Diode assembly for pulsed fusion events

US12437883B1 · US · B1

Patent metadata
FieldValue
Publication numberUS-12437883-B1
Application numberUS-201916366178-A
CountryUS
Kind codeB1
Filing dateMar 27, 2019
Priority dateMar 27, 2019
Publication dateOct 7, 2025
Grant dateOct 7, 2025

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A diode assembly for producing a pulsed fusion event in a z-pinch driver. The diode assembly includes an inner core including a lithium compound formed of one or more lithium isotopes and one or more hydrogen isotopes. An electrically conducting outer sheath is disposed around the inner core. The electrically conducting outer sheath includes an electrical conductance that is at least three times greater than an electrical conductance of the lithium compound of the inner core.

First claim

Opening claim text (preview).

What is claimed is: 1. A diode assembly for producing a pulsed fusion event in a z-pinch driver, the diode assembly comprising: an inner core including a lithium compound formed of one or more lithium isotopes and one or more hydrogen isotopes; and an electrically conducting outer sheath compressed against the inner core and in a symmetrical relationship with the inner core, the electrically conducting outer sheath having an electrical conductance that is at least three times greater than an electrical conductance of the lithium compound of the inner core, and the electrically conducting outer sheath being selected from a group consisting of copper, aluminum, silver, tungsten, gold, zinc, calcium, and alloys thereof, wherein, when electrical current is supplied by the z-pinch driver, the electrically conducting outer sheath is dimensioned and configured to generate a plasma around the inner core, and, when a magnetic field is supplied by the z-pinch driver, the plasma is compressed against the inner core to produce the pulsed fusion event. 2. The diode assembly of claim 1 wherein the lithium compound of the inner core is selected from a group consisting of 6 LiD, 6 LiT, 7 LiD, and 7 LiT. 3. The diode assembly of claim 2 wherein the inner core consists of the lithium compound. 4. The diode assembly of claim 1 wherein the electrically conducting outer sheath is selected from a group consisting of silver, copper, and alloys thereof. 5. The diode assembly of claim 1 wherein the electrical conductance of the electrically conducting outer sheath is at least ten times greater than the electrical conductance of the lithium compound of the inner core. 6. The diode assembly of claim 1 wherein the symmetrical relationship is selected from the group consisting of: the inner core and electrically conducting outer sheath each being cylindrical such that the diode assembly is cylindrical, and the inner core and electrically conducting outer sheath each being a one-dimensional plate such that the diode assembly includes a layered plate arrangement. 7. The diode assembly of claim 1 further comprising a non-conducting polymer layer and a tamper layer, the non-conducting polymer layer disposed between the electrically conducting outer sheath and the tamper layer to electrically isolate the tamper layer from electrically conducting material of the diode assembly. 8. The diode assembly of claim 7 wherein the tamper layer is selected from a group consisting of uranium, platinum, tungsten, niobium, molybdenum, osmium, rhenium, and combinations thereof. 9. The diode assembly of claim 1 further comprising a tamper layer disposed around the electrically conducting outer sheath, the tamper layer including an electrical conductance less than the electrical conductance of the electrically conducting outer sheath. 10. The diode assembly of claim 9 wherein the tamper layer is selected from a group consisting of uranium, platinum, tungsten, niobium, molybdenum, osmium, rhenium, and combinations thereof. 11. The diode assembly of claim 9 wherein the tamper layer includes 238 U. 12. A diode assembly for producing a pulsed fusion event in a z-pinch driver, the diode assembly comprising: an inner core including a lithium compound formed of one or more lithium isotopes and one or more hydrogen isotopes, the lithium compound being selected from a group consisting of 6 LiD, 6 LiT, 7 LiD, and 7 LiT; and an electrically conducting outer sheath compressed against the inner core and in a symmetrical relationship with the inner core, the electrically conducting outer sheath having an electrical conductance that is at least three times greater than an electrical conductance of the lithium compound of the inner core, and the electrically conducting outer sheath is selected from a group consisting of copper, aluminum, silver, gold, and alloys thereof, wherein, when electrical current is supplied by the z-pinch driver, the electrically conducting outer sheath is dimensioned and configured to generate a plasma around the inner core, and, when a magnetic field is supplied by the z-pinch driver, the plasma is compressed against the inner core to produce the pulsed fusion event. 13. The diode assembly of claim 12 wherein the inner core consists of the lithium compound. 14. The diode assembly of claim 12 further comprising a non-conducting polymer layer and a tamper layer, the non-conducting polymer layer disposed between the electrically conducting outer sheath and the tamper layer to electrically isolate the tamper layer from electrically conducting material of the diode assembly. 15. The diode assembly of claim 14 wherein the tamper layer is selected from a group consisting of uranium, platinum, tungsten, niobium, molybdenum, osmium, rhenium, and combinations thereof. 16. The diode assembly of claim 12 further comprising a tamper layer disposed around the electrically conducting outer sheath, the tamper layer including an electrical conductance less than the electrical conductance of the electrically conducting outer sheath. 17. The diode assembly of claim 16 wherein the tamper layer is selected from a group consisting of uranium, platinum, tungsten, niobium, molybdenum, osmium, rhenium, and combinations thereof. 18. The diode assembly of claim 16 wherein the tamper layer includes 238 U. 19. A diode assembly for producing a pulsed fusion event in a z-pinch driver, the diode assembly comprising: an inner core including a lithium compound formed of one or more lithium isotopes and one or more hydrogen isotopes, the lithium compound being selected from a group consisting of 6 LiD, 6 LiT, 7LiD, and 7 LiT; an electrically conducting outer sheath compressed against the inner core and in a symmetrical relationship with the inner core, the electrically conducting outer sheath having an electrical conductance that is at least ten times greater than an electrical conductance of the lithium compound of the inner core; a non-conducting polymer layer disposed around the electrically conducting outer sheath; and a tamper layer disposed around the non-conducting polymer layer such that the tamper layer is electrically isolated from the electrically conducting outer sheath, the tamper layer including an electrical conductance less than the electrical conductance of the outer sheath, wherein, when electrical current is supplied by the z-pinch driver, the electrically conducting outer sheath is dimensioned and configured to generate a plasma around the inner core, and, when a magnetic field is supplied by the z-pinch driver, the plasma is compressed against the inner core to produce the pulsed fusion event. 20. The diode assembly of claim 19 wherein the inner core consists of the lithium compound. 21. The diode assembly of claim 19 wherein the electrically conducting outer sheath is selected from a group consisting of copper, aluminum, silver, gold, and alloys thereof. 22. The diode assembly of claim 19 wherein the tamper layer is selected from a group consisting of uranium, platinum, tungsten, niobium, molybdenum, osmium, rhenium, and combinations thereof. 23. The diode assembly of claim 19 wherein the tamper layer includes 238 U.

Assignees

Inventors

Classifications

  • with inertial plasma confinement · CPC title

  • Longitudinal pinch devices · CPC title

  • G21B1/19Primary

    Targets for producing thermonuclear fusion reactions, e.g. pellets for irradiation by laser or charged particle beams · CPC title

  • Nuclear fusion reactors · CPC title

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What does patent US12437883B1 cover?
A diode assembly for producing a pulsed fusion event in a z-pinch driver. The diode assembly includes an inner core including a lithium compound formed of one or more lithium isotopes and one or more hydrogen isotopes. An electrically conducting outer sheath is disposed around the inner core. The electrically conducting outer sheath includes an electrical conductance that is at least three time…
Who is the assignee on this patent?
Cons Nuclear Security Llc
What technology area does this patent fall under?
Primary CPC classification G21B1/19. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 07 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).