Fine ratio measuring method and apparatus

Patent metadata

Field	Value
Publication number	US-12203835-B2
Application number	US-202017601617-A
Country	US
Kind code	B2
Filing date	Apr 3, 2020
Priority date	Apr 5, 2019
Publication date	Jan 21, 2025
Grant date	Jan 21, 2025

Abstract

A fine ratio measuring method and apparatus. The fine ratio measuring method includes a step S1 of measuring a distance between a distance measuring device and lumps of material, a step S2 of calculating a feature quantity from distance data obtained in the step S1, and a step S3 of converting the feature quantity calculated in step S2 to a fine ratio. The feature quantity calculated in step S2 represents distance variation calculated from the distance data obtained in the step S1. A higher fine ratio in lumps of material means greater microscopic distance variation caused by microscopic irregularities in the surface of the lumps of material in the height direction within a three-dimensional shape. Therefore, by using the distance variation as the feature quantity, the fine ratio in the lumps of material can be measured in real time with high accuracy.

First claim

The invention claimed is:

1. A fine ratio measuring method comprising:
a step (S1) of measuring a distance between a laser rangefinder and lumps of material conveyed on a conveyer, wherein in step (S1), the laser rangefinder is installed above the lumps of material such that an entire width of the conveyer is contained within a measurement field of the laser rangefinder that measures the distance to the lumps of material;
a step (S2) of calculating a feature quantity from the measured distance obtained in step (S1); and
a step (S3) of converting the feature quantity calculated in step (S2) to a fine ratio, wherein the fine ratio is defined as a ratio of mass of fine particles with a predetermined size or less to a total mass of the lumps of material, wherein
the feature quantity calculated in step (S2) represents distance variation calculated from the measured distance obtained in step (S1),
the feature quantity calculated in step (S2) is based on standard deviations in a standard deviation matrix obtained by applying a standard deviation filter to the measured distance obtained in step (S1), and
the feature quantity calculated in step (S2) is a modal standard deviation in the standard deviation matrix obtained by applying the standard deviation filter to the measured distance obtained in step (S1).

2. The fine ratio measuring method according to claim 1 , wherein a filtering range of the standard deviation filter is 10×10 pixels or less.

3. A fine ratio measuring apparatus comprising:
a laser rangefinder configured to measure a distance to lumps of material conveyed on a conveyer, wherein the laser rangefinder is installed above the lumps of material such that an entire width of the conveyer is contained within a measurement field of the laser rangefinder that measures the distance to the lumps of material; and
a computing device configured to calculate a feature quantity from the measured distance obtained by the laser rangefinder, and convert the calculated feature quantity to a fine ratio, wherein the fine ratio is defined as a ratio of mass of fine particles with a predetermined size or less to a total mass of the lumps of material, wherein
the computing device calculates the feature quantity representing distance variation from the measured distance obtained by the laser rangefinder,
the computing device applies a standard deviation filter to the measured distance obtained by the laser rangefinder, and calculates the feature quantity on the basis of standard deviations in a resulting standard deviation matrix, and
the computing device applies the standard deviation filter to the measured distance obtained by the laser rangefinder, and calculates a modal standard deviation in the resulting standard deviation matrix as the feature quantity.

4. The fine ratio measuring apparatus according to claim 3 , wherein a filtering range of the standard deviation filter is 10×10 pixels or less.

Assignees

• Jfe Steel Corp

Inventors

• Tsuboi Toshiki
• Yamahira Naoshi

Classifications

• C21B5/007

  Conditions of the cokes or characterised by the cokes used · CPC title

• G01N2015/0061

  in solids, e.g. petrography · CPC title

• G01N15/02

  Investigating particle size or size distribution (by measuring osmotic pressure G01N7/10; investigating sedimentation of particle suspensions G01N15/04; investigating individual particles G01N15/10) · CPC title

• F27B1/28

  Arrangements of monitoring devices, of indicators, of alarm devices · CPC title

• C21B2300/04

  Modeling of the process, e.g. for control purposes; CII · CPC title