Optimized electrical impedance tomography

US12495985B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12495985-B2
Application numberUS-202218049551-A
CountryUS
Kind codeB2
Filing dateOct 25, 2022
Priority dateNov 28, 2018
Publication dateDec 16, 2025
Grant dateDec 16, 2025

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  1. Title

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Abstract

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The disclosed 2-D resistance tomographic imaging method optimizes computation speed for performing electrical impedance tomography using a model-space with a minimal number of orthonormal polynomial basis functions to describe discernable features in the 2-D resistance tomographic image, determining a minimal number of contacts to take fewer measurements than available information based on the number of basis functions, selecting a subset of rows of a matrix of calculated sensitivity coefficients to form a square Jacobian matrix for a linearized forward problem to be solved and inversion of the linear forward problem, and solving an inverse problem based on the square Jacobian matrix by performing at least one iteration of a Newton's method solve.

First claim

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We claim: 1 . A computer implemented method of electrical impedance tomography for preparing a tomographic image to map over a surface of an object, comprising: defining a surface area of a resistive sensing membrane having Q periphery contact electrodes attached along a periphery of the defined surface area of the resistive sensing membrane, wherein Q comprises an integer higher than or equal to five, wherein a plurality of local area resistances (r ABCD ) i to (r ABCD ) N that vary with an applied contact pressure over the defined surface area of the resistive sensing membrane cause a two-dimensional (2-D) resistance variation; mapping a 2-D resistance tomographic image over the defined surface area of the resistive sensing membrane according to the plurality of local area resistances of the applied contact pressure to the defined surface area of the resistive sensing membrane, wherein the 2-D resistance tomographic image mapping comprises: measuring the plurality of local area resistances (r ABCD ) i to (r ABCD ) N , wherein i=1 to N, and N represents a maximum number of independent tetra-polar measurements; determining a reference model to reduce computational steps to converge on a final 2-D resistance tomographic image; identifying a minimal number M 0 of model-space basis functions to describe features to be discerned in the 2-D resistance tomographic image; determining a minimal number of contacts C based on M 0 ; calculating sensitivity coefficients for a D MAX ×M 0 sensitivity matrix; selecting D 0 rows from the sensitivity matrix to form a Jacobian matrix for a linearized forward problem to be solved, where D 0 is an intended number of tetra-polar measurements to be performed, D I = C ⁡ ( C - 3 ) 2 , and ⁢ D 0 < D I , where D I is a number of independent measurements given a quantity of C contacts; determining a D 0 -dimensional sensitivity parallelotope volume in model-space based on the selected D 0 rows from the sensitivity matrix; solving an inverse problem based on the Jacobian matrix to generate the 2-D resistance tomographic image; and displaying the 2-D resistance tomographic image. 2 . The computer implemented method according to claim 1 , wherein determining the reference model comprises selecting a circular domain model-space with orthonormal polynomials as basis functions. 3 . The computer implemented method according to claim 1 , wherein determining the reference model comprises selecting a circular domain model-space with Zernike polynomial functions Z n k (r, θ) defined over a mesh as a priori conductivity basis functions described by the equations: Z n k ( r , θ ) = { F n k ⁢ R n ❘ "\[LeftBracketingBar]" k ❘ "\[RightBracketingBar]" ⁢ r ⁢ cos ⁡ ( k ⁢ θ ) for ⁢ ⁢ k ≥ 0 - F n k ⁢ R n | k | ⁢ r ⁢ sin ⁡ ( m ⁢ θ ) for ⁢   k < 0 , R n ❘ "\[LeftBracketingBar]" k ❘ "\[RightBracketingBar]" ( r

Assignees

Inventors

Classifications

  • Tomographic reconstruction from projections · CPC title

  • A61B5/0536Primary

    Impedance imaging, e.g. by tomography · CPC title

  • Physics · mapped topic

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What does patent US12495985B2 cover?
The disclosed 2-D resistance tomographic imaging method optimizes computation speed for performing electrical impedance tomography using a model-space with a minimal number of orthonormal polynomial basis functions to describe discernable features in the 2-D resistance tomographic image, determining a minimal number of contacts to take fewer measurements than available information based on the …
Who is the assignee on this patent?
Univ Northwestern
What technology area does this patent fall under?
Primary CPC classification A61B5/0536. Mapped technology areas include Human Necessities.
When was this patent published?
Publication date Tue Dec 16 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).