9/00}) · CPC title
Micromirrors, not used as optical switches · CPC title
Dry etching, i.e. plasma etching, barrel etching, reactive ion etching [RIE], sputter etching or ion milling · CPC title
Diaphragms, membranes (manufacture process for semi-permeable inorganic membranes B01D67/0039) · CPC title
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