Thin film transistor, manufacturing method thereof, and display device having the same
US-10804299-B2 · Oct 13, 2020 · US
US12426446B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12426446-B2 |
| Application number | US-202217969499-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 19, 2022 |
| Priority date | Oct 29, 2021 |
| Publication date | Sep 23, 2025 |
| Grant date | Sep 23, 2025 |
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A thin film transistor and a display device comprising the same is disclosed. The thin film transistor comprises an active layer on a substrate, and a first gate electrode at least partially overlapped with the active layer, wherein the active layer includes a channel portion, a first connection portion that is in contact with one side of the channel portion, and a second connection portion that is in contact with the other side of the channel portion, and an effective gate voltage applied to a first area of the channel portion, which is in contact with the first connection portion, is greater than that applied to a second area of the channel portion, which is in contact with the second connection portion.
Opening claim text (preview).
What is claimed is: 1. A thin film transistor comprising: an active layer on a substrate, the active layer including: a channel portion; a first connection portion that is in contact with a first side of the channel portion; and a second connection portion that is in contact with a second side of the channel portion, wherein a first area of the channel portion is in contact with the first connection portion, and a second area of the channel portion is in contact with the second connection portion, a first gate electrode at least partially overlapping the active layer; a conductive material layer between the substrate and the active layer, the conductive material layer overlapping the second area of the channel portion without overlapping the first area of the channel portion, and the conductive material layer is connected to the second connection portion, and a second gate electrode between the first gate electrode and the active layer, the second gate electrode overlapping the first area of the channel portion, and wherein the second gate electrode is non-overlapping with the second area of the channel portion. 2. The thin film transistor of claim 1 , wherein the conductive material layer comprises a material having light shielding characteristics. 3. The thin film transistor of claim 1 , further comprising: a second gate electrode between the first gate electrode and the active layer, the second gate electrode overlapping the first area of the channel portion and non-overlapping with the second area of the channel portion. 4. The thin film transistor of claim 1 , wherein at least a portion of the second gate electrode overlaps the first gate electrode, and at least a portion of the second gate electrode is non-overlapping with the first gate electrode. 5. The thin film transistor of claim 1 , wherein a same voltage is applied to the first gate electrode and the second gate electrode. 6. The thin film transistor of claim 1 , wherein an effective gate voltage applied to a first area of the channel portion is greater than an effective gate voltage applied to a second area of the channel portion. 7. A display device comprising the thin film transistor of claim 1 . 8. The thin film transistor of claim 1 , wherein the active layer includes an oxide semiconductor material. 9. The thin film transistor of claim 8 , wherein the oxide semiconductor material includes at least one of an IZO(InZnO)-based, IGO (InGaO)-based, ITO (InSnO)-based, IGZO (InGaZnO)-based, IGZTO (InGaZnSnO)-based, GZTO (GaZnSnO)-based, GZO (GaZnO)-based, ITZO (InSnZnO)-based or FIZO(FeInZnO)-based oxide semiconductor material. 10. The thin film transistor of claim 1 , wherein the active layer includes: a first oxide semiconductor layer; and a second oxide semiconductor layer on the first oxide semiconductor layer. 11. The thin film transistor of claim 10 , wherein the active layer further includes a third oxide semiconductor layer on the second oxide semiconductor layer.
comprising semiconductor materials not belonging to the Group IV, e.g. InGaZnO · CPC title
wherein the TFTs are in active matrices · CPC title
Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate · CPC title
Multi-gate TFTs · CPC title
having light shields · CPC title
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