Display and electronic device
US-2023035664-A1 · Feb 2, 2023 · US
US12324346B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12324346-B2 |
| Application number | US-202418741440-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 12, 2024 |
| Priority date | Dec 24, 2020 |
| Publication date | Jun 3, 2025 |
| Grant date | Jun 3, 2025 |
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A display device includes: a substrate on which circuit elements constituting a pixel are arranged; a repair pattern arranged overlying the substrate; a buffer layer covering the repair pattern; an active layer arranged overlying the buffer layer; a conductive layer which is arranged overlying the active layer and on which electrodes of the circuit elements are arranged; an overcoat layer covering the conductive layer, and a light emitting element arranged overlying the overcoat layer. The repair pattern is arranged in such a manner that one region thereof overlaps the active layer.
Opening claim text (preview).
The invention claimed is: 1. A method of repairing a display device, the display device including a substrate on which circuit elements constituting a pixel are arranged, a repair pattern arranged overlying the substrate, a buffer layer covering the repair pattern, an active layer arranged on top of the buffer layer, a region of the active layer overlapping the repair pattern, a conductive layer overlying the active layer and including electrodes of the circuit elements, an overcoat layer covering the conductive layer, and a light emitting element overlying the overcoat layer, the method comprising: inspecting a malfunctioning pixel in the display device; and emitting a laser beam to the repair pattern in the malfunctioning pixel, wherein the emitting the laser beam to the repair pattern cuts the active layer into a first region, a second region, and a first cut-off region between the first region and the second region. 2. The method of claim 1 , wherein when the emitting the laser beam cuts the repair pattern, a crack occurs in the buffer layer and the active layer, and the active layer is cut. 3. The method of claim 2 , wherein the active layer is cut at the vicinity of opposite ends of the repair pattern. 4. The method of claim 3 , wherein the first cut-off region forms a step in the active layer. 5. The method of claim 1 , wherein the laser beam is in an infrared band. 6. The method of claim 1 , wherein a region of the repair pattern overlaps the active layer. 7. The method of claim 1 , wherein the repair pattern is an electrode in an isolated form, the electrode being formed of a metal material. 8. The method of claim 1 , wherein the first region of the active layer overlaps the repair pattern; and the active layer further comprises: a second cut-off region at an end portion of the first region opposite the first cut-off region; and another second region with the second cut-off region between the first region and the another second region. 9. The method of claim 8 , wherein the first region, the second region, and the another second region are separated from each other. 10. The method of claim 9 , wherein the first and second cutoff regions form a step between the first region and each of the two second regions, respectively. 11. The method of claim 1 , wherein the circuit elements each comprise: a storage capacitor; a switching transistor storing a voltage corresponding to a data signal in the storage capacitor, in response to a first gate signal; a drive transistor configured to control an amount of drive electric current to be applied to the light emitting element in a manner that corresponds to the voltage stored in the storage capacitor; and a sensing transistor configured to sense features of the circuit elements in response to a second gate signal, wherein the active layer overlapping the repair pattern is an active layer constituting the sensing transistor. 12. The method of claim 11 , wherein the display device further comprises: a light blocking layer arranged on a layer that is the same as the repair pattern and arranged in a manner that overlaps the drive transistor. 13. The method of claim 1 , wherein the display device further comprises: a lower polarizer arranged underneath the substrate. 14. The method of claim 1 , wherein the active layer is formed of indium-gallium-zinc-oxide, and the repair pattern is formed of copper. 15. The method of claim 1 , wherein the active layer is formed in such a manner to have a thickness of about 300 Å.
comprising connection or disconnection of parts of a device in response to a measurement · CPC title
characterised by the properties tested or measured, e.g. structural or electrical properties · CPC title
Interconnections, e.g. wiring lines or terminals · CPC title
Arrangements for improving contrast, e.g. preventing reflection of ambient light · CPC title
Repairing · CPC title
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