Systems and methods for predicting storage device failure using machine learning

US12260347B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12260347-B2
Application numberUS-202318197717-A
CountryUS
Kind codeB2
Filing dateMay 15, 2023
Priority dateFeb 26, 2020
Publication dateMar 25, 2025
Grant dateMar 25, 2025

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Abstract

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A method for predicting a time-to-failure of a target storage device may include training a machine learning scheme with a time-series dataset, and applying the telemetry data from the target storage device to the machine learning scheme which may output a time-window based time-to-failure prediction. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include applying a data quality improvement framework to a time-series dataset of operational and failure data from multiple storage devices, and training the scheme with the pre-processed dataset. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include training the scheme with a first portion of a time-series dataset of operational and failure data from multiple storage devices, testing the machine learning scheme with a second portion of the time-series dataset, and evaluating the machine learning scheme.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for determining an event in a target storage device, the method comprising: training a machine learning scheme with a dataset of events from one or more storage devices; receiving parameter data from the target storage device; and inputting the parameter data from the target storage device into the machine learning scheme; wherein the machine learning scheme outputs a first determination and a second determination of the event for the target storage device based at least in part on the parameter data. 2. The method of claim 1 , wherein: the machine learning scheme outputs at least two classes; a first class of the at least two classes comprises the first determination of the event for the target storage device; and a second class of the at least two classes comprises the second determination of the event for the target storage device. 3. The method of claim 2 , wherein training the machine learning scheme comprises splitting the dataset into groups, and a class corresponds to a group for the event for the target storage device. 4. The method of claim 3 , wherein the dataset of events are split into groups based on the events. 5. A method for training a machine learning scheme for determining an event in a storage device, the method comprising: pre-processing a dataset of events from one or more storage devices, thereby generating a pre-processed dataset; and training the machine learning scheme with the pre-processed dataset, wherein the machine learning scheme outputs a first determination and a second determination of the event for the storage device based at least in part on the pre-processed dataset. 6. The method of claim 5 , wherein: the dataset comprises one or more features associated with a storage device; and the method further comprises ranking at least two of the features. 7. The method of claim 6 , further comprising limiting a number features included in the pre-processed dataset, thereby reducing a dimension of the pre-processed dataset. 8. The method of claim 6 , further comprising ranking the features by at least one of recursive feature elimination, correlation attribute evaluation, gain ratio attribute evaluation, or information gain attribute evaluation. 9. The method of claim 5 , further comprising removing noise from at least a portion of the dataset. 10. The method of claim 5 , further comprising modifying at least a portion of the dataset by at least one of data transformation, data aggregation, or data standardization. 11. The method of claim 5 , further comprising removing at least one redundant feature of the features. 12. A method for training a machine learning scheme for determining an event in a storage device, the method comprising: receiving a dataset of events from one or more storage devices; training the machine learning scheme with a first portion of the dataset; testing the machine learning scheme with a second portion of the dataset; and validating the machine learning scheme based at least in part on the testing of the machine learning scheme with the second portion of the dataset. 13. The method of claim 12 , wherein validating the machine learning scheme comprises calculating a performance score. 14. The method of claim 13 , wherein the performance score comprises one or more of a precision component, a recall component, or an F-score component. 15. The method of claim 13 , wherein the performance score is based on two or more components, and a maximum of the two or more components is used as the performance score. 16. The method of claim 15 , wherein one or more of the two or more components are weighted. 17. The method of claim 12 , wherein the machine learning scheme is validated with a cost function. 18. The method of claim 17 , wherein: the cost function comprises a user-defined cost function; and the method further comprises minimizing the user-defined cost function. 19. The method of claim 17 , wherein the cost function is based on a confusion matrix. 20. The method of claim 19 , wherein the confusion matrix comprises one or more weight classes for rewards or penalties associated with early or late predictions, respectively.

Assignees

Inventors

Classifications

  • Supervised learning · CPC title

  • Error detection or correction of the data by redundancy in hardware · CPC title

  • G06N20/00Primary

    Machine learning · CPC title

  • in a storage system, e.g. in a DASD or network based storage system (drivers for digital recording or reproducing units G06F3/06; circuits for error detection or correction within digital recording or reproducing units G11B20/18; for distributed storage of data in networks, e.g. transport arrangements for network file system [NFS], storage area networks [SAN] or network attached storage [NAS], H04L67/1097) · CPC title

  • Dynamic search techniques; Heuristics; Dynamic trees; Branch-and-bound · CPC title

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What does patent US12260347B2 cover?
A method for predicting a time-to-failure of a target storage device may include training a machine learning scheme with a time-series dataset, and applying the telemetry data from the target storage device to the machine learning scheme which may output a time-window based time-to-failure prediction. A method for training a machine learning scheme for predicting a time-to-failure of a storage …
Who is the assignee on this patent?
Samsung Electronics Co Ltd
What technology area does this patent fall under?
Primary CPC classification G06N20/00. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Mar 25 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).