Simultaneous polarization and wavefront control using a planar device
US-9739918-B2 · Aug 22, 2017 · US
US12320988B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12320988-B2 |
| Application number | US-202117475167-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 14, 2021 |
| Priority date | Oct 18, 2019 |
| Publication date | Jun 3, 2025 |
| Grant date | Jun 3, 2025 |
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Methods and devices to split electromagnetic waves across broad bandwidths in correspondence with predefined polarization state vectors are disclosed. The described methods can be used cameras or image sensors measuring directly the polarization states of an incident electromagnetic waves. The devices include three-dimensional (3D) scattering structures made of dielectric pillars and using existing CMOS processes and direct write lithography techniques. Performance metrics based on the intensity and contrast of the split electromagnetic waves are also disclosed.
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What is claimed is: 1. An image sensor, comprising: a three dimensional (3D) scattering structure; and a focal plane having four sub-pixels, wherein: the 3D scattering structure comprises a plurality of dielectric pillars, and across a broad bandwidth with a fractional bandwidth of at least 0.1, the plurality of dielectric pillars is configured to split an incident electromagnetic wave along four polarization state vectors and to focus the split incident electromagnetic wave onto the four sub-pixels corresponding to the four polarization state vectors; and wherein the four polarization state vectors correspond to maximally spaced polarization states on a Poincare sphere. 2. The image sensor of claim 1 , wherein each of the polarization state vectors comprises Stokes parameters corresponding to a circular polarization, a linear polarization, or elliptical polarizations. 3. The image sensor of claim 1 , wherein the broad bandwidth includes wavelengths within a range of 3.5 to 4 um. 4. The image sensor of claim 1 , wherein: the 3D structure comprises two or more distinct layers manufactured using CMOS fabrication processes; the two or more layers are stacked on top of one another in a direction parallel to a direction of incident electromagnetic wave; and each layer of the two or more layers is patterned using a direct write lithography process and in accordance with the four polarization state vectors. 5. The image sensor of claim 4 , wherein the 3D structure comprises an IP-Dip polymer. 6. The image sensor of claim 4 , wherein each layer has dimensions of 30×30×2.5 um, and the two or more layers comprises ten layers. 7. A method of splitting an electromagnetic wave, across a broad bandwidth with a fractional bandwidth of at least 0.1, into four waves with different polarization states, the method comprising: applying the electromagnetic wave to a three-dimensional (3D) scattering structure at a first side thereof, the 3D scattering structure being formed into a set 3D pattern in correspondence with four polarization states; and scattering off the electromagnetic wave to generate four electromagnetic waves with four different polarization states, the plurality of electromagnetic waves exiting the 3D scattering structure at a second side thereof; and wherein the four polarization states are maximally spaced on a Poincare sphere. 8. The method of claim 7 , further comprising collecting each wave of the plurality of electromagnetic waves at a corresponding target area outside the 3D scattering structure. 9. The method of claim 8 , wherein each target area corresponds to a sub-pixel of an image sensor. 10. The method of claim 9 , further comprising, before the applying, building the 3D scattering structure by stacking up layers patterned in correspondence with the four polarization states and manufactured using a direct write or standard sequential lithography process. 11. A camera built based on the method of claim 9 . 12. The method of claim 7 , further comprising optimizing the 3D pattern with a gradient-based algorithm. 13. The method of claim 12 , wherein the gradient-based algorithm is used to optimize electromagnetic intensities along four polarization state vectors in correspondence with the four polarization states.
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