Vibration distribution measuring system, vibration waveform analysis method, vibration waveform analyzing device, and analyzing program
US-11920974-B2 · Mar 5, 2024 · US
Devices and methods for measuring the amount of frequency modulation
US12399079B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12399079-B2 |
| Application number | US-202018034754-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 2, 2020 |
| Priority date | Nov 2, 2020 |
| Publication date | Aug 26, 2025 |
| Grant date | Aug 26, 2025 |
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- Title
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Abstract
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The present disclosure relates to a frequency modulation amount measuring device that measures an optical spectral shift of scattered light at a position in an optical transmission line, and calculates a frequency modulation amount at the position, using the measured optical spectral shift.
First claim
Opening claim text (preview).
The invention claimed is: 1. A frequency modulation amount measuring device, comprising a processor and a non-transitory computer readable medium storing a program, wherein execution of the program causes the processor to perform operations comprising: measuring an optical spectral shift of scattered light at a position to be analyzed in an optical transmission line, and calculating a frequency modulation amount at the position to be analyzed, using the measured optical spectral shift. 2. The frequency modulation amount measuring device according to claim 1 , wherein the operations further comprises obtaining a phase change amount at the position to be analyzed, using the measured optical spectral shift, and calculating the frequency modulation amount at the position to be analyzed, using the obtained phase change amount. 3. The frequency modulation amount measuring device according to claim 1 , wherein the operations further comprises measuring a backscattered light waveform in the optical transmission line multiple times, each measurement at a different time point, using optical frequency domain reflectometry (OFDR), extracting an optical spectrum at the position to be analyzed from the backscattered light waveform obtained by the measurement; and calculating the optical spectral shift at the position to be analyzed, using the extracted optical spectrum. 4. The frequency modulation amount measuring device according to claim 1 , wherein the operations further comprises measuring optical spectral shifts at a plurality of positions to be analyzed in the optical transmission line, calculating frequency modulation amounts at the plurality of positions to be analyzed, and calculating a frequency modulation amount in a section in the optical transmission line, the section including the plurality of positions to be analyzed. 5. The frequency modulation amount measuring device according to claim 4 , wherein the operations further comprises indicating the frequency modulation amount in the section in the optical transmission line by a histogram. 6. A frequency modulation amount measuring method comprising: measuring an optical spectral shift of scattered light at a position to be analyzed in an optical transmission line, and calculating a frequency modulation amount at the position to be analyzed, using the measured optical spectral shift.
Assignees
Inventors
Classifications
using backscattering to detect the measured quantity · CPC title
- H04B10/071Primary
using a reflected signal, e.g. using optical time domain reflectometers [OTDR] · CPC title
- G01M11/3172Primary
Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection · CPC title
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Frequently asked questions
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- What does patent US12399079B2 cover?
- The present disclosure relates to a frequency modulation amount measuring device that measures an optical spectral shift of scattered light at a position in an optical transmission line, and calculates a frequency modulation amount at the position, using the measured optical spectral shift.
- Who is the assignee on this patent?
- Nippon Telegraph & Telephone
- What technology area does this patent fall under?
- Primary CPC classification H04B10/071. Mapped technology areas include Electricity.
- When was this patent published?
- Publication date Tue Aug 26 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).