Measurement system for analysing radio frequency signals, and method of operating the same

US12332290B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12332290-B2
Application numberUS-202217949774-A
CountryUS
Kind codeB2
Filing dateSep 21, 2022
Priority dateOct 26, 2021
Publication dateJun 17, 2025
Grant dateJun 17, 2025

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Disclosed is a measurement system for analysing RF signals. The measurement system includes an optically transparent enclosure including an optically pumpable gas, and a printed circuit board, PCB including an electrical transmission line for guiding the RF signal to be analyzed through the enclosure and a reflective planar face. The measurement system includes an optical pump for emitting preferably coherent light onto the reflective planar face, and a detector for detecting an optical property of the emitted light being reflected by the reflective planar face. This provides a better laser/microwave overlap in atomic vapor quantum sensing setups, where it is crucial to overlap the regions with highest laser intensity and microwave field strength.

First claim

Opening claim text (preview).

The invention claimed is: 1. A measurement system for analysing RF signals, comprising an optically transparent enclosure comprising an optically pumpable gas; a printed circuit board, PCB, comprising an electrical transmission line for guiding the RF signal to be analyzed through the enclosure and a reflective planar face; an optical pump for emitting preferably coherent light onto the reflective planar face; and a detector for detecting an optical property of the emitted light being reflected by the reflective planar face. 2. The measurement system of claim 1 , the gas comprising an alkali metal, preferably Rubidium. 3. The measurement system of claim 1 , the transmission line comprising an insulator layer sandwiched between conductor layers. 4. The measurement system of claim 3 , the transmission line including one of: a microstrip; and a coplanar waveguide with ground. 5. The measurement system of claim 1 , the PCB including one of: a reflective coating; and a polished conductor layer. 6. The measurement system of claim 5 , the reflective coating comprising one of: a reflective dielectric coating comprising a quarterwave stack of alternating high and low index layers; and a reflective metal coating. 7. The measurement system of claim 1 , the reflective planar face of the PCB having a reflectance for the emitted light in excess of 80%. 8. The measurement system of claim 1 , the emitted light having a wavelength in accordance with an energy transition of the gas, preferably 780 nm or 795 nm. 9. The measurement system of claim 1 , the optical pump arranged to emit the light in a continuous wave, CW, mode or in a pulsed mode. 10. The measurement system of claim 1 , the optical pump arranged to emit the light perpendicularly to a propagation direction of the RF signal. 11. The measurement system of claim 1 , propagation directions of the emitted light and the reflected light forming an intermediate angle of at most 174°, preferably at most 160°, more preferably at most 140°, and most preferably 90°. 12. The measurement system of claim 11 , the detector and the optical pump arranged non-coaxially in accordance with the intermediate angle. 13. The measurement system of claim 1 , the detector comprising one of: a photodiode; and a camera. 14. The measurement system of claim 1 , the PCB comprising two electrical transmission lines on respective reflective planar faces of the PCB; and the measurement system comprising two optical pumps for emitting light in accordance with an energy transition of the gas; and two detectors for detecting an optical property of the emitted light emitted by the respective optical pump and reflected by the respective reflective planar face. 15. A method of operating a measurement system for analysing RF signals, the measurement system comprising a optically transparent enclosure comprising an optically pumpable gas; a printed circuit board, PCB, comprising an electrical transmission line and a reflective planar face; an optical pump; and a detector; the method comprising guiding the RF signal to be analyzed through the enclosure via the transmission line; emitting coherent light onto the reflective planar face; and detecting an optical property of the emitted light being reflected by the reflective planar face.

Assignees

Inventors

Classifications

  • Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section · CPC title

  • using optical pumping · CPC title

  • using magneto-optic devices, e.g. Faraday {or Cotton-Mouton effect} · CPC title

  • using optical probes, e.g. electro-optical, luminescent, glow discharge, or optical interferometers · CPC title

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What does patent US12332290B2 cover?
Disclosed is a measurement system for analysing RF signals. The measurement system includes an optically transparent enclosure including an optically pumpable gas, and a printed circuit board, PCB including an electrical transmission line for guiding the RF signal to be analyzed through the enclosure and a reflective planar face. The measurement system includes an optical pump for emitting pref…
Who is the assignee on this patent?
Rohde & Schwarz
What technology area does this patent fall under?
Primary CPC classification G01R29/0885. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 17 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 7 related publications on this page (citations in our corpus or others sharing the same primary CPC).