Intelligent wafer-level testing of photonic devices
US-12174238-B2 · Dec 24, 2024 · US
Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section
Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R1/24 |
| Official title | Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section |
| Display label | Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section |
| Total patents | 62 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is declining.
| Year | Patents |
|---|---|
| 2015 | 5 |
| 2016 | 6 |
| 2017 | 11 |
| 2018 | 5 |
| 2019 | 9 |
| 2020 | 12 |
| 2021 | 3 |
| 2022 | 3 |
| 2023 | 2 |
| 2024 | 4 |
| 2025 | 2 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Waveguide connector for connecting first and second waveguides, where the connector includes a male part, a female part and a self-alignment feature and a test system formed therefrom
US-12046787-B2 · Jul 23, 2024 · US
Diamond sensor unit
US-2024118327-A1 · Apr 11, 2024 · US
Interconnect system with high current and low leakage capability
US-11927605-B2 · Mar 12, 2024 · US
Measurement system for analysing radio frequency signals, and method of operating the same
US-2023126884-A1 · Apr 27, 2023 · US
Intelligent Wafer-Level Testing of Photonic Devices
US-2023063481-A1 · Mar 2, 2023 · US
High density waveguide assembly for millimeter and 5G applications
US-11506686-B2 · Nov 22, 2022 · US
Waveguide connector for making blind-mate electrical connections
US-2022367997-A1 · Nov 17, 2022 · US
Probe apparatus
US-11486900-B2 · Nov 1, 2022 · US
Signal transfer structure for test equipment and automatic test apparatus for testing semiconductor devices using the same
US-11035882-B2 · Jun 15, 2021 · US
High density waveguide assembly for millimeter and 5g applications
US-2021156889-A1 · May 27, 2021 · US
Miniature test probe
US-10914756-B2 · Feb 9, 2021 · US
Interconnect system with high current and low leakage capability
US-2020386790-A1 · Dec 10, 2020 · US
Test cable used in USB 3.0 type C and test method using the same
US-10775415-B2 · Sep 15, 2020 · US
Waveguide adapter for slot antennas
US-10749256-B1 · Aug 18, 2020 · US
Waveguide adapter for slot antennas
US-2020243967-A1 · Jul 30, 2020 · US
Over the air wireless test system for testing microelectronic devices integrated with antenna
US-10680727-B2 · Jun 9, 2020 · US
Probe apparatus
US-2020158757-A1 · May 21, 2020 · US
Signal transfer structure for test equipment and automatic test apparatus for testing semiconductor devices using the same
US-2020132721-A1 · Apr 30, 2020 · US
Dual stripline test fixture apparatuses and methods
US-10634700-B2 · Apr 28, 2020 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01R1/24?
- CPC G01R1/24 is the Cooperative Patent Classification code for “Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section.”
- How many patents are filed under CPC G01R1/24 (Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section)?
- Our database includes 62 publications tagged with this CPC code.
- Is patent activity under CPC G01R1/24 growing?
- Publication counts under this code: 4 in 2024 vs 2 in 2025 (latest complete years).