Method for producing a semiconductor chip and semiconductor chip
US-2019355768-A1 · Nov 21, 2019 · US
US12348000B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12348000-B2 |
| Application number | US-201917312113-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 27, 2019 |
| Priority date | Dec 10, 2018 |
| Publication date | Jul 1, 2025 |
| Grant date | Jul 1, 2025 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
Disclosed is an optoelectronic component comprising:an optoelectronic semiconductor chip which generates electromagnetic radiation during operation, anda metallic layer provided on the semiconductor chip, whereinan outer surface of the metallic layer has a patterning,the component can be identified by means of the patterning, andthe metallic layer is continuous.Also disclosed is a method for producing an optoelectronic component.
Opening claim text (preview).
The invention claimed is: 1. An optoelectronic component comprising, an optoelectronic semiconductor chip which generates electromagnetic radiation during operation, and a metallic layer which is arranged on the semiconductor chip, wherein the metallic layer is a metallic layer stack, the layer stack comprises a first metallic layer and a second metallic layer, the second metallic layer comprises roughened regions, a perturbation layer is arranged between the roughened regions and the first metallic layer, an outer surface of the metallic layer has a structuring, the roughened regions form the structuring, identification of the component is made possible by means of the structuring, and the metallic layer is formed continuously. 2. The optoelectronic component according to claim 1 , in which no non-metallic elements are applied on the outer surface of the metallic layer. 3. The optoelectronic component according to claim 1 , in which the metallic layer is formed as a heat sink. 4. The optoelectronic component according to claim 1 , in which the metallic layer is formed as a contact layer for electrically contacting the semiconductor chip. 5. The optoelectronic component according to claim 1 , in which the metallic layer is a functional layer of the component and has several functions. 6. The optoelectronic component according to claim 1 , in which the semiconductor chip comprises a ridge waveguide having a top surface and side surfaces adjacent thereto, and a passivation layer covers the side surfaces of the ridge waveguide. 7. The optoelectronic component according claim 6 , in which the metallic layer is in direct contact with the top surface of the ridge waveguide. 8. The optoelectronic component according to claim 6 , in which the structuring extends without overlapping with the top surface of the ridge waveguide in top view. 9. The optoelectronic component according to claim 1 , in which the structuring comprises recesses. 10. The optoelectronic component according claim 9 , in which at least a part of the recesses completely penetrates the metallic layer. 11. The optoelectronic component according to claim 9 , in which at least a part of the recesses partially penetrates the metallic layer. 12. The optoelectronic component according to claim 1 , in which the structuring forms a bar code for identifying the component. 13. The optoelectronic component according to claim 1 , wherein the first metallic layer comprises a metallic adhesion promoter layer and a metallic barrier layer. 14. A method for producing an optoelectronic component according to claim 1 , comprising the steps, providing the optoelectronic semiconductor chip, applying the metallic layer on the optoelectronic semiconductor chip, and producing the structuring on an outer surface of the metallic layer. 15. The method according to claim 14 , wherein the metallic layer is a metallic layer stack, and a first metallic layer and a second metallic layer are subsequently applied on top of one another on the semiconductor chip. 16. The method according to claim 14 , wherein at least a part of recesses penetrates the second metallic layer up to the first metallic layer, a perturbation layer is applied on the exposed first metallic layer, and a further second metallic layer is applied on the perturbation layer. 17. The method according to claim 14 , wherein a stop layer is applied on the metallic layer in regions, and a further metallic layer is galvanically applied on the region not covered by the stop layer. 18. An optoelectronic component comprising, an optoelectronic semiconductor chip which generates electromagnetic radiation during operation, and a first metallic layer which is arranged on the semiconductor chip, and a structuring comprising recesses on an outer surface of the metallic layer, and wherein a perturbation layer is applied on the exposed first metallic layer, a further second metallic layer is applied on the perturbation layer, at least a part of the recesses penetrates the second metallic layer up to the first metallic layer, identification of the component is made possible by means of the structuring, and the metallic layer is formed continuously. 19. An optoelectronic component comprising, an optoelectronic semiconductor chip which generates electromagnetic radiation during operation, and a metallic layer which is arranged on the semiconductor chip, wherein an outer surface of the metallic layer comprises a structuring, identification of the component is made possible by means of the structuring, the metallic layer is formed continuously, a stop layer is applied on the metallic layer in regions, and a further metallic layer is galvanically applied on the region not covered by the stop layer.
Positioning of the laser chips · CPC title
Photo-diodes, e.g. transceiver devices, bidirectional devices (H01S5/0265 takes precedence) · CPC title
Heat spreaders, i.e. improving heat flow between laser chip and heat dissipating elements · CPC title
of means for heat extraction or cooling · CPC title
of interconnections · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.