Vacuum-helium-leak-detection method based on carbon-nanotube-based field-emission sensor

US12276576B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12276576-B2
Application numberUS-202318093823-A
CountryUS
Kind codeB2
Filing dateJan 6, 2023
Priority dateJan 6, 2022
Publication dateApr 15, 2025
Grant dateApr 15, 2025

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Abstract

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A vacuum-helium-leak-detection method based on a carbon-nanotube-based field-emission sensor that includes a carbon-nanotube-based cathode having a Raman amorphous peak ID/graphite peak IG ratio greater than 1.0. The method involves: setting a field-emission current at an initial, small emission current, recording an average of values of the field-emission current in a time period t, forming a sensing characteristic curve of the sensor, and performing fitting on the sensing characteristic curve so as to obtain an index curve; converting pressure values of helium gas into vacuum leak rates; and packaging the cathode into a vacuum chamber in a system to be detected, performing testing when a helium stream in the system to be detected reaches balance, obtaining an average of current variations in the time period t during the testing, and comparing the average with the index curve so as to determine a vacuum leak rate of the system to be detected.

First claim

Opening claim text (preview).

What is claimed is: 1. A vacuum-helium-leak-detection method based on a carbon-nanotube-based field-emission sensor, which includes a carbon-nanotube-based cathode having a Raman amorphous peak I D /graphite peak I G ratio greater than 1.0 and an electrically conductive anode, the method including steps of: (1) performing a Joule-heat degassing process on the carbon-nanotube-based cathode for a time period to with a large field-emission current having a density J 0 so that Joule heat makes carbon nanotubes of the cathode release gas that was absorbed on their surfaces previously thus enters the carbon nanotubes into an intrinsic emission state; (2) upon completion of the degassing process, setting the field-emission current to an initial, small emission current thereof rapidly, recording an average of values of the field-emission current in a time period t, testing the carbon-nanotube-based cathode for field-emission sensing effect with helium gas at different pressure levels so as to form a sensing characteristic curve of the carbon-nanotube-based field-emission sensor, performing fitting on the sensing characteristic curve so as to obtain an index curve, and converting the different pressure levels of the helium gas into corresponding vacuum leak rates; and (3) packaging the carbon-nanotube-based cathode into a vacuum chamber in a system to be detected, performing testing when a helium stream reaches balance, obtaining an average of current variations in the time period t from the testing, comparing the average of the current variations with the index curve obtained in Step (2) so as to determine a vacuum leak rate of the system to be detected. 2. The vacuum-helium-leak-detection method of claim 1 , wherein the carbon-nanotube-based cathode is prepared using a CVD method, which involves: preparing a film used to form the carbon-nanotube-based cathode at a high temperature by using a Hastelloy alloy as a substrate, using argon as a protective gas, and using acetylene as a carbon-source gas required by growth of the carbon nanotubes.

Assignees

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Classifications

  • G01M3/3272Primary

    for verifying the internal pressure of closed containers · CPC title

  • Systems (G01N27/27 takes precedence) · CPC title

  • at least partially made of carbon · CPC title

  • Gas permeable electrodes · CPC title

  • G01M3/34Primary

    by testing the possibility of maintaining the vacuum in containers, e.g. in can-testing machines · CPC title

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What does patent US12276576B2 cover?
A vacuum-helium-leak-detection method based on a carbon-nanotube-based field-emission sensor that includes a carbon-nanotube-based cathode having a Raman amorphous peak ID/graphite peak IG ratio greater than 1.0. The method involves: setting a field-emission current at an initial, small emission current, recording an average of values of the field-emission current in a time period t, forming a …
Who is the assignee on this patent?
Univ Wenzhou
What technology area does this patent fall under?
Primary CPC classification G01M3/3272. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 15 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).