Solidly-mounted transversely-excited film bulk acoustic resonator

Patent metadata

Field	Value
Publication number	US-12301204-B2
Application number	US-202318487751-A
Country	US
Kind code	B2
Filing date	Oct 16, 2023
Priority date	Jun 15, 2018
Publication date	May 13, 2025
Grant date	May 13, 2025

Abstract

Resonator devices are disclosed. An acoustic resonator device includes a piezoelectric plate having front and back surfaces, an acoustic Bragg reflector on the back surface, and an interdigital transducer (IDT) on the front surface. The acoustic Bragg reflector reflects a primary shear acoustic mode excited by the IDT in the piezoelectric plate over a frequency range including a resonance frequency and an anti-resonance frequency of the acoustic resonator device.

First claim

The invention claimed is:

1. An acoustic resonator comprising:
an acoustic mirror;
a piezoelectric layer on the acoustic mirror, the piezoelectric layer having a thickness between 100 nanometers and 1500 nanometers; and
an interdigital transducer (IDT) on the piezoelectric layer, the IDT configured to laterally excite a bulk acoustic wave.

2. The acoustic resonator of claim 1 , wherein a ratio of a pitch of the interleaved fingers is between 2 and 20 times a width of the interleaved fingers.

3. The acoustic resonator of claim 1 , wherein the acoustic mirror is a Bragg reflector.

4. The acoustic resonator of claim 1 , wherein the acoustic mirror comprises a plurality of dielectric layers alternating between high acoustic impedance layers and low acoustic impedance layers.

5. The acoustic resonator of claim 1 , wherein each of the plurality of dielectric layers of the acoustic mirror has a thickness that is approximately one-quarter of a wavelength of the bulk acoustic wave.

6. The acoustic resonator of claim 4 , wherein:
the high acoustic impedance layers are one of silicon nitride and aluminum nitride, and
the low acoustic impedance layers are silicon oxycarbide.

7. The acoustic resonator of claim 6 , wherein the plurality of layers includes at least four layers and not more than seven layers.

8. The acoustic resonator of claim 1 , wherein the piezoelectric layer has a thickness of 200 nanometers to 500 nanometers.

9. The acoustic resonator of claim 1 , wherein the piezoelectric layer comprises one of lithium niobate, lithium tantalate, lanthanum gallium silicate, gallium nitride, and aluminum nitride.

10. The acoustic resonator of claim 1 , wherein the lateral excitation is based on the direction of an electric field excited by the IDT in the piezoelectric layer, the electric field being predominantly lateral, while a wave propagation is substantially orthogonal to a surface of the piezoelectric layer and orthogonal to the direction of the electric field.

11. The acoustic resonator of claim 1 , wherein at least a portion of the piezoelectric layer that is overlapped by the IDT is directly coupled to the acoustic mirror.

12. The acoustic resonator of claim 1 , wherein a z-axis of the piezoelectric layer is normal to the front and back surfaces, and wherein the IDT is oriented such that the interleaved fingers of the IDT are parallel to an x-axis of the piezoelectric layer.

13. The acoustic resonator of claim 1 , wherein a pitch of the interleaved fingers of the IDT is greater than or equal to 2 times the thickness of the piezoelectric layer and less than or equal to 25 times the thickness of the piezoelectric layer.

14. The acoustic resonator of claim 1 , wherein the acoustic mirror is either directly attached to the piezoelectric layer or via one or more intermediate layers.

15. A laterally excited bulk acoustic wave resonator comprising:
an acoustic mirror;
a piezoelectric layer coupled to the acoustic mirror, the piezoelectric layer comprising a thickness that is between 200 nanometers and 500 nanometers; and
an interdigital transducer (IDT) on the piezoelectric layer opposite the acoustic mirror and having a plurality of interleaved fingers,
wherein the piezoelectric layer is configured such that a predominantly lateral atomic motion is generated in response to a radio frequency signal applied to the IDT.

16. The laterally excited bulk acoustic wave resonator of claim 15 , wherein a ratio of a pitch of the interleaved fingers is between 2 and 20 times a width of the interleaved fingers.

17. The laterally excited bulk acoustic wave resonator of claim 15 ,
wherein the acoustic mirror is a Bragg reflector that comprises a plurality of dielectric layers alternating between high acoustic impedance layers and low acoustic impedance layers, and
wherein each of the plurality of dielectric layers of the Bragg reflector has a thickness that is approximately one-quarter of a wavelength of a bulk acoustic wave excited by the IDT when the radio frequency signal is applied thereto.

18. The laterally excited bulk acoustic wave resonator of claim 15 , wherein the piezoelectric layer comprises one of lithium niobate, lithium tantalate, lanthanum gallium silicate, gallium nitride, and aluminum nitride.

19. The laterally excited bulk acoustic wave resonator of claim 15 , wherein at least a portion of the piezoelectric layer that is overlapped by the IDT is directly coupled to the acoustic mirror.

20. The laterally excited bulk acoustic wave resonator of claim 15 , wherein the acoustic mirror is configured to at least partially reflect acoustic waves introduced by the predominantly lateral atomic motion.

Assignees

• Murata Manufacturing Co

Inventors

• Yantchev Ventsislav
• Garcia Bryant
• Plesski Viktor
• Yandrapalli Soumya
• Hammond Robert B
• Turner Patrick
• John Jesson

Classifications

• H03H2003/025

  the resonators or networks comprising an acoustic mirror · CPC title

• H03H9/568

  consisting of a ladder configuration · CPC title

• H03H9/564

  implemented with thin-film techniques · CPC title

• H03H9/562

  comprising a ceramic piezoelectric layer · CPC title

• H03H9/176

  consisting of ceramic material (H03H9/177, H03H9/178 take precedence) · CPC title