Quantum electromagnetic field sensor
US-2024310422-A1 · Sep 19, 2024 · US
US12332290B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12332290-B2 |
| Application number | US-202217949774-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 21, 2022 |
| Priority date | Oct 26, 2021 |
| Publication date | Jun 17, 2025 |
| Grant date | Jun 17, 2025 |
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Disclosed is a measurement system for analysing RF signals. The measurement system includes an optically transparent enclosure including an optically pumpable gas, and a printed circuit board, PCB including an electrical transmission line for guiding the RF signal to be analyzed through the enclosure and a reflective planar face. The measurement system includes an optical pump for emitting preferably coherent light onto the reflective planar face, and a detector for detecting an optical property of the emitted light being reflected by the reflective planar face. This provides a better laser/microwave overlap in atomic vapor quantum sensing setups, where it is crucial to overlap the regions with highest laser intensity and microwave field strength.
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The invention claimed is: 1. A measurement system for analysing RF signals, comprising an optically transparent enclosure comprising an optically pumpable gas; a printed circuit board, PCB, comprising an electrical transmission line for guiding the RF signal to be analyzed through the enclosure and a reflective planar face; an optical pump for emitting preferably coherent light onto the reflective planar face; and a detector for detecting an optical property of the emitted light being reflected by the reflective planar face. 2. The measurement system of claim 1 , the gas comprising an alkali metal, preferably Rubidium. 3. The measurement system of claim 1 , the transmission line comprising an insulator layer sandwiched between conductor layers. 4. The measurement system of claim 3 , the transmission line including one of: a microstrip; and a coplanar waveguide with ground. 5. The measurement system of claim 1 , the PCB including one of: a reflective coating; and a polished conductor layer. 6. The measurement system of claim 5 , the reflective coating comprising one of: a reflective dielectric coating comprising a quarterwave stack of alternating high and low index layers; and a reflective metal coating. 7. The measurement system of claim 1 , the reflective planar face of the PCB having a reflectance for the emitted light in excess of 80%. 8. The measurement system of claim 1 , the emitted light having a wavelength in accordance with an energy transition of the gas, preferably 780 nm or 795 nm. 9. The measurement system of claim 1 , the optical pump arranged to emit the light in a continuous wave, CW, mode or in a pulsed mode. 10. The measurement system of claim 1 , the optical pump arranged to emit the light perpendicularly to a propagation direction of the RF signal. 11. The measurement system of claim 1 , propagation directions of the emitted light and the reflected light forming an intermediate angle of at most 174°, preferably at most 160°, more preferably at most 140°, and most preferably 90°. 12. The measurement system of claim 11 , the detector and the optical pump arranged non-coaxially in accordance with the intermediate angle. 13. The measurement system of claim 1 , the detector comprising one of: a photodiode; and a camera. 14. The measurement system of claim 1 , the PCB comprising two electrical transmission lines on respective reflective planar faces of the PCB; and the measurement system comprising two optical pumps for emitting light in accordance with an energy transition of the gas; and two detectors for detecting an optical property of the emitted light emitted by the respective optical pump and reflected by the respective reflective planar face. 15. A method of operating a measurement system for analysing RF signals, the measurement system comprising a optically transparent enclosure comprising an optically pumpable gas; a printed circuit board, PCB, comprising an electrical transmission line and a reflective planar face; an optical pump; and a detector; the method comprising guiding the RF signal to be analyzed through the enclosure via the transmission line; emitting coherent light onto the reflective planar face; and detecting an optical property of the emitted light being reflected by the reflective planar face.
Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section · CPC title
using optical pumping · CPC title
using magneto-optic devices, e.g. Faraday {or Cotton-Mouton effect} · CPC title
using optical probes, e.g. electro-optical, luminescent, glow discharge, or optical interferometers · CPC title
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